JPWO2021033075A5 - - Google Patents

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Publication number
JPWO2021033075A5
JPWO2021033075A5 JP2021541332A JP2021541332A JPWO2021033075A5 JP WO2021033075 A5 JPWO2021033075 A5 JP WO2021033075A5 JP 2021541332 A JP2021541332 A JP 2021541332A JP 2021541332 A JP2021541332 A JP 2021541332A JP WO2021033075 A5 JPWO2021033075 A5 JP WO2021033075A5
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JP
Japan
Prior art keywords
transistor
conductor
region
oxide semiconductor
gate
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JP2021541332A
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English (en)
Japanese (ja)
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JPWO2021033075A1 (https=
JP7720782B2 (ja
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Priority claimed from PCT/IB2020/057527 external-priority patent/WO2021033075A1/ja
Publication of JPWO2021033075A1 publication Critical patent/JPWO2021033075A1/ja
Publication of JPWO2021033075A5 publication Critical patent/JPWO2021033075A5/ja
Priority to JP2025126415A priority Critical patent/JP2025146965A/ja
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Publication of JP7720782B2 publication Critical patent/JP7720782B2/ja
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JP2021541332A 2019-08-22 2020-08-11 メモリセルおよび記憶装置 Active JP7720782B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2025126415A JP2025146965A (ja) 2019-08-22 2025-07-29 半導体装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019151814 2019-08-22
JP2019151814 2019-08-22
PCT/IB2020/057527 WO2021033075A1 (ja) 2019-08-22 2020-08-11 メモリセルおよび記憶装置

Related Child Applications (1)

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JP2025126415A Division JP2025146965A (ja) 2019-08-22 2025-07-29 半導体装置

Publications (3)

Publication Number Publication Date
JPWO2021033075A1 JPWO2021033075A1 (https=) 2021-02-25
JPWO2021033075A5 true JPWO2021033075A5 (https=) 2023-08-08
JP7720782B2 JP7720782B2 (ja) 2025-08-08

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ID=74660681

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JP2021541332A Active JP7720782B2 (ja) 2019-08-22 2020-08-11 メモリセルおよび記憶装置
JP2025126415A Pending JP2025146965A (ja) 2019-08-22 2025-07-29 半導体装置

Family Applications After (1)

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JP2025126415A Pending JP2025146965A (ja) 2019-08-22 2025-07-29 半導体装置

Country Status (5)

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US (1) US12457732B2 (https=)
JP (2) JP7720782B2 (https=)
KR (1) KR20220050134A (https=)
CN (1) CN114258586A (https=)
WO (1) WO2021033075A1 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20240165976A (ko) * 2022-03-31 2024-11-25 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치, 기억 장치, 및 전자 기기
JPWO2023223127A1 (https=) * 2022-05-16 2023-11-23
WO2025078928A1 (ja) * 2023-10-13 2025-04-17 株式会社半導体エネルギー研究所 半導体装置

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JP2001185700A (ja) 1999-12-27 2001-07-06 Mitsubishi Electric Corp 半導体記憶装置
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JP5064747B2 (ja) 2005-09-29 2012-10-31 株式会社半導体エネルギー研究所 半導体装置、電気泳動表示装置、表示モジュール、電子機器、及び半導体装置の作製方法
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JP2010263211A (ja) 2009-05-04 2010-11-18 Samsung Electronics Co Ltd 積層メモリ素子
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JP2012256821A (ja) 2010-09-13 2012-12-27 Semiconductor Energy Lab Co Ltd 記憶装置
JP2013236068A (ja) * 2012-04-12 2013-11-21 Semiconductor Energy Lab Co Ltd 半導体装置及び半導体装置の作製方法
JP2014135398A (ja) * 2013-01-10 2014-07-24 Fujitsu Semiconductor Ltd 半導体記憶装置
JP6607681B2 (ja) 2014-03-07 2019-11-20 株式会社半導体エネルギー研究所 半導体装置
KR102367921B1 (ko) * 2014-03-14 2022-02-25 가부시키가이샤 한도오따이 에네루기 켄큐쇼 회로 시스템
JP6635670B2 (ja) 2014-04-11 2020-01-29 株式会社半導体エネルギー研究所 半導体装置
WO2015170220A1 (en) 2014-05-09 2015-11-12 Semiconductor Energy Laboratory Co., Ltd. Memory device and electronic device
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JP6773453B2 (ja) 2015-05-26 2020-10-21 株式会社半導体エネルギー研究所 記憶装置及び電子機器
TWI667570B (zh) * 2015-07-15 2019-08-01 聯華電子股份有限公司 半導體裝置及其運作方法
WO2017068478A1 (en) 2015-10-22 2017-04-27 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device or memory device including the semiconductor device
KR20200014801A (ko) 2017-06-02 2020-02-11 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치, 전자 부품, 및 전자 기기
JP6448743B2 (ja) * 2017-10-30 2019-01-09 株式会社半導体エネルギー研究所 半導体装置
US11410716B2 (en) 2018-01-25 2022-08-09 Semiconductor Energy Laboratory Co., Ltd. Storage device, semiconductor device, and electronic device
TW202537448A (zh) 2019-01-25 2025-09-16 日商半導體能源研究所股份有限公司 半導體裝置及包括該半導體裝置的電子裝置
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KR102943470B1 (ko) 2019-02-22 2026-03-25 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 상기 반도체 장치를 가지는 전기 기기
KR20250125448A (ko) 2019-02-22 2025-08-21 가부시키가이샤 한도오따이 에네루기 켄큐쇼 오류 검출 기능을 가지는 기억 장치, 반도체 장치, 및 전자 기기

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