JPS6359258B2 - - Google Patents

Info

Publication number
JPS6359258B2
JPS6359258B2 JP54126574A JP12657479A JPS6359258B2 JP S6359258 B2 JPS6359258 B2 JP S6359258B2 JP 54126574 A JP54126574 A JP 54126574A JP 12657479 A JP12657479 A JP 12657479A JP S6359258 B2 JPS6359258 B2 JP S6359258B2
Authority
JP
Japan
Prior art keywords
conductivity type
semiconductor
type region
opposite conductivity
insulating film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54126574A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5650527A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP12657479A priority Critical patent/JPS5650527A/ja
Publication of JPS5650527A publication Critical patent/JPS5650527A/ja
Publication of JPS6359258B2 publication Critical patent/JPS6359258B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76Making of isolation regions between components
    • H01L21/762Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
    • H01L21/76202Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using a local oxidation of silicon, e.g. LOCOS, SWAMI, SILO
    • H01L21/76213Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using a local oxidation of silicon, e.g. LOCOS, SWAMI, SILO introducing electrical inactive or active impurities in the local oxidation region, e.g. to alter LOCOS oxide growth characteristics or for additional isolation purpose
    • H01L21/76216Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using a local oxidation of silicon, e.g. LOCOS, SWAMI, SILO introducing electrical inactive or active impurities in the local oxidation region, e.g. to alter LOCOS oxide growth characteristics or for additional isolation purpose introducing electrical active impurities in the local oxidation region for the sole purpose of creating channel stoppers

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Bipolar Integrated Circuits (AREA)
  • Local Oxidation Of Silicon (AREA)
  • Element Separation (AREA)
JP12657479A 1979-09-29 1979-09-29 Semiconductor integrated circuit device Granted JPS5650527A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12657479A JPS5650527A (en) 1979-09-29 1979-09-29 Semiconductor integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12657479A JPS5650527A (en) 1979-09-29 1979-09-29 Semiconductor integrated circuit device

Publications (2)

Publication Number Publication Date
JPS5650527A JPS5650527A (en) 1981-05-07
JPS6359258B2 true JPS6359258B2 (ko) 1988-11-18

Family

ID=14938527

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12657479A Granted JPS5650527A (en) 1979-09-29 1979-09-29 Semiconductor integrated circuit device

Country Status (1)

Country Link
JP (1) JPS5650527A (ko)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5276346A (en) * 1983-12-26 1994-01-04 Hitachi, Ltd. Semiconductor integrated circuit device having protective/output elements and internal circuits
US5610089A (en) * 1983-12-26 1997-03-11 Hitachi, Ltd. Method of fabrication of semiconductor integrated circuit device
JPS61195721A (ja) * 1985-02-26 1986-08-30 Nisshinbo Ind Inc Ncシ−ト材加工機
US5371395A (en) * 1992-05-06 1994-12-06 Xerox Corporation High voltage input pad protection circuitry
US5545910A (en) * 1994-04-13 1996-08-13 Winbond Electronics Corp. ESD proctection device

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS511394A (ko) * 1974-03-19 1976-01-08 Norsk Hydro As
JPS5324157A (en) * 1976-08-18 1978-03-06 Sanyo Electric Co Ltd Control circuit of air conditioner
JPS5365081A (en) * 1976-11-22 1978-06-10 Nec Corp Field effect semiconductor device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS511394A (ko) * 1974-03-19 1976-01-08 Norsk Hydro As
JPS5324157A (en) * 1976-08-18 1978-03-06 Sanyo Electric Co Ltd Control circuit of air conditioner
JPS5365081A (en) * 1976-11-22 1978-06-10 Nec Corp Field effect semiconductor device

Also Published As

Publication number Publication date
JPS5650527A (en) 1981-05-07

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