JPS6428924A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS6428924A
JPS6428924A JP18343087A JP18343087A JPS6428924A JP S6428924 A JPS6428924 A JP S6428924A JP 18343087 A JP18343087 A JP 18343087A JP 18343087 A JP18343087 A JP 18343087A JP S6428924 A JPS6428924 A JP S6428924A
Authority
JP
Japan
Prior art keywords
spacer
film
etching
sinx
metal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18343087A
Other languages
Japanese (ja)
Inventor
Noriaki Kurita
Hiroaki Okuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP18343087A priority Critical patent/JPS6428924A/en
Publication of JPS6428924A publication Critical patent/JPS6428924A/en
Pending legal-status Critical Current

Links

Landscapes

  • Weting (AREA)
  • Junction Field-Effect Transistors (AREA)

Abstract

PURPOSE:To enhance a production yield of a metal pattern by a method wherein an insulating film spacer is formed by continuously changing an etching rate of this spacer to be large on the side of a semiconductor substrate and to be small on the side of the surface in such a way that a side-etching amount during an etching operation of the insulating film spacer is smaller than a film thickness of the spacer. CONSTITUTION:A spacer film 11 composed of SiNx:H is formed on a semiinsulating GaAs substrate 101 by a plasma CVD method. During this process, a parameter of one out of a ratio of a gas flow rate, a pressure inside a chamber and the high-frequency electric power to be impressed is changed continuously among conditions to form the SiNx:H spacer film; an etching rate of the spacer film is reduced continuously from the side of the substrate to the side of the surface. In succession, a photoresist film 12 is applied to the spacer film 11; a development operation is executed; an opening 22 is made in the photoresist film; the SiNx:H spacer film 11 at this opening 22 is etched by using an NH4F/HF solution; a side etching part 21 is formed. After that, a metal layer 13, e.g. Al, is evaporated; the metal is removed by a lift-off method; a metal pattern 23 is formed.
JP18343087A 1987-07-24 1987-07-24 Manufacture of semiconductor device Pending JPS6428924A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18343087A JPS6428924A (en) 1987-07-24 1987-07-24 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18343087A JPS6428924A (en) 1987-07-24 1987-07-24 Manufacture of semiconductor device

Publications (1)

Publication Number Publication Date
JPS6428924A true JPS6428924A (en) 1989-01-31

Family

ID=16135639

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18343087A Pending JPS6428924A (en) 1987-07-24 1987-07-24 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS6428924A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8180773B2 (en) 2009-05-27 2012-05-15 International Business Machines Corporation Detecting duplicate documents using classification

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8180773B2 (en) 2009-05-27 2012-05-15 International Business Machines Corporation Detecting duplicate documents using classification

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