JPWO2021062349A5 - - Google Patents

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Publication number
JPWO2021062349A5
JPWO2021062349A5 JP2022518258A JP2022518258A JPWO2021062349A5 JP WO2021062349 A5 JPWO2021062349 A5 JP WO2021062349A5 JP 2022518258 A JP2022518258 A JP 2022518258A JP 2022518258 A JP2022518258 A JP 2022518258A JP WO2021062349 A5 JPWO2021062349 A5 JP WO2021062349A5
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coating
materials
layer
range
thickness
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JP2022518258A
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Japanese (ja)
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JP2022548981A (ja
JP2022548981A5 (https=
JP7662619B2 (ja
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Priority claimed from US16/890,336 external-priority patent/US11540432B2/en
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Priority to JP2023143438A priority Critical patent/JP7715772B2/ja
Publication of JP2022548981A5 publication Critical patent/JP2022548981A5/ja
Publication of JPWO2021062349A5 publication Critical patent/JPWO2021062349A5/ja
Priority to JP2025061658A priority patent/JP2025121899A/ja
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Publication of JP7662619B2 publication Critical patent/JP7662619B2/ja
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JP2022518258A 2019-09-26 2020-09-28 半導体プロセスツールにおける静電気散逸用の超薄型共形コーティング Active JP7662619B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2023143438A JP7715772B2 (ja) 2019-09-26 2023-09-05 半導体プロセスツールにおける静電気散逸用の超薄型共形コーティング
JP2025061658A JP2025121899A (ja) 2019-09-26 2025-04-03 半導体プロセスツールにおける静電気散逸用の超薄型共形コーティング

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
IN201941038863 2019-09-26
IN201941038863 2019-09-26
US16/890,336 2020-06-02
US16/890,346 2020-06-02
US16/890,336 US11540432B2 (en) 2019-09-26 2020-06-02 Ultrathin conformal coatings for electrostatic dissipation in semiconductor process tools
US16/890,346 US11547030B2 (en) 2019-09-26 2020-06-02 Ultrathin conformal coatings for electrostatic dissipation in semiconductor process tools
PCT/US2020/053036 WO2021062349A1 (en) 2019-09-26 2020-09-28 Ultrathin conformal coatings for electrostatic dissipation in semiconductor process tools

Related Child Applications (2)

Application Number Title Priority Date Filing Date
JP2023143438A Division JP7715772B2 (ja) 2019-09-26 2023-09-05 半導体プロセスツールにおける静電気散逸用の超薄型共形コーティング
JP2025061658A Division JP2025121899A (ja) 2019-09-26 2025-04-03 半導体プロセスツールにおける静電気散逸用の超薄型共形コーティング

Publications (4)

Publication Number Publication Date
JP2022548981A JP2022548981A (ja) 2022-11-22
JP2022548981A5 JP2022548981A5 (https=) 2024-03-14
JPWO2021062349A5 true JPWO2021062349A5 (https=) 2024-03-14
JP7662619B2 JP7662619B2 (ja) 2025-04-15

Family

ID=75162433

Family Applications (3)

Application Number Title Priority Date Filing Date
JP2022518258A Active JP7662619B2 (ja) 2019-09-26 2020-09-28 半導体プロセスツールにおける静電気散逸用の超薄型共形コーティング
JP2023143438A Active JP7715772B2 (ja) 2019-09-26 2023-09-05 半導体プロセスツールにおける静電気散逸用の超薄型共形コーティング
JP2025061658A Pending JP2025121899A (ja) 2019-09-26 2025-04-03 半導体プロセスツールにおける静電気散逸用の超薄型共形コーティング

Family Applications After (2)

Application Number Title Priority Date Filing Date
JP2023143438A Active JP7715772B2 (ja) 2019-09-26 2023-09-05 半導体プロセスツールにおける静電気散逸用の超薄型共形コーティング
JP2025061658A Pending JP2025121899A (ja) 2019-09-26 2025-04-03 半導体プロセスツールにおける静電気散逸用の超薄型共形コーティング

Country Status (6)

Country Link
US (4) US11540432B2 (https=)
JP (3) JP7662619B2 (https=)
KR (2) KR20250113524A (https=)
CN (2) CN114424676B (https=)
TW (3) TW202446985A (https=)
WO (1) WO2021062349A1 (https=)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11540432B2 (en) 2019-09-26 2022-12-27 Applied Materials, Inc. Ultrathin conformal coatings for electrostatic dissipation in semiconductor process tools
WO2022269429A1 (en) * 2021-06-25 2022-12-29 Advanced Potash Technologies, Ltd. Multi-step methods of making a high temperature multi-phase material and related materials, compositions and methods of use
US12557595B2 (en) * 2022-01-26 2026-02-17 Applied Materials, Inc. Methods for electrostatic chuck ceramic surfacing
TW202346240A (zh) * 2022-02-26 2023-12-01 日商Toto股份有限公司 複合結構物及具備複合結構物之半導體製造裝置
JP2023124886A (ja) * 2022-02-26 2023-09-07 Toto株式会社 複合構造物および複合構造物を備えた半導体製造装置
JP2023124885A (ja) * 2022-02-26 2023-09-07 Toto株式会社 複合構造物および複合構造物を備えた半導体製造装置
KR102705799B1 (ko) * 2022-03-29 2024-09-12 세메스 주식회사 로봇 암 및 이를 포함하는 기판처리장치
JP2025522592A (ja) * 2022-06-28 2025-07-15 インテグリス・インコーポレーテッド 送達システムのためのモジュールおよび関連方法
KR20250029243A (ko) * 2022-07-05 2025-03-04 램 리써치 코포레이션 엔드 이펙터
KR102652284B1 (ko) * 2022-07-11 2024-03-28 한국생산기술연구원 기판 이송용 핸드
US12588463B2 (en) * 2023-04-21 2026-03-24 STATS ChipPAC Pte. Ltd. Semiconductor device and methods of making and using an enhanced carrier to reduce electrostatic discharge
CN116891131A (zh) * 2023-06-01 2023-10-17 张组 一种铺砖路面用地砖的终端转运设备
JP2025047784A (ja) * 2023-09-21 2025-04-03 キヤノントッキ株式会社 成膜装置及び成膜方法
JP2025047786A (ja) * 2023-09-21 2025-04-03 キヤノントッキ株式会社 成膜装置及び成膜方法
JP2025047785A (ja) * 2023-09-21 2025-04-03 キヤノントッキ株式会社 成膜装置及び成膜方法
WO2025079541A1 (ja) * 2023-10-12 2025-04-17 セントラル硝子株式会社 成膜方法、半導体デバイスの製造方法、及び成膜システム
US20250149373A1 (en) * 2023-11-06 2025-05-08 Applied Materials, Inc. Soft touch coating materials for substrate handling
US20250226258A1 (en) * 2024-01-10 2025-07-10 Applied Materials, Inc. Compact faceplate loading platform

