JP2011507194A5 - - Google Patents

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JP2011507194A5
JP2011507194A5 JP2010538162A JP2010538162A JP2011507194A5 JP 2011507194 A5 JP2011507194 A5 JP 2011507194A5 JP 2010538162 A JP2010538162 A JP 2010538162A JP 2010538162 A JP2010538162 A JP 2010538162A JP 2011507194 A5 JP2011507194 A5 JP 2011507194A5
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Japan
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charge
item
mass analyzer
discharge
specimen
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JP2010538162A
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JP2011507194A (ja
JP5477295B2 (ja
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Priority claimed from PCT/US2008/086441 external-priority patent/WO2009076535A1/en
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Publication of JP2011507194A5 publication Critical patent/JP2011507194A5/ja
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JP2010538162A 2007-12-13 2008-12-11 電荷監視質量分析を行うためのシステムおよび方法 Expired - Fee Related JP5477295B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US1340807P 2007-12-13 2007-12-13
US61/013,408 2007-12-13
PCT/US2008/086441 WO2009076535A1 (en) 2007-12-13 2008-12-11 System and method for performing charge-monitoring mass spectrometry

Related Child Applications (1)

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JP2014012159A Division JP5793207B2 (ja) 2007-12-13 2014-01-27 検体生体粒子の電荷監視質量分析を行うためのシステムおよび方法

Publications (3)

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JP2011507194A JP2011507194A (ja) 2011-03-03
JP2011507194A5 true JP2011507194A5 (https=) 2013-01-17
JP5477295B2 JP5477295B2 (ja) 2014-04-23

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JP2010538162A Expired - Fee Related JP5477295B2 (ja) 2007-12-13 2008-12-11 電荷監視質量分析を行うためのシステムおよび方法
JP2014012159A Expired - Fee Related JP5793207B2 (ja) 2007-12-13 2014-01-27 検体生体粒子の電荷監視質量分析を行うためのシステムおよび方法

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JP2014012159A Expired - Fee Related JP5793207B2 (ja) 2007-12-13 2014-01-27 検体生体粒子の電荷監視質量分析を行うためのシステムおよび方法

Country Status (4)

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US (1) US8963075B2 (https=)
EP (1) EP2232213A4 (https=)
JP (2) JP5477295B2 (https=)
WO (1) WO2009076535A1 (https=)

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WO2021061650A1 (en) 2019-09-25 2021-04-01 The Trustees Of Indiana University Apparatus and method for pulsed mode charge detection mass spectrometry
CN114728237B (zh) 2019-10-10 2026-02-24 印地安纳大学理事会 用于识别、选择和纯化粒子的系统和方法
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