JPS641649Y2 - - Google Patents
Info
- Publication number
- JPS641649Y2 JPS641649Y2 JP1563384U JP1563384U JPS641649Y2 JP S641649 Y2 JPS641649 Y2 JP S641649Y2 JP 1563384 U JP1563384 U JP 1563384U JP 1563384 U JP1563384 U JP 1563384U JP S641649 Y2 JPS641649 Y2 JP S641649Y2
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- current
- under test
- amplifier
- device under
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 25
- 238000005259 measurement Methods 0.000 description 18
- 239000004065 semiconductor Substances 0.000 description 9
- 239000003990 capacitor Substances 0.000 description 7
- 238000001514 detection method Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000002401 inhibitory effect Effects 0.000 description 2
- 239000004020 conductor Substances 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1563384U JPS60127572U (ja) | 1984-02-06 | 1984-02-06 | 電圧印加電流測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1563384U JPS60127572U (ja) | 1984-02-06 | 1984-02-06 | 電圧印加電流測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60127572U JPS60127572U (ja) | 1985-08-27 |
| JPS641649Y2 true JPS641649Y2 (enEXAMPLES) | 1989-01-13 |
Family
ID=30501651
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1563384U Granted JPS60127572U (ja) | 1984-02-06 | 1984-02-06 | 電圧印加電流測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60127572U (enEXAMPLES) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6914425B2 (en) * | 2003-04-29 | 2005-07-05 | Teradyne, Inc. | Measurement circuit with improved accuracy |
| US7403030B2 (en) * | 2004-12-17 | 2008-07-22 | Teradyne, Inc. | Using parametric measurement units as a source of power for a device under test |
| US7271610B2 (en) * | 2004-12-17 | 2007-09-18 | Teradyne, Inc. | Using a parametric measurement unit to sense a voltage at a device under test |
| JP4753897B2 (ja) * | 2007-02-27 | 2011-08-24 | 株式会社リコー | 半導体装置の測定方法 |
-
1984
- 1984-02-06 JP JP1563384U patent/JPS60127572U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60127572U (ja) | 1985-08-27 |
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