JPS6275233A - 光学式板状素材モニタ装置 - Google Patents

光学式板状素材モニタ装置

Info

Publication number
JPS6275233A
JPS6275233A JP61227074A JP22707486A JPS6275233A JP S6275233 A JPS6275233 A JP S6275233A JP 61227074 A JP61227074 A JP 61227074A JP 22707486 A JP22707486 A JP 22707486A JP S6275233 A JPS6275233 A JP S6275233A
Authority
JP
Japan
Prior art keywords
light
concave mirror
shaped
monitoring device
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61227074A
Other languages
English (en)
Japanese (ja)
Inventor
クラウス　ウェバー
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Erwin Sick GmbH Optik Elektronik
Original Assignee
Erwin Sick GmbH Optik Elektronik
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Erwin Sick GmbH Optik Elektronik filed Critical Erwin Sick GmbH Optik Elektronik
Publication of JPS6275233A publication Critical patent/JPS6275233A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems
    • G02B26/12—Scanning systems using multifaceted mirrors
    • G02B26/125—Details of the optical system between the polygonal mirror and the image plane
    • G02B26/126—Details of the optical system between the polygonal mirror and the image plane including curved mirrors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP61227074A 1985-09-24 1986-09-24 光学式板状素材モニタ装置 Pending JPS6275233A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19853534019 DE3534019A1 (de) 1985-09-24 1985-09-24 Optische bahnueberwachungsvorrichtung
DE3534019.3 1985-09-24

Publications (1)

Publication Number Publication Date
JPS6275233A true JPS6275233A (ja) 1987-04-07

Family

ID=6281792

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61227074A Pending JPS6275233A (ja) 1985-09-24 1986-09-24 光学式板状素材モニタ装置

Country Status (5)

Country Link
US (1) US4775238A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPS6275233A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE3534019A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
FR (1) FR2587802B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
GB (1) GB2180929B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004138417A (ja) * 2002-10-16 2004-05-13 Nippon Steel Corp 鋼板の疵検査方法およびその装置
JP2007273456A (ja) * 2006-03-01 2007-10-18 Texmag Gmbh Vertriebs Ges Gmbh 線光発光装置

