JPS6461953A - Mos transistor - Google Patents

Mos transistor

Info

Publication number
JPS6461953A
JPS6461953A JP21967687A JP21967687A JPS6461953A JP S6461953 A JPS6461953 A JP S6461953A JP 21967687 A JP21967687 A JP 21967687A JP 21967687 A JP21967687 A JP 21967687A JP S6461953 A JPS6461953 A JP S6461953A
Authority
JP
Japan
Prior art keywords
gate
drain
width
wider
junction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP21967687A
Other languages
Japanese (ja)
Inventor
Toshihiko Kawaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Victor Company of Japan Ltd
Original Assignee
Victor Company of Japan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Victor Company of Japan Ltd filed Critical Victor Company of Japan Ltd
Priority to JP21967687A priority Critical patent/JPS6461953A/en
Publication of JPS6461953A publication Critical patent/JPS6461953A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To form a gate without providing an impurity diffusion layer of low concentration and prevent hot carriers from being produced in a depletion layer of a drain junction, by forming the gate such that a gate length is uniform over the whole of the gate and a gate width is wider on the drain side of the gate than on the source side. CONSTITUTION:A gate 1 is formed such that its length l1 is uniform over the whole of the gate 1 and a gate width l2 on the drain 2 side is wider than a gate width l3 on the source 3 side. Hereby, density of an electric field in the vicinity of the junction of the drain 2 is reduced. This is because a junction area on the drain 2 side is increased by making the width of the gate 1 wider on the drain 2 side and hence extension of the depletion layer on the drain 2 side is reduced.
JP21967687A 1987-09-02 1987-09-02 Mos transistor Pending JPS6461953A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21967687A JPS6461953A (en) 1987-09-02 1987-09-02 Mos transistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21967687A JPS6461953A (en) 1987-09-02 1987-09-02 Mos transistor

Publications (1)

Publication Number Publication Date
JPS6461953A true JPS6461953A (en) 1989-03-08

Family

ID=16739229

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21967687A Pending JPS6461953A (en) 1987-09-02 1987-09-02 Mos transistor

Country Status (1)

Country Link
JP (1) JPS6461953A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5404038A (en) * 1991-05-10 1995-04-04 Mitsubishi Denki Kabushiki Kaisha Semiconductor device and manufacturing method thereof
US6818915B1 (en) 1998-03-23 2004-11-16 Matsushita Electric Industrial Co., Ltd. Field-emission electron source

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5404038A (en) * 1991-05-10 1995-04-04 Mitsubishi Denki Kabushiki Kaisha Semiconductor device and manufacturing method thereof
US6818915B1 (en) 1998-03-23 2004-11-16 Matsushita Electric Industrial Co., Ltd. Field-emission electron source

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