JPWO2021224973A5 - - Google Patents

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JPWO2021224973A5
JPWO2021224973A5 JP2022519866A JP2022519866A JPWO2021224973A5 JP WO2021224973 A5 JPWO2021224973 A5 JP WO2021224973A5 JP 2022519866 A JP2022519866 A JP 2022519866A JP 2022519866 A JP2022519866 A JP 2022519866A JP WO2021224973 A5 JPWO2021224973 A5 JP WO2021224973A5
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JP
Japan
Prior art keywords
opening
mass spectrometer
gas chromatograph
ionization chamber
sample
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JP2022519866A
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English (en)
Japanese (ja)
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JPWO2021224973A1 (https=
JP7409492B2 (ja
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Priority claimed from PCT/JP2020/018600 external-priority patent/WO2021224973A1/ja
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Publication of JPWO2021224973A5 publication Critical patent/JPWO2021224973A5/ja
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JP2022519866A 2020-05-08 2020-05-08 ガスクロマトグラフ質量分析計 Active JP7409492B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/018600 WO2021224973A1 (ja) 2020-05-08 2020-05-08 ガスクロマトグラフ質量分析計

Publications (3)

Publication Number Publication Date
JPWO2021224973A1 JPWO2021224973A1 (https=) 2021-11-11
JPWO2021224973A5 true JPWO2021224973A5 (https=) 2022-12-22
JP7409492B2 JP7409492B2 (ja) 2024-01-09

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JP2022519866A Active JP7409492B2 (ja) 2020-05-08 2020-05-08 ガスクロマトグラフ質量分析計

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JP (1) JP7409492B2 (https=)
WO (1) WO2021224973A1 (https=)

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6015247Y2 (ja) * 1980-04-28 1985-05-14 株式会社島津製作所 質量分析用イオン源装置
US6037179A (en) * 1998-04-30 2000-03-14 Hewlett-Packard Company Method and apparatus for suppression of analyte diffusion in an ionization detector
JP2001126658A (ja) * 1999-10-29 2001-05-11 Jeol Ltd 質量分析装置
JP2003270207A (ja) * 2002-03-12 2003-09-25 Jeol Ltd 質量分析装置用イオン化装置および質量分析装置
WO2007102204A1 (ja) * 2006-03-07 2007-09-13 Shimadzu Corporation 質量分析装置
WO2008037073A1 (en) * 2006-09-25 2008-04-03 Mds Analytical Technologies, A Business Unit Of Mds Inc., Doing Business Through Its Sciex Division Multiple sample sources for use with mass spectrometers, and apparatus, devices, and methods therefor
US8426805B2 (en) * 2008-02-05 2013-04-23 Thermo Finnigan Llc Method and apparatus for response and tune locking of a mass spectrometer
US9048080B2 (en) * 2010-08-19 2015-06-02 Leco Corporation Time-of-flight mass spectrometer with accumulating electron impact ion source
CN107301945B (zh) * 2016-04-14 2024-02-13 广州禾信仪器股份有限公司 电子轰击源及质谱仪
WO2018100621A1 (ja) * 2016-11-29 2018-06-07 株式会社島津製作所 イオン化装置及び質量分析装置

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