Family Cites Families (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2031098A1 (en) * 1990-01-16 1991-07-17 William F. Banholzer Cvd diamond coated annulus components and method of their fabrication
US5756222A (en) * 1994-08-15 1998-05-26 Applied Materials, Inc. Corrosion-resistant aluminum article for semiconductor processing equipment
US5955858A (en) 1997-02-14 1999-09-21 Applied Materials, Inc. Mechanically clamping robot wrist
US6641939B1 (en) 1998-07-01 2003-11-04 The Morgan Crucible Company Plc Transition metal oxide doped alumina and methods of making and using
TW543079B (en) * 1999-06-03 2003-07-21 Applied Materials Inc Robot blade for semiconductor processing equipment
US6290859B1 (en) * 1999-11-12 2001-09-18 Sandia Corporation Tungsten coating for improved wear resistance and reliability of microelectromechanical devices
US6316734B1 (en) * 2000-03-07 2001-11-13 3M Innovative Properties Company Flexible circuits with static discharge protection and process for manufacture
JP2002292920A (ja) * 2001-04-02 2002-10-09 Matsushita Electric Ind Co Ltd 電極構造体およびその製造方法ならびに電極構造体を用いる画像形成装置
US20080213496A1 (en) 2002-02-14 2008-09-04 Applied Materials, Inc. Method of coating semiconductor processing apparatus with protective yttrium-containing coatings
US20040183135A1 (en) * 2003-03-19 2004-09-23 Oh-Hun Kwon ESD dissipative structural components
JP4895635B2 (ja) * 2006-02-20 2012-03-14 セイコーインスツル株式会社 搬送装置
US9204525B2 (en) 2006-07-07 2015-12-01 Cocoon Inc. Protective covers
KR101119075B1 (ko) * 2007-03-12 2012-03-15 주식회사 코미코 웨이퍼 이송 장치
KR100825418B1 (ko) 2007-10-15 2008-04-29 (주)쓰리나인 케이스 외관의 정전기 방지용 박막 및 그 제조방법
FI20095947A0 (fi) * 2009-09-14 2009-09-14 Beneq Oy Monikerrospinnoite, menetelmä monikerrospinnoitteen valmistamiseksi, ja sen käyttötapoja
WO2012088172A2 (en) 2010-12-20 2012-06-28 Entegris, Inc. Front opening large substrate container
US9105379B2 (en) 2011-01-21 2015-08-11 Uchicago Argonne, Llc Tunable resistance coatings
KR101387387B1 (ko) 2011-12-21 2014-04-30 (주)탑나노시스 대전방지용 시트 및 이를 포함하여 대전방지된 작업 스테이지
US20150311043A1 (en) * 2014-04-25 2015-10-29 Applied Materials, Inc. Chamber component with fluorinated thin film coating
US20150334812A1 (en) * 2014-05-16 2015-11-19 John Mazzocco Design to manage charge and discharge of wafers and wafer carrier rings
TWI676227B (zh) * 2015-01-23 2019-11-01 美商應用材料股份有限公司 半導體工藝設備
US9881820B2 (en) 2015-10-22 2018-01-30 Lam Research Corporation Front opening ring pod
US20170140902A1 (en) 2015-11-16 2017-05-18 Coorstek, Inc. Corrosion-resistant components and methods of making
CN108292588B (zh) 2015-12-04 2022-02-18 应用材料公司 用以防止hdp-cvd腔室电弧放电的先进涂层方法及材料
US9850573B1 (en) * 2016-06-23 2017-12-26 Applied Materials, Inc. Non-line of sight deposition of erbium based plasma resistant ceramic coating
US20180016678A1 (en) * 2016-07-15 2018-01-18 Applied Materials, Inc. Multi-layer coating with diffusion barrier layer and erosion resistant layer
JP2018142597A (ja) * 2017-02-27 2018-09-13 三菱ケミカル株式会社 太陽電池モジュール
JP7019529B2 (ja) * 2018-07-30 2022-02-15 京セラ株式会社 試料搬送部材
US11540432B2 (en) 2019-09-26 2022-12-27 Applied Materials, Inc. Ultrathin conformal coatings for electrostatic dissipation in semiconductor process tools

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