JPS5764947A - Inspecting apparatus for electric characteristics of electronic parts - Google Patents

Inspecting apparatus for electric characteristics of electronic parts

Info

Publication number
JPS5764947A
JPS5764947A JP55140465A JP14046580A JPS5764947A JP S5764947 A JPS5764947 A JP S5764947A JP 55140465 A JP55140465 A JP 55140465A JP 14046580 A JP14046580 A JP 14046580A JP S5764947 A JPS5764947 A JP S5764947A
Authority
JP
Japan
Prior art keywords
cartridge
lead
socket
lead frame
electronic parts
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55140465A
Other languages
Japanese (ja)
Other versions
JPS6317225B2 (en
Inventor
Hiroyuki Nakajima
Mutsuyo Kanetani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP55140465A priority Critical patent/JPS5764947A/en
Publication of JPS5764947A publication Critical patent/JPS5764947A/en
Publication of JPS6317225B2 publication Critical patent/JPS6317225B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To automatically inspect an electronic part by moving a lead frame downwardly bending it on an inspecting socket and engaging the lead of the part to the socket. CONSTITUTION:An electronic part 3 is fed from a cartridge 10 to a chute 13, is intermittently moved, and is stopped directly above an inspecting socket 15 while bending along a guide 14. A rod 23 presses the package 4 of the part 3 to insert the lead 2 into the socket 15 for an inspection. After the inspection, the part 3 is again advanced on the flat guide 13, and is contained in a cartridge 10. When the electronic parts 3 connected to the lead frame are fully contained in the cartridge, the full cartridge is replaced with a vacant cartridge 10. At the measuring unit the lead frame 1 is bent to project a single electronic part from the other to reduce the deformation of the lead 2 due to the later pressing down 16.
JP55140465A 1980-10-09 1980-10-09 Inspecting apparatus for electric characteristics of electronic parts Granted JPS5764947A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55140465A JPS5764947A (en) 1980-10-09 1980-10-09 Inspecting apparatus for electric characteristics of electronic parts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55140465A JPS5764947A (en) 1980-10-09 1980-10-09 Inspecting apparatus for electric characteristics of electronic parts

Publications (2)

Publication Number Publication Date
JPS5764947A true JPS5764947A (en) 1982-04-20
JPS6317225B2 JPS6317225B2 (en) 1988-04-13

Family

ID=15269225

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55140465A Granted JPS5764947A (en) 1980-10-09 1980-10-09 Inspecting apparatus for electric characteristics of electronic parts

Country Status (1)

Country Link
JP (1) JPS5764947A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5944840A (en) * 1982-09-07 1984-03-13 Toshiba Corp Measuring apparatus of flat package
JPS59181631A (en) * 1983-03-31 1984-10-16 Toshiba Corp Automatic handler for semiconductor device
JPH06281698A (en) * 1993-11-26 1994-10-07 Toshiba Corp Ic automatic handling method

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5944840A (en) * 1982-09-07 1984-03-13 Toshiba Corp Measuring apparatus of flat package
JPS59181631A (en) * 1983-03-31 1984-10-16 Toshiba Corp Automatic handler for semiconductor device
JPH0514426B2 (en) * 1983-03-31 1993-02-25 Tokyo Shibaura Electric Co
JPH06281698A (en) * 1993-11-26 1994-10-07 Toshiba Corp Ic automatic handling method

Also Published As

Publication number Publication date
JPS6317225B2 (en) 1988-04-13

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