JPS6342408B2 - - Google Patents

Info

Publication number
JPS6342408B2
JPS6342408B2 JP57008431A JP843182A JPS6342408B2 JP S6342408 B2 JPS6342408 B2 JP S6342408B2 JP 57008431 A JP57008431 A JP 57008431A JP 843182 A JP843182 A JP 843182A JP S6342408 B2 JPS6342408 B2 JP S6342408B2
Authority
JP
Japan
Prior art keywords
film
silica film
heat treatment
aluminum
thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57008431A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58125834A (ja
Inventor
Kenji Okamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP57008431A priority Critical patent/JPS58125834A/ja
Publication of JPS58125834A publication Critical patent/JPS58125834A/ja
Publication of JPS6342408B2 publication Critical patent/JPS6342408B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02107Forming insulating materials on a substrate

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Formation Of Insulating Films (AREA)
JP57008431A 1982-01-22 1982-01-22 半導体装置の製造方法 Granted JPS58125834A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57008431A JPS58125834A (ja) 1982-01-22 1982-01-22 半導体装置の製造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57008431A JPS58125834A (ja) 1982-01-22 1982-01-22 半導体装置の製造方法

Publications (2)

Publication Number Publication Date
JPS58125834A JPS58125834A (ja) 1983-07-27
JPS6342408B2 true JPS6342408B2 (enrdf_load_stackoverflow) 1988-08-23

Family

ID=11692930

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57008431A Granted JPS58125834A (ja) 1982-01-22 1982-01-22 半導体装置の製造方法

Country Status (1)

Country Link
JP (1) JPS58125834A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6230335A (ja) * 1985-07-31 1987-02-09 Fujitsu Ltd 半導体装置の製造方法

Also Published As

Publication number Publication date
JPS58125834A (ja) 1983-07-27

Similar Documents

Publication Publication Date Title
US4305974A (en) Method of manufacturing a semiconductor device
US4732658A (en) Planarization of silicon semiconductor devices
JPS59119867A (ja) 半導体装置
JPS6335107B2 (enrdf_load_stackoverflow)
US4420503A (en) Low temperature elevated pressure glass flow/re-flow process
US4030952A (en) Method of MOS circuit fabrication
KR100220933B1 (ko) 반도체 소자의 금속배선 형성방법
JPS6342408B2 (enrdf_load_stackoverflow)
CN110473775A (zh) 改善薄膜剥离的方法
US3847690A (en) Method of protecting against electrochemical effects during metal etching
JPH0456453B2 (enrdf_load_stackoverflow)
JPS5932895B2 (ja) 半導体装置およびその製造方法
JP3172307B2 (ja) 半導体装置の製造方法
JPH0822967A (ja) 半導体装置の製造方法
JPH0468770B2 (enrdf_load_stackoverflow)
JPS59150421A (ja) 半導体装置の製造方法
JPH0427703B2 (enrdf_load_stackoverflow)
JPS58116751A (ja) 半導体装置の製造方法
JPS63156340A (ja) 半導体装置の製造方法
JPS584930A (ja) ホトレジスト剥離方法
JPH0669039B2 (ja) 半導体装置の製造方法
JPS59168653A (ja) 半導体装置の製造方法
JPS61258434A (ja) 半導体装置の製造方法
JPS58125848A (ja) 半導体装置の製造方法
JPH06291253A (ja) 半導体素子の電荷蓄積部の誘電体絶縁膜の形成方法