JP7409492B2 - ガスクロマトグラフ質量分析計 - Google Patents

ガスクロマトグラフ質量分析計 Download PDF

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JP7409492B2
JP7409492B2 JP2022519866A JP2022519866A JP7409492B2 JP 7409492 B2 JP7409492 B2 JP 7409492B2 JP 2022519866 A JP2022519866 A JP 2022519866A JP 2022519866 A JP2022519866 A JP 2022519866A JP 7409492 B2 JP7409492 B2 JP 7409492B2
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opening
ionization chamber
sample
section
mass spectrometer
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JPWO2021224973A1 (https=
JPWO2021224973A5 (https=
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誠人 ▲高▼倉
翔太 畑
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Shimadzu Corp
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Shimadzu Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode

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  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
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  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2022519866A 2020-05-08 2020-05-08 ガスクロマトグラフ質量分析計 Active JP7409492B2 (ja)

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PCT/JP2020/018600 WO2021224973A1 (ja) 2020-05-08 2020-05-08 ガスクロマトグラフ質量分析計

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JPWO2021224973A5 JPWO2021224973A5 (https=) 2022-12-22
JP7409492B2 true JP7409492B2 (ja) 2024-01-09

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Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001126658A (ja) 1999-10-29 2001-05-11 Jeol Ltd 質量分析装置
JP2003270207A (ja) 2002-03-12 2003-09-25 Jeol Ltd 質量分析装置用イオン化装置および質量分析装置
WO2007102204A1 (ja) 2006-03-07 2007-09-13 Shimadzu Corporation 質量分析装置
US20090194681A1 (en) 2008-02-05 2009-08-06 Mccauley Edward B Method and Apparatus for Response and Tune Locking of a Mass Spectrometer
JP2010504504A (ja) 2006-09-25 2010-02-12 エムディーエス アナリティカル テクノロジーズ， ア ビジネス ユニット オブ エムディーエス インコーポレイテッド， ドゥーイング ビジネス スルー イッツ サイエックス ディビジョン 質量分析計とともに使用するための複数の試料供給源、ならびにそのための装置、デバイスおよび方法
JP2013539590A (ja) 2010-08-19 2013-10-24 レコ コーポレイション 蓄積式電子衝撃イオン源を有する飛行時間型質量分析計
WO2018100621A1 (ja) 2016-11-29 2018-06-07 株式会社島津製作所 イオン化装置及び質量分析装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6015247Y2 (ja) * 1980-04-28 1985-05-14 株式会社島津製作所 質量分析用イオン源装置
US6037179A (en) * 1998-04-30 2000-03-14 Hewlett-Packard Company Method and apparatus for suppression of analyte diffusion in an ionization detector
CN107301945B (zh) * 2016-04-14 2024-02-13 广州禾信仪器股份有限公司 电子轰击源及质谱仪

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001126658A (ja) 1999-10-29 2001-05-11 Jeol Ltd 質量分析装置
JP2003270207A (ja) 2002-03-12 2003-09-25 Jeol Ltd 質量分析装置用イオン化装置および質量分析装置
WO2007102204A1 (ja) 2006-03-07 2007-09-13 Shimadzu Corporation 質量分析装置
JP2010504504A (ja) 2006-09-25 2010-02-12 エムディーエス アナリティカル テクノロジーズ， ア ビジネス ユニット オブ エムディーエス インコーポレイテッド， ドゥーイング ビジネス スルー イッツ サイエックス ディビジョン 質量分析計とともに使用するための複数の試料供給源、ならびにそのための装置、デバイスおよび方法
US20090194681A1 (en) 2008-02-05 2009-08-06 Mccauley Edward B Method and Apparatus for Response and Tune Locking of a Mass Spectrometer
JP2013539590A (ja) 2010-08-19 2013-10-24 レコ コーポレイション 蓄積式電子衝撃イオン源を有する飛行時間型質量分析計
WO2018100621A1 (ja) 2016-11-29 2018-06-07 株式会社島津製作所 イオン化装置及び質量分析装置

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WO2021224973A1 (ja) 2021-11-11

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