JPS638131Y2 - - Google Patents

Info

Publication number
JPS638131Y2
JPS638131Y2 JP1983034961U JP3496183U JPS638131Y2 JP S638131 Y2 JPS638131 Y2 JP S638131Y2 JP 1983034961 U JP1983034961 U JP 1983034961U JP 3496183 U JP3496183 U JP 3496183U JP S638131 Y2 JPS638131 Y2 JP S638131Y2
Authority
JP
Japan
Prior art keywords
marking
chip
scratch
ring insert
pad
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1983034961U
Other languages
English (en)
Japanese (ja)
Other versions
JPS59140442U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3496183U priority Critical patent/JPS59140442U/ja
Publication of JPS59140442U publication Critical patent/JPS59140442U/ja
Application granted granted Critical
Publication of JPS638131Y2 publication Critical patent/JPS638131Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP3496183U 1983-03-11 1983-03-11 半導体素子のマ−キング装置 Granted JPS59140442U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3496183U JPS59140442U (ja) 1983-03-11 1983-03-11 半導体素子のマ−キング装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3496183U JPS59140442U (ja) 1983-03-11 1983-03-11 半導体素子のマ−キング装置

Publications (2)

Publication Number Publication Date
JPS59140442U JPS59140442U (ja) 1984-09-19
JPS638131Y2 true JPS638131Y2 (h) 1988-03-10

Family

ID=30165675

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3496183U Granted JPS59140442U (ja) 1983-03-11 1983-03-11 半導体素子のマ−キング装置

Country Status (1)

Country Link
JP (1) JPS59140442U (h)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55122351U (h) * 1979-02-20 1980-08-30
JPS57170551U (h) * 1981-04-22 1982-10-27

Also Published As

Publication number Publication date
JPS59140442U (ja) 1984-09-19

Similar Documents

Publication Publication Date Title
CN100580884C (zh) 半导体衬底和半导体器件制造方法
JPH07115113A (ja) 半導体ウエハの試験装置および試験方法
JPH10116866A (ja) 半導体装置及び、この半導体装置とプローブカードとの位置決め方法
US7112983B2 (en) Apparatus and method for single die backside probing of semiconductor devices
JPH07193106A (ja) バーンインテスト用チップのホールディング装置及びその製造方法
JPH04234141A (ja) Ｔａｂフレームおよびその基板への接続方法
JPS638131Y2 (h)
US6972486B2 (en) Low profile carrier for non-wafer form device testing
JP2933331B2 (ja) 半導体装置の検査装置
JP2002373950A (ja) 気密封止ｉｃパッケージの製造方法
JPH079380Y2 (ja) 半導体ウェハー検査装置
JPS62136844A (ja) プロ−ビング装置
JPS64270Y2 (h)
JPH0729783A (ja) ２枚の半導体ウエハーを重ね合わせる方法
JP2002083784A (ja) 半導体装置の製造方法
JPS5814608Y2 (ja) ウエハ−検査装置
JPH04352314A (ja) 半導体ウェハの識別方法
WO2022176143A1 (ja) プローブカード用アライメントチップ、プローブカード及びプローブカード補修方法
JPH034031Y2 (h)
JPS6115340A (ja) ウエハプロ−バ
KR20030070552A (ko) 부품들의 어레이를 처리하기 위한 방법 및 장치
JPH0719168Y2 (ja) フォトダイオ−ドアレイの取付装置
JPS60176248A (ja) プロ−ブカ−ド
JPS6254433A (ja) 半導体基板の検査方法
JPS6115339A (ja) プロ−ブカ−ド