JPWO2023243556A5 - - Google Patents

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Publication number
JPWO2023243556A5
JPWO2023243556A5 JP2024528804A JP2024528804A JPWO2023243556A5 JP WO2023243556 A5 JPWO2023243556 A5 JP WO2023243556A5 JP 2024528804 A JP2024528804 A JP 2024528804A JP 2024528804 A JP2024528804 A JP 2024528804A JP WO2023243556 A5 JPWO2023243556 A5 JP WO2023243556A5
Authority
JP
Japan
Prior art keywords
gate structure
semiconductor layer
nitride semiconductor
active region
field effect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2024528804A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2023243556A1 (https=
Publication date
Application filed filed Critical
Priority claimed from PCT/JP2023/021506 external-priority patent/WO2023243556A1/ja
Publication of JPWO2023243556A1 publication Critical patent/JPWO2023243556A1/ja
Publication of JPWO2023243556A5 publication Critical patent/JPWO2023243556A5/ja
Pending legal-status Critical Current

Links

JP2024528804A 2022-06-15 2023-06-09 Pending JPWO2023243556A1 (https=)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022096669 2022-06-15
PCT/JP2023/021506 WO2023243556A1 (ja) 2022-06-15 2023-06-09 電界効果トランジスタ

Publications (2)

Publication Number Publication Date
JPWO2023243556A1 JPWO2023243556A1 (https=) 2023-12-21
JPWO2023243556A5 true JPWO2023243556A5 (https=) 2025-02-26

Family

ID=89191247

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024528804A Pending JPWO2023243556A1 (https=) 2022-06-15 2023-06-09

Country Status (2)

Country Link
JP (1) JPWO2023243556A1 (https=)
WO (1) WO2023243556A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2026053841A1 (ja) * 2024-09-06 2026-03-12 ローム株式会社 半導体装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5245305B2 (ja) * 2007-07-06 2013-07-24 サンケン電気株式会社 電界効果半導体装置及びその製造方法
US9397168B2 (en) * 2014-10-17 2016-07-19 Taiwan Semiconductor Manufacturing Co., Ltd. Method to define the active region of a transistor employing a group III-V semiconductor material
JP2017143122A (ja) * 2016-02-09 2017-08-17 株式会社東芝 半導体装置
US11908927B2 (en) * 2019-02-28 2024-02-20 Rohm Co., Ltd. Nitride semiconductor device

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