JPS57158545A - Surface defect inspecting device - Google Patents
Surface defect inspecting deviceInfo
- Publication number
- JPS57158545A JPS57158545A JP4460581A JP4460581A JPS57158545A JP S57158545 A JPS57158545 A JP S57158545A JP 4460581 A JP4460581 A JP 4460581A JP 4460581 A JP4460581 A JP 4460581A JP S57158545 A JPS57158545 A JP S57158545A
- Authority
- JP
- Japan
- Prior art keywords
- photoelectric element
- reflected ray
- paper
- regular
- geometrical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
Abstract
PURPOSE:To prevent a drop of detection sensitivity caused by a kind and a quality of a defect of a sheet-like substance such as paper, etc., by installing a detector at a maximum point of a reflected ray and a geometrical regular reflectin point. CONSTITUTION:When an incident angle theta is set within a range of >=44 deg. and <=83 deg., a maximum intensity reflected ray 12 is separated from a reflected ray 11 in the geometrical regular reflecting direction, so that an angle alpha made by them is <=7 deg., in the direction approaching sample paper 1 in the plane containing an incident light beam 10 and the sample paper 1. Accordingly, when a photoelectric element 4b for a photodetecting the reflected ray 11 in the geometrical regular reflecting direction and a photoelectric element 4a for photodetecting the maximum intensity reflected ray 12 are installed, in case of an inspection of a defect of paper, the photoelectric element 4b and the photoelectric element 4a lock like as if the former and the latter photodetect a diffused light beam and a regular reflection ray, respectively. A position of the photoelectric element 4a, however, is not a geometrical regular reflecting position, therefore, for instance, a lustrous defect signal light beam moves in its original regular reflecting direction and is photodetected by the photoelectric element 4b.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4460581A JPS57158545A (en) | 1981-03-25 | 1981-03-25 | Surface defect inspecting device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4460581A JPS57158545A (en) | 1981-03-25 | 1981-03-25 | Surface defect inspecting device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS57158545A true JPS57158545A (en) | 1982-09-30 |
Family
ID=12696073
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4460581A Pending JPS57158545A (en) | 1981-03-25 | 1981-03-25 | Surface defect inspecting device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57158545A (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4857689A (en) * | 1971-11-19 | 1973-08-13 | ||
| JPS55107942A (en) * | 1979-02-13 | 1980-08-19 | Matsushita Electric Works Ltd | Inspecting method of plate |
-
1981
- 1981-03-25 JP JP4460581A patent/JPS57158545A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4857689A (en) * | 1971-11-19 | 1973-08-13 | ||
| JPS55107942A (en) * | 1979-02-13 | 1980-08-19 | Matsushita Electric Works Ltd | Inspecting method of plate |
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