JPS6317225B2 - - Google Patents
Info
- Publication number
- JPS6317225B2 JPS6317225B2 JP55140465A JP14046580A JPS6317225B2 JP S6317225 B2 JPS6317225 B2 JP S6317225B2 JP 55140465 A JP55140465 A JP 55140465A JP 14046580 A JP14046580 A JP 14046580A JP S6317225 B2 JPS6317225 B2 JP S6317225B2
- Authority
- JP
- Japan
- Prior art keywords
- lead frame
- cartridge
- electronic component
- electronic components
- leads
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 20
- 238000007689 inspection Methods 0.000 description 6
- 238000005259 measurement Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55140465A JPS5764947A (en) | 1980-10-09 | 1980-10-09 | Inspecting apparatus for electric characteristics of electronic parts |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55140465A JPS5764947A (en) | 1980-10-09 | 1980-10-09 | Inspecting apparatus for electric characteristics of electronic parts |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5764947A JPS5764947A (en) | 1982-04-20 |
JPS6317225B2 true JPS6317225B2 (de) | 1988-04-13 |
Family
ID=15269225
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55140465A Granted JPS5764947A (en) | 1980-10-09 | 1980-10-09 | Inspecting apparatus for electric characteristics of electronic parts |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5764947A (de) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5944840A (ja) * | 1982-09-07 | 1984-03-13 | Toshiba Corp | フラットパッケ−ジの測定装置 |
JPS59181631A (ja) * | 1983-03-31 | 1984-10-16 | Toshiba Corp | 半導体装置の自動ハンドラ− |
JPH06281698A (ja) * | 1993-11-26 | 1994-10-07 | Toshiba Corp | Icオートハンドラ方法 |
-
1980
- 1980-10-09 JP JP55140465A patent/JPS5764947A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5764947A (en) | 1982-04-20 |
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