JPWO2020115595A5 - - Google Patents

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Publication number
JPWO2020115595A5
JPWO2020115595A5 JP2020559046A JP2020559046A JPWO2020115595A5 JP WO2020115595 A5 JPWO2020115595 A5 JP WO2020115595A5 JP 2020559046 A JP2020559046 A JP 2020559046A JP 2020559046 A JP2020559046 A JP 2020559046A JP WO2020115595 A5 JPWO2020115595 A5 JP WO2020115595A5
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Japan
Prior art keywords
oxide layer
insulating film
film
oxide
semiconductor device
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JP2020559046A
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English (en)
Japanese (ja)
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JPWO2020115595A1 (ja
JP7391875B2 (ja
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Priority claimed from PCT/IB2019/060011 external-priority patent/WO2020115595A1/ja
Publication of JPWO2020115595A1 publication Critical patent/JPWO2020115595A1/ja
Publication of JPWO2020115595A5 publication Critical patent/JPWO2020115595A5/ja
Application granted granted Critical
Publication of JP7391875B2 publication Critical patent/JP7391875B2/ja
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JP2020559046A 2018-12-07 2019-11-21 半導体装置 Active JP7391875B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2018229973 2018-12-07
JP2018229973 2018-12-07
PCT/IB2019/060011 WO2020115595A1 (ja) 2018-12-07 2019-11-21 半導体装置、および半導体装置の作製方法

Publications (3)

Publication Number Publication Date
JPWO2020115595A1 JPWO2020115595A1 (ja) 2021-12-23
JPWO2020115595A5 true JPWO2020115595A5 (https=) 2022-11-25
JP7391875B2 JP7391875B2 (ja) 2023-12-05

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ID=70973580

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2020559046A Active JP7391875B2 (ja) 2018-12-07 2019-11-21 半導体装置

Country Status (3)

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US (1) US12278291B2 (https=)
JP (1) JP7391875B2 (https=)
WO (1) WO2020115595A1 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12477837B2 (en) * 2019-10-11 2025-11-18 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
TW202431429A (zh) * 2022-10-14 2024-08-01 日商半導體能源研究所股份有限公司 半導體裝置及記憶體裝置
WO2024095108A1 (ja) * 2022-11-03 2024-05-10 株式会社半導体エネルギー研究所 半導体装置、及び記憶装置
WO2025046436A1 (ja) * 2023-08-31 2025-03-06 株式会社半導体エネルギー研究所 半導体装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9373711B2 (en) 2013-02-27 2016-06-21 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP6126509B2 (ja) * 2013-10-04 2017-05-10 株式会社半導体エネルギー研究所 半導体装置
TW201624708A (zh) 2014-11-21 2016-07-01 半導體能源研究所股份有限公司 半導體裝置及記憶體裝置
JP6711642B2 (ja) 2015-02-25 2020-06-17 株式会社半導体エネルギー研究所 半導体装置
JP6705663B2 (ja) 2015-03-06 2020-06-03 株式会社半導体エネルギー研究所 半導体装置およびその作製方法
KR102320483B1 (ko) * 2016-04-08 2021-11-02 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제작 방법
KR102330605B1 (ko) * 2016-06-22 2021-11-24 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
KR20180048327A (ko) * 2016-11-01 2018-05-10 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치, 및 반도체 장치의 제작 방법
KR20180055701A (ko) * 2016-11-17 2018-05-25 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 반도체 장치의 제작 방법
KR20180066848A (ko) * 2016-12-09 2018-06-19 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치, 및 반도체 장치의 제작 방법

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