JPS6253768B2 - - Google Patents

Info

Publication number
JPS6253768B2
JPS6253768B2 JP54015315A JP1531579A JPS6253768B2 JP S6253768 B2 JPS6253768 B2 JP S6253768B2 JP 54015315 A JP54015315 A JP 54015315A JP 1531579 A JP1531579 A JP 1531579A JP S6253768 B2 JPS6253768 B2 JP S6253768B2
Authority
JP
Japan
Prior art keywords
light
plate
defects
monochromatic
plate material
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54015315A
Other languages
English (en)
Japanese (ja)
Other versions
JPS55107942A (en
Inventor
Yutaka Abe
Shozo Nomura
Toshinori Inoe
Motoo Igari
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP1531579A priority Critical patent/JPS55107942A/ja
Publication of JPS55107942A publication Critical patent/JPS55107942A/ja
Publication of JPS6253768B2 publication Critical patent/JPS6253768B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP1531579A 1979-02-13 1979-02-13 Inspecting method of plate Granted JPS55107942A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1531579A JPS55107942A (en) 1979-02-13 1979-02-13 Inspecting method of plate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1531579A JPS55107942A (en) 1979-02-13 1979-02-13 Inspecting method of plate

Publications (2)

Publication Number Publication Date
JPS55107942A JPS55107942A (en) 1980-08-19
JPS6253768B2 true JPS6253768B2 (fi) 1987-11-12

Family

ID=11885341

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1531579A Granted JPS55107942A (en) 1979-02-13 1979-02-13 Inspecting method of plate

Country Status (1)

Country Link
JP (1) JPS55107942A (fi)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5780546A (en) * 1980-11-07 1982-05-20 Nippon Kogaku Kk <Nikon> Detecting device for foreign substance
JPS57128834A (en) * 1981-02-04 1982-08-10 Nippon Kogaku Kk <Nikon> Inspecting apparatus of foreign substance
JPS57158545A (en) * 1981-03-25 1982-09-30 Mitsubishi Electric Corp Surface defect inspecting device
US4795260A (en) * 1987-05-15 1989-01-03 Therma-Wave, Inc. Apparatus for locating and testing areas of interest on a workpiece
DE3819900A1 (de) * 1988-06-11 1989-12-14 Daimler Benz Ag Verfahren zur bestimmung der korrosionsstabilitaet von tiefziehfaehigen eisenblechen fuer karosserieteile von kraftfahrzeugen und vorrichtung zur durchfuehrung dieses verfahrens
JPH01221776A (ja) * 1989-01-26 1989-09-05 Ricoh Co Ltd 磁気ブラシ現像装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5071995A (fi) * 1973-10-24 1975-06-14

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5071995A (fi) * 1973-10-24 1975-06-14

Also Published As

Publication number Publication date
JPS55107942A (en) 1980-08-19

Similar Documents

Publication Publication Date Title
FI58838C (fi) Foerfarande och anordning foer detektering av defekter i virke
US3812349A (en) Apparatus for inspecting cigarettes or the like
US4302108A (en) Detection of subsurface defects by reflection interference
US4469442A (en) Detecting irregularities in a coating on a substrate
JP2003501649A (ja) 反射材料のための高スピード傷検出装置及び方法
JPS6223250B2 (fi)
US4522497A (en) Web scanning apparatus
US4330205A (en) Optical apparatus for measuring the size and location of optical in an article
JPS59227285A (ja) 運動しているシガレツト連続体の表面を光学的に走査するための装置
JPS6253768B2 (fi)
US4764017A (en) Method for identifying timber surface properties
US20060065857A1 (en) Device and method for the quantified evaluation of surface characteristics
JP2678411B2 (ja) 海苔の検査方法および装置
JPS5973710A (ja) 透明円板の表面欠陥検査装置
US5157266A (en) Method and device for testing transparent sheets
US4705957A (en) Wire surface monitor
JPH0228815B2 (fi)
JPS5839934A (ja) 表面欠陥検出装置
JPS6239380B2 (fi)
JPH07146245A (ja) 異物検査装置及び異物検査方法
JPH10142162A (ja) 塗布層欠陥検査光選択方法、塗布層欠陥検査方法、塗布層欠陥検査装置
JPH0252241A (ja) 表面欠陥検査装置
JPS59183350A (ja) 表面検査装置
JPS59220635A (ja) シ−ト状物の欠陥検出方法
JPH0378098A (ja) 紙葉類の検査装置