JPWO2021140407A5 - - Google Patents

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Publication number
JPWO2021140407A5
JPWO2021140407A5 JP2021569603A JP2021569603A JPWO2021140407A5 JP WO2021140407 A5 JPWO2021140407 A5 JP WO2021140407A5 JP 2021569603 A JP2021569603 A JP 2021569603A JP 2021569603 A JP2021569603 A JP 2021569603A JP WO2021140407 A5 JPWO2021140407 A5 JP WO2021140407A5
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JP
Japan
Prior art keywords
insulator
oxide
region
conductor
forming
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JP2021569603A
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English (en)
Japanese (ja)
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JP7640472B2 (ja
JPWO2021140407A1 (enExample
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Priority claimed from PCT/IB2020/062468 external-priority patent/WO2021140407A1/ja
Publication of JPWO2021140407A1 publication Critical patent/JPWO2021140407A1/ja
Publication of JPWO2021140407A5 publication Critical patent/JPWO2021140407A5/ja
Priority to JP2025025809A priority Critical patent/JP2025071240A/ja
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Publication of JP7640472B2 publication Critical patent/JP7640472B2/ja
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JP2021569603A 2020-01-10 2020-12-28 半導体装置、および半導体装置の作製方法 Active JP7640472B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2025025809A JP2025071240A (ja) 2020-01-10 2025-02-20 半導体装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020002997 2020-01-10
JP2020002997 2020-01-10
PCT/IB2020/062468 WO2021140407A1 (ja) 2020-01-10 2020-12-28 半導体装置、および半導体装置の作製方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2025025809A Division JP2025071240A (ja) 2020-01-10 2025-02-20 半導体装置

Publications (3)

Publication Number Publication Date
JPWO2021140407A1 JPWO2021140407A1 (enExample) 2021-07-15
JPWO2021140407A5 true JPWO2021140407A5 (enExample) 2023-12-27
JP7640472B2 JP7640472B2 (ja) 2025-03-05

Family

ID=76788512

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2021569603A Active JP7640472B2 (ja) 2020-01-10 2020-12-28 半導体装置、および半導体装置の作製方法
JP2025025809A Pending JP2025071240A (ja) 2020-01-10 2025-02-20 半導体装置

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2025025809A Pending JP2025071240A (ja) 2020-01-10 2025-02-20 半導体装置

Country Status (5)

Country Link
US (1) US20230027402A1 (enExample)
JP (2) JP7640472B2 (enExample)
KR (1) KR20220124700A (enExample)
CN (1) CN114930547A (enExample)
WO (1) WO2021140407A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11929436B2 (en) 2021-02-02 2024-03-12 Taiwan Semiconductor Manufacturing Company Limited Thin transistor including a hydrogen-blocking dielectric barrier and methods for forming the same
US11856751B2 (en) * 2021-03-12 2023-12-26 Taiwan Semiconductor Manufacturing Company Limited Drain sharing for memory cell thin film access transistors and methods for forming the same
US12218252B2 (en) * 2021-08-30 2025-02-04 Taiwan Semiconductor Manufacturing Company Ltd. Semiconductor structure with source and drain electrode embedded within semiconductor layer and manufacturing method thereof
US12133396B2 (en) * 2021-08-30 2024-10-29 Taiwan Semiconductor Manufacturing Company Ltd. Semiconductor device, integrated circuit and method of manufacturing the same
KR20250093510A (ko) * 2022-10-21 2025-06-24 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 기억 장치
CN119159015B (zh) * 2024-11-20 2025-06-27 江苏爱矽半导体科技有限公司 一种半导体封装机

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09139508A (ja) * 1995-11-10 1997-05-27 Toyota Motor Corp 薄膜トランジスタの製造方法
US7419858B2 (en) * 2006-08-31 2008-09-02 Sharp Laboratories Of America, Inc. Recessed-gate thin-film transistor with self-aligned lightly doped drain
CN102804360B (zh) 2009-12-25 2014-12-17 株式会社半导体能源研究所 半导体装置
DE112011102644B4 (de) 2010-08-06 2019-12-05 Semiconductor Energy Laboratory Co., Ltd. Integrierte Halbleiterschaltung
JP6250883B2 (ja) 2013-03-01 2017-12-20 株式会社半導体エネルギー研究所 半導体装置
TWI664731B (zh) * 2013-05-20 2019-07-01 半導體能源研究所股份有限公司 半導體裝置
US9647125B2 (en) 2013-05-20 2017-05-09 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
US9343579B2 (en) * 2013-05-20 2016-05-17 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US9954003B2 (en) * 2016-02-17 2018-04-24 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and electronic device
JP7267989B2 (ja) 2018-02-28 2023-05-02 株式会社半導体エネルギー研究所 半導体装置

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