JPWO2021038361A5 - - Google Patents

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Publication number
JPWO2021038361A5
JPWO2021038361A5 JP2021542304A JP2021542304A JPWO2021038361A5 JP WO2021038361 A5 JPWO2021038361 A5 JP WO2021038361A5 JP 2021542304 A JP2021542304 A JP 2021542304A JP 2021542304 A JP2021542304 A JP 2021542304A JP WO2021038361 A5 JPWO2021038361 A5 JP WO2021038361A5
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JP
Japan
Prior art keywords
insulator
conductor
semiconductor device
nitride
disposed
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Granted
Application number
JP2021542304A
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English (en)
Japanese (ja)
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JPWO2021038361A1 (https=
JP7629856B2 (ja
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Priority claimed from PCT/IB2020/057714 external-priority patent/WO2021038361A1/ja
Publication of JPWO2021038361A1 publication Critical patent/JPWO2021038361A1/ja
Publication of JPWO2021038361A5 publication Critical patent/JPWO2021038361A5/ja
Priority to JP2025016271A priority Critical patent/JP2025065235A/ja
Application granted granted Critical
Publication of JP7629856B2 publication Critical patent/JP7629856B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2021542304A 2019-08-30 2020-08-17 半導体装置 Active JP7629856B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2025016271A JP2025065235A (ja) 2019-08-30 2025-02-03 半導体装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019158456 2019-08-30
JP2019158456 2019-08-30
PCT/IB2020/057714 WO2021038361A1 (ja) 2019-08-30 2020-08-17 半導体装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2025016271A Division JP2025065235A (ja) 2019-08-30 2025-02-03 半導体装置

Publications (3)

Publication Number Publication Date
JPWO2021038361A1 JPWO2021038361A1 (https=) 2021-03-04
JPWO2021038361A5 true JPWO2021038361A5 (https=) 2023-08-21
JP7629856B2 JP7629856B2 (ja) 2025-02-14

Family

ID=74683598

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2021542304A Active JP7629856B2 (ja) 2019-08-30 2020-08-17 半導体装置
JP2025016271A Pending JP2025065235A (ja) 2019-08-30 2025-02-03 半導体装置

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2025016271A Pending JP2025065235A (ja) 2019-08-30 2025-02-03 半導体装置

Country Status (7)

Country Link
US (2) US12538523B2 (https=)
JP (2) JP7629856B2 (https=)
KR (1) KR20220052972A (https=)
CN (1) CN114223060A (https=)
DE (1) DE112020004134T5 (https=)
TW (1) TW202129877A (https=)
WO (1) WO2021038361A1 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20230111510A (ko) 2022-01-18 2023-07-25 삼성전자주식회사 반도체 장치
WO2023180859A1 (ja) * 2022-03-25 2023-09-28 株式会社半導体エネルギー研究所 半導体装置及び半導体装置の作製方法
US20250015191A1 (en) * 2023-07-06 2025-01-09 Taiwan Semiconductor Manufacturing Company, Ltd. Semiconductor device and manufacturing method thereof
WO2025017441A1 (ja) * 2023-07-20 2025-01-23 株式会社半導体エネルギー研究所 製造装置、及び、半導体装置の作製方法

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101473684B1 (ko) 2009-12-25 2014-12-18 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
KR101809105B1 (ko) 2010-08-06 2017-12-14 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 집적 회로
TWI574259B (zh) 2010-09-29 2017-03-11 半導體能源研究所股份有限公司 半導體記憶體裝置和其驅動方法
KR102108572B1 (ko) 2011-09-26 2020-05-07 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 반도체 장치의 제작 방법
KR102069158B1 (ko) 2012-05-10 2020-01-22 가부시키가이샤 한도오따이 에네루기 켄큐쇼 배선의 형성 방법, 반도체 장치, 및 반도체 장치의 제작 방법
JP6607681B2 (ja) 2014-03-07 2019-11-20 株式会社半導体エネルギー研究所 半導体装置
KR102788207B1 (ko) * 2015-04-13 2025-03-31 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
WO2017081579A1 (en) 2015-11-13 2017-05-18 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
US9917207B2 (en) 2015-12-25 2018-03-13 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
US10032918B2 (en) * 2016-04-22 2018-07-24 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
KR102605250B1 (ko) 2016-08-30 2023-11-27 삼성디스플레이 주식회사 반도체 장치 및 그 제조 방법
CN108075038A (zh) * 2016-11-11 2018-05-25 中芯国际集成电路制造(上海)有限公司 动态随机存储器及其形成方法
TW201836020A (zh) 2017-02-17 2018-10-01 日商半導體能源研究所股份有限公司 半導體裝置及半導體裝置的製造方法
JP2018206828A (ja) * 2017-05-31 2018-12-27 株式会社半導体エネルギー研究所 半導体装置、および半導体装置の作製方法
JPWO2019048987A1 (ja) 2017-09-06 2020-10-15 株式会社半導体エネルギー研究所 半導体装置、および半導体装置の作製方法
JP7229669B2 (ja) * 2017-11-17 2023-02-28 株式会社半導体エネルギー研究所 半導体装置、および半導体装置の作製方法

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