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DE3709500A1 (de) * 1985-09-24 1988-10-06 Sick Optik Elektronik Erwin Optische bahnueberwachungseinrichtung mit zeilenkameras mit gerichteter beleuchtung
GB2202627A (en) * 1987-03-23 1988-09-28 Sick Optik Elektronik Erwin Optical arrangement in web monitoring device
DE3712513A1 (de) * 1987-04-13 1988-11-03 Roth Electric Gmbh Verfahren und vorrichtung zur erkennung von oberflaechenfehlern
DE3717274A1 (de) * 1987-05-22 1988-12-01 Sick Erwin Gmbh Optische fehlerinspektionsvorrichtung
DE3741195A1 (de) * 1987-07-23 1989-02-02 Gebhard Birkle Verfahren zur qualitaetskontrolle eines flaechigen objektes, insbesondere zur fehlererkennung bei textilen stoffen, und vorrichtung hierzu
DE3728210A1 (de) * 1987-08-24 1989-03-16 Sick Optik Elektronik Erwin Optische abtastvorrichtung fuer transparentes bahnmaterial
DE3729804A1 (de) * 1987-09-05 1989-03-16 Menschner Maschf Johannes Verfahren zur automatischen erkennung von fehlern in bewegten warenbahnen
DE3733791A1 (de) * 1987-10-06 1989-04-27 Herbst Protechna Gmbh Verfahren und vorrichtung zur optischen ueberwachung einer maschenware
DE3734294A1 (de) * 1987-10-09 1989-04-27 Sick Optik Elektronik Erwin Optische oberflaechen-inspektionsvorrichtung
DE3737631C1 (de) * 1987-11-05 1989-03-02 Sick Optik Elektronik Erwin Optische Abstastvorrichtung fuer ebene Oberflaechen
JPH01169343A (ja) * 1987-12-25 1989-07-04 Nippon Sheet Glass Co Ltd ガラス板の切口欠点検出装置
DE3800053A1 (de) * 1988-01-04 1989-07-13 Sick Optik Elektronik Erwin Optische fehlerinspektionsvorrichtung
DE3806385A1 (de) * 1988-02-29 1989-09-07 Feldmuehle Ag Verfahren und vorrichtung zum pruefen von transparenten bahnen
JPH0762654B2 (ja) * 1988-10-25 1995-07-05 松下電器産業株式会社 実装基板検査装置
DE3925614A1 (de) * 1989-08-02 1991-02-07 Sick Optik Elektronik Erwin Optische abtastvorrichtung zur fehlersuche an durchlaufenden materialbahnen
DE3926349A1 (de) * 1989-08-09 1991-02-14 Sick Optik Elektronik Erwin Optische fehlerinspektionsvorrichtung
DE4123916C2 (de) * 1990-07-19 1998-04-09 Reinhard Malz Verfahren und Vorrichtung zum beleuchtungsdynamischen Erkennen und Klassifizieren von Oberflächenmerkmalen und -defekten eines Objektes
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US5448364A (en) * 1993-03-22 1995-09-05 Estek Corporation Particle detection system with reflective line-to-spot collector
JPH07151706A (ja) * 1993-09-03 1995-06-16 Minnesota Mining & Mfg Co <3M> 物品の欠陥検知装置及びその使用方法
AU681225B2 (en) 1993-12-03 1997-08-21 Geobiotics, Inc. Biooxidation of refractory sulfide ores
US5431717A (en) * 1993-12-03 1995-07-11 Geobiotics, Inc. Method for rendering refractory sulfide ores more susceptible to biooxidation
AU694816B2 (en) * 1994-10-25 1998-07-30 Geobiotics, Inc. Method for heap biooxidation of ore
CN1221488A (zh) 1996-05-10 1999-06-30 应用科学模拟公司 亮度优先彩色检测器
US6442301B1 (en) 1997-01-06 2002-08-27 Applied Science Fiction, Inc. Apparatus and method for defect channel nulling
US6380539B1 (en) 1997-01-30 2002-04-30 Applied Science Fiction, Inc. Four color trilinear CCD scanning
US6072898A (en) 1998-01-16 2000-06-06 Beaty; Elwin M. Method and apparatus for three dimensional inspection of electronic components
US6590679B1 (en) 1998-02-04 2003-07-08 Applied Science Fiction, Inc. Multilinear array sensor with an infrared line
US6393160B1 (en) 1998-03-13 2002-05-21 Applied Science Fiction Image defect correction in transform space
GB9819614D0 (en) * 1998-09-09 1998-11-04 Stylios George Method and apparatus for assessment of seam pucker and other surface irregularities
US6437358B1 (en) 1999-02-04 2002-08-20 Applied Science Fiction, Inc. Apparatus and methods for capturing defect data
US6487321B1 (en) 1999-09-16 2002-11-26 Applied Science Fiction Method and system for altering defects in a digital image
WO2001027688A2 (en) 1999-10-08 2001-04-19 Applied Science Fiction, Inc. System and method for correcting defects in digital images through selective fill-in from surrounding areas
AU1077101A (en) 1999-10-08 2001-04-23 Applied Science Fiction, Inc. Method and apparatus for differential illumination image-capturing and defect handling
US6924911B1 (en) 1999-10-12 2005-08-02 Eastman Kodak Company Method and system for multi-sensor signal detection
US6711302B1 (en) 1999-10-20 2004-03-23 Eastman Kodak Company Method and system for altering defects in digital image
US6683995B2 (en) 1999-12-23 2004-01-27 Eastman Kodak Company Method and apparatus for correcting large defects in digital images
US6704458B2 (en) 1999-12-29 2004-03-09 Eastman Kodak Company Method and apparatus for correcting heavily damaged images
US20020051248A1 (en) * 1999-12-29 2002-05-02 Cook Stacy S. Automatic surface deviation detector and method of use
US7164511B2 (en) * 1999-12-29 2007-01-16 Eastman Kodak Company Distinguishing positive and negative films system and method
US6452679B1 (en) 1999-12-29 2002-09-17 Kimberly-Clark Worldwide, Inc. Method and apparatus for controlling the manufacturing quality of a moving web
US6862117B1 (en) 1999-12-30 2005-03-01 Eastman Kodak Company Method and apparatus for reducing the effect of bleed-through on captured images
US6720560B1 (en) 1999-12-30 2004-04-13 Eastman Kodak Company Method and apparatus for scanning images
DE10019486A1 (de) 2000-04-19 2001-10-31 Siemens Ag Anordnung zur Inspektion von Objektoberflächen
AU2001293021A1 (en) * 2000-09-22 2002-04-02 Applied Science Fiction Lens focusing device, system and method for use with multiple light wavelengths
US20020106134A1 (en) * 2000-09-22 2002-08-08 Dundon Thomas A. Multiple-orientation image defect detection and correction
EP1220596A1 (en) 2000-12-29 2002-07-03 Icos Vision Systems N.V. A method and an apparatus for measuring positions of contact elements of an electronic component
US6668231B2 (en) 2001-04-12 2003-12-23 George Stylios Sheet parameter measurement
US6987892B2 (en) * 2001-04-19 2006-01-17 Eastman Kodak Company Method, system and software for correcting image defects
US7023542B2 (en) * 2002-04-03 2006-04-04 3M Innovative Properties Company Imaging method and apparatus
US6934029B1 (en) * 2002-04-22 2005-08-23 Eugene Matzan Dual laser web defect scanner
US6950717B1 (en) 2004-03-19 2005-09-27 Sara Lee Corporation System and method for controlling width and stitch density of a fabric web
KR101332786B1 (ko) * 2005-02-18 2013-11-25 쇼오트 아게 결함 검출 및/또는 분류 방법 및 장치
DE102005031957B4 (de) * 2005-07-08 2007-03-22 Koenig & Bauer Ag Vorrichtung zur Inspektion eines Bedruckstoffes mit uneinheitlich reflektierenden Oberflächen
FR2892191B1 (fr) * 2005-10-17 2008-04-04 Vai Clecim Soc Par Actions Sim Dispositif compact et procede d'inspection d'un produit en defilement, pour la detection automatique de defauts.
US20080218763A1 (en) * 2006-03-21 2008-09-11 Hans Weber Maschinenfabrik Gmbh Apparatus for optically determining the surface contour of flat workpieces in a wide belt abrading machine
DE102011001289B4 (de) 2011-03-15 2013-05-29 Alfavision Gmbh & Co. Kg Vorrichtung zur optischen Erfassung von Prüfobjekten
DE102011082793A1 (de) 2011-09-15 2013-03-21 Carl Zeiss Smt Gmbh Vorrichtungen zur Bestimmung eines Verschmutzungsgrads und/oder zur Schichtdickenbestimmung eines Bandes
DE102012110793B4 (de) * 2012-11-09 2020-09-03 R.A.M. Realtime Application Measurement Gmbh Vorrichtung und Verfahren zur Abbildung eines bahnförmigen Materials
US9849894B2 (en) 2015-01-19 2017-12-26 Tetra Tech, Inc. Protective shroud for enveloping light from a light emitter for mapping of a railway track
US9849895B2 (en) 2015-01-19 2017-12-26 Tetra Tech, Inc. Sensor synchronization apparatus and method
CA2893017C (en) 2015-01-19 2020-03-24 Tetra Tech, Inc. Light emission power control apparatus and method
US10349491B2 (en) 2015-01-19 2019-07-09 Tetra Tech, Inc. Light emission power control apparatus and method
US10362293B2 (en) 2015-02-20 2019-07-23 Tetra Tech, Inc. 3D track assessment system and method
US10807623B2 (en) 2018-06-01 2020-10-20 Tetra Tech, Inc. Apparatus and method for gathering data from sensors oriented at an oblique angle relative to a railway track
US11377130B2 (en) 2018-06-01 2022-07-05 Tetra Tech, Inc. Autonomous track assessment system
US10625760B2 (en) 2018-06-01 2020-04-21 Tetra Tech, Inc. Apparatus and method for calculating wooden crosstie plate cut measurements and rail seat abrasion measurements based on rail head height
US10730538B2 (en) 2018-06-01 2020-08-04 Tetra Tech, Inc. Apparatus and method for calculating plate cut and rail seat abrasion based on measurements only of rail head elevation and crosstie surface elevation
CA3130193A1 (en) 2019-05-16 2020-11-19 Tetra Tech, Inc. Autonomous track assessment system

