JPWO2022259948A1 - - Google Patents

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Publication number
JPWO2022259948A1
JPWO2022259948A1 JP2023527825A JP2023527825A JPWO2022259948A1 JP WO2022259948 A1 JPWO2022259948 A1 JP WO2022259948A1 JP 2023527825 A JP2023527825 A JP 2023527825A JP 2023527825 A JP2023527825 A JP 2023527825A JP WO2022259948 A1 JPWO2022259948 A1 JP WO2022259948A1
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2023527825A
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Japanese (ja)
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JP7734744B2 (ja
JPWO2022259948A5 (https=
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Publication of JPWO2022259948A1 publication Critical patent/JPWO2022259948A1/ja
Publication of JPWO2022259948A5 publication Critical patent/JPWO2022259948A5/ja
Priority to JP2025139588A priority Critical patent/JP2025176047A/ja
Application granted granted Critical
Publication of JP7734744B2 publication Critical patent/JP7734744B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/06Apparatus for monitoring, sorting, marking, testing or measuring
    • H10P72/0606Position monitoring, e.g. misposition detection or presence detection
    • H10P72/0608Position monitoring, e.g. misposition detection or presence detection of substrates stored in a container, a magazine, a carrier, a boat or the like
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/34Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H10P72/3402Mechanical parts of transfer devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/34Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H10P72/3404Storage means
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/34Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H10P72/3411Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/50Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for positioning, orientation or alignment
    • H10P72/53Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for positioning, orientation or alignment using optical controlling means
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/76Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
    • H10P72/7602Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a robot blade or gripped by a gripper for conveyance
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/78Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using vacuum or suction, e.g. Bernoulli chucks
JP2023527825A 2021-06-10 2022-06-02 搬送システム及び判定方法 Active JP7734744B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2025139588A JP2025176047A (ja) 2021-06-10 2025-08-25 搬送システム及び判定方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US17/343,765 US12002695B2 (en) 2021-06-10 2021-06-10 Transport system and determination method
US17/343,765 2021-06-10
PCT/JP2022/022446 WO2022259948A1 (ja) 2021-06-10 2022-06-02 搬送システム及び判定方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2025139588A Division JP2025176047A (ja) 2021-06-10 2025-08-25 搬送システム及び判定方法

Publications (3)

Publication Number Publication Date
JPWO2022259948A1 true JPWO2022259948A1 (https=) 2022-12-15
JPWO2022259948A5 JPWO2022259948A5 (https=) 2024-03-15
JP7734744B2 JP7734744B2 (ja) 2025-09-05

Family

ID=84390496

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2023527825A Active JP7734744B2 (ja) 2021-06-10 2022-06-02 搬送システム及び判定方法
JP2025139588A Pending JP2025176047A (ja) 2021-06-10 2025-08-25 搬送システム及び判定方法

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2025139588A Pending JP2025176047A (ja) 2021-06-10 2025-08-25 搬送システム及び判定方法

Country Status (6)

Country Link
US (1) US12002695B2 (https=)
JP (2) JP7734744B2 (https=)
KR (1) KR102913489B1 (https=)
CN (1) CN117836923A (https=)
TW (1) TWI822103B (https=)
WO (1) WO2022259948A1 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI840988B (zh) * 2022-10-06 2024-05-01 盛詮科技股份有限公司 晶圓吸附裝置
JP2025070327A (ja) * 2023-10-19 2025-05-02 川崎重工業株式会社 基板搬送ロボットシステム
CN117878017B (zh) * 2024-01-12 2024-07-26 苏州海通机器人系统有限公司 一种晶圆定位纠偏方法、系统及装置

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0529441A (ja) * 1991-07-23 1993-02-05 Oki Electric Ind Co Ltd ウエハー位置およびオリエンテーシヨンフラツト方向検出方法
JPH07302828A (ja) * 1995-04-24 1995-11-14 Nikon Corp 基板搬送装置
JPH11106044A (ja) * 1997-10-08 1999-04-20 Mitsubishi Electric Corp 基板搬送装置および基板搬送方法
JP2008053552A (ja) * 2006-08-25 2008-03-06 Tokyo Electron Ltd ウェハ搬送装置、ウェハ搬送方法及び記憶媒体
JP2009054933A (ja) * 2007-08-29 2009-03-12 Ryusyo Industrial Co Ltd ウエハ搬送システム
WO2011061912A1 (ja) * 2009-11-19 2011-05-26 株式会社アルバック 基板中心位置の特定方法
JP2011108958A (ja) * 2009-11-20 2011-06-02 Hitachi High-Tech Control Systems Corp 半導体ウェーハ搬送装置及びこれを用いた搬送方法
JP2016134526A (ja) * 2015-01-20 2016-07-25 リンテック株式会社 移載装置および移載方法
WO2020226024A1 (ja) * 2019-05-09 2020-11-12 川崎重工業株式会社 基板搬送ロボット及び基板搬送方法

