JPS5764946A - Inspecting method for electric characteristics of electronic parts and device used therefor as well as electronic parts - Google Patents
Inspecting method for electric characteristics of electronic parts and device used therefor as well as electronic partsInfo
- Publication number
- JPS5764946A JPS5764946A JP55140464A JP14046480A JPS5764946A JP S5764946 A JPS5764946 A JP S5764946A JP 55140464 A JP55140464 A JP 55140464A JP 14046480 A JP14046480 A JP 14046480A JP S5764946 A JPS5764946 A JP S5764946A
- Authority
- JP
- Japan
- Prior art keywords
- electronic parts
- cartridge
- inspection
- fed
- projection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE:To continuously inspect electronic parts connected via leads to a lead frame having projection for indicating an inspecting step and an insepcting classfication in advance by automatically testing the part in this state and then cutting the projection. CONSTITUTION:An electronic part 3 is fed from a cartridge 19 to a chute 22, is intermittently moved, and is stopped directly above an inspecting socket 24. A rod 37 is operated to press the package 4 of the part 3 to insert the leads 2 into a socket 24 for an inspection. The steps and the contents of the inspection are fed to a controller, and the prescrived operation is instructed with the information to a removing unit 16. After the inspection, the part 3 is fed to the removing unit 16, the prescribed projection is cut by a punch 35, the part is then advanced on the chute 13 and is contained in a cartridge 10, and when the cartridge is fully contained with the parts, it is exchanged. At the measuring unit the lead frame 1 is bent to project a single electronic part from the other to reduce the deformation of the frame due to the elevational movements performed thereafter caused by the later pressing down 25.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55140464A JPS5764946A (en) | 1980-10-09 | 1980-10-09 | Inspecting method for electric characteristics of electronic parts and device used therefor as well as electronic parts |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55140464A JPS5764946A (en) | 1980-10-09 | 1980-10-09 | Inspecting method for electric characteristics of electronic parts and device used therefor as well as electronic parts |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5764946A true JPS5764946A (en) | 1982-04-20 |
JPS6255687B2 JPS6255687B2 (en) | 1987-11-20 |
Family
ID=15269201
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55140464A Granted JPS5764946A (en) | 1980-10-09 | 1980-10-09 | Inspecting method for electric characteristics of electronic parts and device used therefor as well as electronic parts |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5764946A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05152388A (en) * | 1991-11-28 | 1993-06-18 | Sharp Corp | Test device of semiconductor integrated circuit device |
-
1980
- 1980-10-09 JP JP55140464A patent/JPS5764946A/en active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05152388A (en) * | 1991-11-28 | 1993-06-18 | Sharp Corp | Test device of semiconductor integrated circuit device |
Also Published As
Publication number | Publication date |
---|---|
JPS6255687B2 (en) | 1987-11-20 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
YU41862B (en) | Apparatus for measuring the concentrations of elements in a material, by the capture gamma method | |
JPS5778075A (en) | Photoreceptor holding device for picture forming equipment | |
DE2966806D1 (en) | Method and apparatus for detecting tool breakage, for example in a numerically-controlled machine tool | |
BR8106309A (en) | AUTOMATIC BANKING MACHINE (MBA) PROCESS FOR REMOVABLE LOADING MACHINE MBA AND PROCESS FOR REMOVING SEVERAL FUNCTION CONTAINERS SEALED AND FRAUD AND LOADED INDICATORS IN AN MBA | |
JPS5764946A (en) | Inspecting method for electric characteristics of electronic parts and device used therefor as well as electronic parts | |
EP0375204A3 (en) | Device excise and lead form apparatus | |
JPS5764947A (en) | Inspecting apparatus for electric characteristics of electronic parts | |
JPS5739083A (en) | Method and device for monitoring welding process | |
JPS5563854A (en) | Method of manufacturing semiconductor device | |
JPS5325983A (en) | Method and device for extracting test piece from metal material | |
JPS5441619A (en) | Error check unit for puncher | |
JPS5255069A (en) | Device for automatically detecting initial position of tool used in nc machine | |
JPS5421551A (en) | Electric machine having defectiveness detection means | |
JPS5341907A (en) | System structure resetting method | |
YU104177A (en) | Device for performing a sorting method by a photometric sorting | |
JPS5593072A (en) | Plug tester | |
JPS56148436A (en) | Method and device for detecting defective in multistep type cold-pressing machine | |
JPS5574461A (en) | Testing method for welding portion of electro seamed tube | |
LEMASCON et al. | Influence of environmental conditions during materials processing by felicity ratio measurement | |
JPS5369546A (en) | Method and apparatus for memory unit test | |
JPS6467639A (en) | Information processor inspection system | |
JPH01289581A (en) | Welding device for working tub terminal | |
JPS54155143A (en) | Quality testing method for flash butt weld zone | |
JPS5747539A (en) | Metallic die for inspecting material of press machine | |
JPS52124565A (en) | Clearance filling for bolt and its tool |