JPWO2020195559A5 - - Google Patents

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JPWO2020195559A5
JPWO2020195559A5 JP2021508873A JP2021508873A JPWO2020195559A5 JP WO2020195559 A5 JPWO2020195559 A5 JP WO2020195559A5 JP 2021508873 A JP2021508873 A JP 2021508873A JP 2021508873 A JP2021508873 A JP 2021508873A JP WO2020195559 A5 JPWO2020195559 A5 JP WO2020195559A5
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JP
Japan
Prior art keywords
gas
atoms contained
twice
less
dry etching
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JP2021508873A
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English (en)
Japanese (ja)
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JPWO2020195559A1 (https=
JP7445150B2 (ja
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Priority claimed from PCT/JP2020/008570 external-priority patent/WO2020195559A1/ja
Publication of JPWO2020195559A1 publication Critical patent/JPWO2020195559A1/ja
Publication of JPWO2020195559A5 publication Critical patent/JPWO2020195559A5/ja
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Publication of JP7445150B2 publication Critical patent/JP7445150B2/ja
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JP2021508873A 2019-03-22 2020-03-02 ドライエッチング方法及び半導体デバイスの製造方法 Active JP7445150B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019054437 2019-03-22
JP2019054437 2019-03-22
PCT/JP2020/008570 WO2020195559A1 (ja) 2019-03-22 2020-03-02 ドライエッチング方法及び半導体デバイスの製造方法

Publications (3)

Publication Number Publication Date
JPWO2020195559A1 JPWO2020195559A1 (https=) 2020-10-01
JPWO2020195559A5 true JPWO2020195559A5 (https=) 2023-01-06
JP7445150B2 JP7445150B2 (ja) 2024-03-07

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ID=72609015

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JP2021508873A Active JP7445150B2 (ja) 2019-03-22 2020-03-02 ドライエッチング方法及び半導体デバイスの製造方法

Country Status (7)

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US (1) US12154791B2 (https=)
JP (1) JP7445150B2 (https=)
KR (1) KR102765856B1 (https=)
CN (1) CN113614891A (https=)
SG (1) SG11202109169TA (https=)
TW (1) TWI833930B (https=)
WO (1) WO2020195559A1 (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102927170B1 (ko) * 2021-03-24 2026-02-11 삼성전자 주식회사 식각 가스 조성물, 이를 이용한 미세 패턴 형성 방법 및 수직형 반도체 장치의 제조 방법
US12087593B2 (en) * 2022-06-15 2024-09-10 Nanya Technology Corporation Method of plasma etching
CN115404552B (zh) * 2022-11-01 2023-02-03 清华大学 一种极低气压反应腔下的侧壁钝化侧蚀动态平衡深刻蚀光子晶体结构制备方法
US20250079127A1 (en) * 2023-08-28 2025-03-06 L'Air Liquide, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude Dielectric plasma etching using c2h2f2
US20250079183A1 (en) * 2023-08-28 2025-03-06 L'Air Liquide, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude Cryogenic plasma etching using c2h2f2

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3336975B2 (ja) 1998-03-27 2002-10-21 日本電気株式会社 基板処理方法
JP5407101B2 (ja) * 2000-09-07 2014-02-05 ダイキン工業株式会社 ドライエッチングガスおよびドライエッチング方法
JP4761502B2 (ja) 2004-10-07 2011-08-31 株式会社アルバック 層間絶縁膜のドライエッチング方法
US20070047699A1 (en) 2005-08-29 2007-03-01 Nortel Networks Limited Separation of session and session control
TWI437633B (zh) * 2006-05-24 2014-05-11 愛發科股份有限公司 Dry etching method for interlayer insulating film
JP2009123866A (ja) 2007-11-14 2009-06-04 Nec Electronics Corp 半導体装置の製造方法、および被エッチング膜の加工方法
JP5180121B2 (ja) * 2009-02-20 2013-04-10 東京エレクトロン株式会社 基板処理方法
JP6327295B2 (ja) * 2015-08-12 2018-05-23 セントラル硝子株式会社 ドライエッチング方法
JP6604833B2 (ja) 2015-12-03 2019-11-13 東京エレクトロン株式会社 プラズマエッチング方法
EP3506335A4 (en) * 2016-08-25 2020-04-08 Zeon Corporation PLASMA ETCHING PROCESS
US10607850B2 (en) * 2016-12-30 2020-03-31 American Air Liquide, Inc. Iodine-containing compounds for etching semiconductor structures
KR102303686B1 (ko) 2017-02-28 2021-09-17 샌트랄 글래스 컴퍼니 리미티드 드라이 에칭제, 드라이 에칭 방법 및 반도체 장치의 제조방법
US20180286707A1 (en) * 2017-03-30 2018-10-04 Lam Research Corporation Gas additives for sidewall passivation during high aspect ratio cryogenic etch

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