JPWO2023189060A5 - - Google Patents

Download PDF

Info

Publication number
JPWO2023189060A5
JPWO2023189060A5 JP2024511477A JP2024511477A JPWO2023189060A5 JP WO2023189060 A5 JPWO2023189060 A5 JP WO2023189060A5 JP 2024511477 A JP2024511477 A JP 2024511477A JP 2024511477 A JP2024511477 A JP 2024511477A JP WO2023189060 A5 JPWO2023189060 A5 JP WO2023189060A5
Authority
JP
Japan
Prior art keywords
region
semiconductor device
impurity concentration
sic semiconductor
trench
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2024511477A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2023189060A1 (https=
Publication date
Application filed filed Critical
Priority claimed from PCT/JP2023/006639 external-priority patent/WO2023189060A1/ja
Publication of JPWO2023189060A1 publication Critical patent/JPWO2023189060A1/ja
Publication of JPWO2023189060A5 publication Critical patent/JPWO2023189060A5/ja
Pending legal-status Critical Current

Links

JP2024511477A 2022-03-31 2023-02-24 Pending JPWO2023189060A1 (https=)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022061145 2022-03-31
PCT/JP2023/006639 WO2023189060A1 (ja) 2022-03-31 2023-02-24 SiC半導体装置

Publications (2)

Publication Number Publication Date
JPWO2023189060A1 JPWO2023189060A1 (https=) 2023-10-05
JPWO2023189060A5 true JPWO2023189060A5 (https=) 2024-12-10

Family

ID=88200479

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024511477A Pending JPWO2023189060A1 (https=) 2022-03-31 2023-02-24

Country Status (3)

Country Link
US (1) US20250022920A1 (https=)
JP (1) JPWO2023189060A1 (https=)
WO (1) WO2023189060A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102024202658A1 (de) * 2024-03-20 2025-09-25 Infineon Technologies Ag Leistungshalbleitervorrichtung und Verfahren zum Herstellen einer Leistungshalbleitervorrichtung

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102015103067B3 (de) * 2015-03-03 2016-09-01 Infineon Technologies Ag Halbleitervorrichtung mit trenchgatestrukturen in einem halbleiterkörper mit hexagonalem kristallgitter
JP7067021B2 (ja) * 2017-11-07 2022-05-16 富士電機株式会社 絶縁ゲート型半導体装置及びその製造方法
DE212019000104U1 (de) * 2018-08-07 2020-02-19 Rohm Co., Ltd. SiC-Halbleitervorrichtung
JP7246237B2 (ja) * 2019-04-15 2023-03-27 ルネサスエレクトロニクス株式会社 半導体装置の製造方法

Similar Documents

Publication Publication Date Title
JP6791084B2 (ja) 半導体装置
JPWO2020235629A1 (ja) SiC半導体装置
JP2003332582A5 (https=)
JP2022033954A5 (https=)
JP2024023411A5 (https=)
CN111370485A (zh) 沟槽型垂直双扩散金属氧化物半导体场效应晶体管
CN115513297A (zh) 碳化硅平面mosfet器件及其制造方法
JP2008524843A5 (https=)
JPWO2022158053A5 (https=)
JP2025024190A5 (https=)
JPWO2023106152A5 (https=)
CN111370462A (zh) 一种沟槽型vdmos的元胞版图结构
JP2022151587A5 (https=)
JPWO2023189060A5 (https=)
JPS62196360U (https=)
CN113471279B (zh) 降低导通电阻的功率晶体管结构
JP2021048231A5 (ja) 半導体装置
JPWO2023189058A5 (https=)
US20240250166A1 (en) Trench gate semiconductor device and method for manufacturing the same
TW201143138A (en) Semiconductor light-emitting device
JPWO2023189057A5 (https=)
JPWO2024101131A5 (https=)
JP2022139078A5 (https=)
JPWO2024252971A5 (https=)
CN119300425B (zh) 一种功率半导体器件版图