JPS55107942A - Inspecting method of plate - Google Patents

Inspecting method of plate

Info

Publication number
JPS55107942A
JPS55107942A JP1531579A JP1531579A JPS55107942A JP S55107942 A JPS55107942 A JP S55107942A JP 1531579 A JP1531579 A JP 1531579A JP 1531579 A JP1531579 A JP 1531579A JP S55107942 A JPS55107942 A JP S55107942A
Authority
JP
Japan
Prior art keywords
light
plate
transmitted
beams
defect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1531579A
Other languages
English (en)
Other versions
JPS6253768B2 (ja
Inventor
Yutaka Abe
Shozo Nomura
Toshinori Inoue
Motoo Igari
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP1531579A priority Critical patent/JPS55107942A/ja
Publication of JPS55107942A publication Critical patent/JPS55107942A/ja
Publication of JPS6253768B2 publication Critical patent/JPS6253768B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP1531579A 1979-02-13 1979-02-13 Inspecting method of plate Granted JPS55107942A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1531579A JPS55107942A (en) 1979-02-13 1979-02-13 Inspecting method of plate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1531579A JPS55107942A (en) 1979-02-13 1979-02-13 Inspecting method of plate

Publications (2)

Publication Number Publication Date
JPS55107942A true JPS55107942A (en) 1980-08-19
JPS6253768B2 JPS6253768B2 (ja) 1987-11-12

Family

ID=11885341

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1531579A Granted JPS55107942A (en) 1979-02-13 1979-02-13 Inspecting method of plate

Country Status (1)

Country Link
JP (1) JPS55107942A (ja)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5780546A (en) * 1980-11-07 1982-05-20 Nippon Kogaku Kk <Nikon> Detecting device for foreign substance
JPS57128834A (en) * 1981-02-04 1982-08-10 Nippon Kogaku Kk <Nikon> Inspecting apparatus of foreign substance
JPS57158545A (en) * 1981-03-25 1982-09-30 Mitsubishi Electric Corp Surface defect inspecting device
EP0291276A2 (en) * 1987-05-15 1988-11-17 Therma-Wave Inc. Locating and testing areas of interest on a workpiece
JPH01221776A (ja) * 1989-01-26 1989-09-05 Ricoh Co Ltd 磁気ブラシ現像装置
JPH0232237A (ja) * 1988-06-11 1990-02-02 Daimler Benz Ag 自動車車体部品用の深絞り可能な鉄板の耐食性を測定する方法および装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5071995A (ja) * 1973-10-24 1975-06-14

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5071995A (ja) * 1973-10-24 1975-06-14

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5780546A (en) * 1980-11-07 1982-05-20 Nippon Kogaku Kk <Nikon> Detecting device for foreign substance
JPS6352696B2 (ja) * 1980-11-07 1988-10-19 Nippon Kogaku Kk
JPS57128834A (en) * 1981-02-04 1982-08-10 Nippon Kogaku Kk <Nikon> Inspecting apparatus of foreign substance
JPS6364738B2 (ja) * 1981-02-04 1988-12-13
JPS57158545A (en) * 1981-03-25 1982-09-30 Mitsubishi Electric Corp Surface defect inspecting device
EP0291276A2 (en) * 1987-05-15 1988-11-17 Therma-Wave Inc. Locating and testing areas of interest on a workpiece
JPH0232237A (ja) * 1988-06-11 1990-02-02 Daimler Benz Ag 自動車車体部品用の深絞り可能な鉄板の耐食性を測定する方法および装置
JPH01221776A (ja) * 1989-01-26 1989-09-05 Ricoh Co Ltd 磁気ブラシ現像装置
JPH0545955B2 (ja) * 1989-01-26 1993-07-12 Ricoh Kk

Also Published As

Publication number Publication date
JPS6253768B2 (ja) 1987-11-12

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