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US2798966A (en) * 1955-11-23 1957-07-09 Gen Electric Surface inspection equipment
DE1094989B (de) * 1959-12-05 1960-12-15 Kugelfischer G Schaefer & Co Vorrichtung zur Pruefung reflektierender Oberflaechen
US3206606A (en) * 1961-07-20 1965-09-14 Eastman Kodak Co Photosensitive inspection method and apparatus
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DE2904435C3 (de) * 1979-02-06 1981-11-12 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Lochsuchgerät für Materialbahnen
US4223346A (en) * 1979-04-05 1980-09-16 Armco Inc. Automatic defect detecting inspection apparatus
DE2925734C3 (de) * 1979-06-26 1982-06-24 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optisches Fehlersuchgerät für Materialbahnen
DE3006072C2 (de) * 1980-02-19 1984-11-29 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Fehlstellenermittlungsvorrichtung für Materialbahnen
JPS5867093A (ja) * 1981-10-19 1983-04-21 株式会社東芝 印刷回路基板検査方法及びその装置
DE3411934C2 (de) * 1983-04-22 1986-04-24 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Fehlerfeststellungsvorrichtung
DE3472300D1 (en) * 1983-04-22 1988-07-28 Sick Optik Elektronik Erwin Device for the detection of faults

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004138417A (ja) * 2002-10-16 2004-05-13 Nippon Steel Corp 鋼板の疵検査方法およびその装置
JP2007273456A (ja) * 2006-03-01 2007-10-18 Texmag Gmbh Vertriebs Ges Gmbh 線光発光装置

Also Published As

Publication number Publication date
GB2180929A (en) 1987-04-08
US4775238A (en) 1988-10-04
FR2587802B1 (fr) 1990-04-13
DE3534019C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1989-05-03
DE3534019A1 (de) 1987-04-02
FR2587802A1 (fr) 1987-03-27
GB2180929B (en) 1989-09-06
GB8619771D0 (en) 1986-09-24

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