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US3808395A (en) * 1973-05-15 1974-04-30 Gen Electric Method of metallurgically joining a beryllium-base part and a copper-base part
US6225012B1 (en) * 1994-02-22 2001-05-01 Nikon Corporation Method for positioning substrate
JP3624065B2 (ja) * 1996-11-29 2005-02-23 キヤノン株式会社 基板搬送装置、半導体製造装置および露光装置
US7315373B2 (en) * 2001-11-14 2008-01-01 Rorze Corporation Wafer positioning method and device, wafer process system, and wafer seat rotation axis positioning method for wafer positioning device
JP4376116B2 (ja) * 2003-06-03 2009-12-02 東京エレクトロン株式会社 基板受け渡し位置の調整方法
US8600150B2 (en) * 2006-02-13 2013-12-03 Samsung Electronics Co., Ltd. Wafer aligning apparatus and related method
KR100772843B1 (ko) * 2006-02-13 2007-11-02 삼성전자주식회사 웨이퍼 얼라인 장치 및 방법
JP5058836B2 (ja) * 2007-05-08 2012-10-24 東京エレクトロン株式会社 処理装置、処理方法、被処理体の認識方法および記憶媒体
JP5324231B2 (ja) * 2009-01-08 2013-10-23 日東電工株式会社 半導体ウエハのアライメント装置
JP5557516B2 (ja) * 2009-12-09 2014-07-23 株式会社日立ハイテクノロジーズ 真空処理装置
JP5582152B2 (ja) * 2012-02-03 2014-09-03 東京エレクトロン株式会社 基板搬送装置、基板搬送方法及び記憶媒体
JP5664570B2 (ja) * 2012-02-09 2015-02-04 東京エレクトロン株式会社 基板処理装置及び基板処理方法
JP5600703B2 (ja) 2012-03-30 2014-10-01 東京エレクトロン株式会社 搬送装置及び搬送方法
JP6339909B2 (ja) * 2014-09-17 2018-06-06 株式会社Screenホールディングス 基板処理装置および基板処理方法
KR101817209B1 (ko) * 2016-06-24 2018-02-22 세메스 주식회사 기판 처리 장치 및 방법
JP7008573B2 (ja) * 2018-05-16 2022-01-25 東京エレクトロン株式会社 搬送方法および搬送装置
CN115552583B (zh) * 2020-06-05 2025-06-27 日商乐华股份有限公司 晶圆搬运装置以及晶圆搬运方法
KR102624577B1 (ko) * 2020-10-28 2024-01-15 세메스 주식회사 기판 처리 장치 및 기판 처리 방법
US11862507B2 (en) * 2020-11-25 2024-01-02 Kawasaki Jukogyo Kabushiki Kaisha Robot system, and slip determination method

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0529441A (ja) * 1991-07-23 1993-02-05 Oki Electric Ind Co Ltd ウエハー位置およびオリエンテーシヨンフラツト方向検出方法
JPH07302828A (ja) * 1995-04-24 1995-11-14 Nikon Corp 基板搬送装置
JPH11106044A (ja) * 1997-10-08 1999-04-20 Mitsubishi Electric Corp 基板搬送装置および基板搬送方法
JP2008053552A (ja) * 2006-08-25 2008-03-06 Tokyo Electron Ltd ウェハ搬送装置、ウェハ搬送方法及び記憶媒体
JP2009054933A (ja) * 2007-08-29 2009-03-12 Ryusyo Industrial Co Ltd ウエハ搬送システム
WO2011061912A1 (ja) * 2009-11-19 2011-05-26 株式会社アルバック 基板中心位置の特定方法
JP2011108958A (ja) * 2009-11-20 2011-06-02 Hitachi High-Tech Control Systems Corp 半導体ウェーハ搬送装置及びこれを用いた搬送方法
JP2016134526A (ja) * 2015-01-20 2016-07-25 リンテック株式会社 移載装置および移載方法
WO2020226024A1 (ja) * 2019-05-09 2020-11-12 川崎重工業株式会社 基板搬送ロボット及び基板搬送方法

Also Published As

Publication number Publication date
KR20240041909A (ko) 2024-04-01
KR102913489B1 (ko) 2026-01-15
US20220399218A1 (en) 2022-12-15
WO2022259948A1 (ja) 2022-12-15
TW202306014A (zh) 2023-02-01
TWI822103B (zh) 2023-11-11
US12002695B2 (en) 2024-06-04
JP7734744B2 (ja) 2025-09-05
CN117836923A (zh) 2024-04-05
JP2025176047A (ja) 2025-12-03

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