JPWO2021224973A1 - - Google Patents

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Publication number
JPWO2021224973A1
JPWO2021224973A1 JP2022519866A JP2022519866A JPWO2021224973A1 JP WO2021224973 A1 JPWO2021224973 A1 JP WO2021224973A1 JP 2022519866 A JP2022519866 A JP 2022519866A JP 2022519866 A JP2022519866 A JP 2022519866A JP WO2021224973 A1 JPWO2021224973 A1 JP WO2021224973A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2022519866A
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Japanese (ja)
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JPWO2021224973A5 (https=
JP7409492B2 (ja
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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2022519866A 2020-05-08 2020-05-08 ガスクロマトグラフ質量分析計 Active JP7409492B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/018600 WO2021224973A1 (ja) 2020-05-08 2020-05-08 ガスクロマトグラフ質量分析計

Publications (3)

Publication Number Publication Date
JPWO2021224973A1 true JPWO2021224973A1 (https=) 2021-11-11
JPWO2021224973A5 JPWO2021224973A5 (https=) 2022-12-22
JP7409492B2 JP7409492B2 (ja) 2024-01-09

Family

ID=78467986

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022519866A Active JP7409492B2 (ja) 2020-05-08 2020-05-08 ガスクロマトグラフ質量分析計

Country Status (2)

Country Link
JP (1) JP7409492B2 (https=)
WO (1) WO2021224973A1 (https=)

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6015247Y2 (ja) * 1980-04-28 1985-05-14 株式会社島津製作所 質量分析用イオン源装置
JPH11344472A (ja) * 1998-04-30 1999-12-14 Hewlett Packard Co <Hp> イオン化検出器における検体拡散の抑制方法とその装置
JP2001126658A (ja) * 1999-10-29 2001-05-11 Jeol Ltd 質量分析装置
JP2003270207A (ja) * 2002-03-12 2003-09-25 Jeol Ltd 質量分析装置用イオン化装置および質量分析装置
WO2007102204A1 (ja) * 2006-03-07 2007-09-13 Shimadzu Corporation 質量分析装置
US20090194681A1 (en) * 2008-02-05 2009-08-06 Mccauley Edward B Method and Apparatus for Response and Tune Locking of a Mass Spectrometer
JP2010504504A (ja) * 2006-09-25 2010-02-12 エムディーエス アナリティカル テクノロジーズ, ア ビジネス ユニット オブ エムディーエス インコーポレイテッド, ドゥーイング ビジネス スルー イッツ サイエックス ディビジョン 質量分析計とともに使用するための複数の試料供給源、ならびにそのための装置、デバイスおよび方法
JP2013539590A (ja) * 2010-08-19 2013-10-24 レコ コーポレイション 蓄積式電子衝撃イオン源を有する飛行時間型質量分析計
WO2018100621A1 (ja) * 2016-11-29 2018-06-07 株式会社島津製作所 イオン化装置及び質量分析装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107301945B (zh) * 2016-04-14 2024-02-13 广州禾信仪器股份有限公司 电子轰击源及质谱仪

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6015247Y2 (ja) * 1980-04-28 1985-05-14 株式会社島津製作所 質量分析用イオン源装置
JPH11344472A (ja) * 1998-04-30 1999-12-14 Hewlett Packard Co <Hp> イオン化検出器における検体拡散の抑制方法とその装置
JP2001126658A (ja) * 1999-10-29 2001-05-11 Jeol Ltd 質量分析装置
JP2003270207A (ja) * 2002-03-12 2003-09-25 Jeol Ltd 質量分析装置用イオン化装置および質量分析装置
WO2007102204A1 (ja) * 2006-03-07 2007-09-13 Shimadzu Corporation 質量分析装置
JP2010504504A (ja) * 2006-09-25 2010-02-12 エムディーエス アナリティカル テクノロジーズ, ア ビジネス ユニット オブ エムディーエス インコーポレイテッド, ドゥーイング ビジネス スルー イッツ サイエックス ディビジョン 質量分析計とともに使用するための複数の試料供給源、ならびにそのための装置、デバイスおよび方法
US20090194681A1 (en) * 2008-02-05 2009-08-06 Mccauley Edward B Method and Apparatus for Response and Tune Locking of a Mass Spectrometer
JP2013539590A (ja) * 2010-08-19 2013-10-24 レコ コーポレイション 蓄積式電子衝撃イオン源を有する飛行時間型質量分析計
WO2018100621A1 (ja) * 2016-11-29 2018-06-07 株式会社島津製作所 イオン化装置及び質量分析装置

Also Published As

Publication number Publication date
WO2021224973A1 (ja) 2021-11-11
JP7409492B2 (ja) 2024-01-09

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