JPWO2020089762A5 - - Google Patents

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Publication number
JPWO2020089762A5
JPWO2020089762A5 JP2020554607A JP2020554607A JPWO2020089762A5 JP WO2020089762 A5 JPWO2020089762 A5 JP WO2020089762A5 JP 2020554607 A JP2020554607 A JP 2020554607A JP 2020554607 A JP2020554607 A JP 2020554607A JP WO2020089762 A5 JPWO2020089762 A5 JP WO2020089762A5
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JP
Japan
Prior art keywords
region
layer
insulating layer
insulating
semiconductor device
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Application number
JP2020554607A
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English (en)
Japanese (ja)
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JPWO2020089762A1 (https=
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Application filed filed Critical
Priority claimed from PCT/IB2019/059207 external-priority patent/WO2020089762A1/ja
Publication of JPWO2020089762A1 publication Critical patent/JPWO2020089762A1/ja
Publication of JPWO2020089762A5 publication Critical patent/JPWO2020089762A5/ja
Priority to JP2024106823A priority Critical patent/JP2024153637A/ja
Withdrawn legal-status Critical Current

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JP2020554607A 2018-11-02 2019-10-28 Withdrawn JPWO2020089762A1 (https=)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2024106823A JP2024153637A (ja) 2018-11-02 2024-07-02 半導体装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2018207250 2018-11-02
PCT/IB2019/059207 WO2020089762A1 (ja) 2018-11-02 2019-10-28 半導体装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2024106823A Division JP2024153637A (ja) 2018-11-02 2024-07-02 半導体装置

Publications (2)

Publication Number Publication Date
JPWO2020089762A1 JPWO2020089762A1 (https=) 2020-05-07
JPWO2020089762A5 true JPWO2020089762A5 (https=) 2022-10-31

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ID=70463997

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2020554607A Withdrawn JPWO2020089762A1 (https=) 2018-11-02 2019-10-28
JP2024106823A Pending JP2024153637A (ja) 2018-11-02 2024-07-02 半導体装置

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2024106823A Pending JP2024153637A (ja) 2018-11-02 2024-07-02 半導体装置

Country Status (3)

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US (1) US12100747B2 (https=)
JP (2) JPWO2020089762A1 (https=)
WO (1) WO2020089762A1 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102764319B1 (ko) * 2020-09-02 2025-02-07 삼성전자주식회사 반도체 소자 및 이를 포함하는 반도체 장치
CN115769293A (zh) * 2021-06-25 2023-03-07 京东方科技集团股份有限公司 驱动基板、发光装置及其制备方法、拼接显示装置
KR20230097544A (ko) 2021-12-24 2023-07-03 엘지디스플레이 주식회사 표시 장치

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7019457B2 (en) 2000-08-03 2006-03-28 Semiconductor Energy Laboratory Co., Ltd. Light emitting device having both electrodes formed on the insulating layer
US7339187B2 (en) 2002-05-21 2008-03-04 State Of Oregon Acting By And Through The Oregon State Board Of Higher Education On Behalf Of Oregon State University Transistor structures
US20040229051A1 (en) 2003-05-15 2004-11-18 General Electric Company Multilayer coating package on flexible substrates for electro-optical devices
KR101221951B1 (ko) 2005-12-28 2013-01-15 엘지디스플레이 주식회사 액정표시장치용 어레이 기판 및 그 제조방법
WO2011132591A1 (en) 2010-04-23 2011-10-27 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
JP2012015436A (ja) 2010-07-05 2012-01-19 Sony Corp 薄膜トランジスタおよび表示装置
JP5668917B2 (ja) 2010-11-05 2015-02-12 ソニー株式会社 薄膜トランジスタおよびその製造方法
US8569754B2 (en) 2010-11-05 2013-10-29 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
JP6104522B2 (ja) 2011-06-10 2017-03-29 株式会社半導体エネルギー研究所 半導体装置
US8772130B2 (en) 2011-08-23 2014-07-08 Semiconductor Energy Laboratory Co., Ltd. Manufacturing method of SOI substrate
US8748240B2 (en) 2011-12-22 2014-06-10 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
US8956912B2 (en) 2012-01-26 2015-02-17 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
US8916424B2 (en) 2012-02-07 2014-12-23 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
JP5946318B2 (ja) * 2012-05-02 2016-07-06 株式会社半導体エネルギー研究所 半導体装置
CN107591316B (zh) 2012-05-31 2021-06-08 株式会社半导体能源研究所 半导体装置
JP6112886B2 (ja) * 2013-02-01 2017-04-12 三菱電機株式会社 薄膜トランジスタアレイ基板およびその製造方法
JP6345023B2 (ja) * 2013-08-07 2018-06-20 株式会社半導体エネルギー研究所 半導体装置およびその作製方法
US9443876B2 (en) 2014-02-05 2016-09-13 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, display device including the semiconductor device, display module including the display device, and electronic device including the semiconductor device, the display device, and the display module
US10361290B2 (en) 2014-03-14 2019-07-23 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device comprising adding oxygen to buffer film and insulating film
CN106409919A (zh) * 2015-07-30 2017-02-15 株式会社半导体能源研究所 半导体装置以及包括该半导体装置的显示装置
JPWO2017085591A1 (ja) * 2015-11-20 2018-09-06 株式会社半導体エネルギー研究所 半導体装置、該半導体装置を有する表示装置、及び該半導体装置を有する電子機器
US9954058B1 (en) * 2017-06-12 2018-04-24 International Business Machines Corporation Self-aligned air gap spacer for nanosheet CMOS devices

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