JPS5596430A - Interference prevention apparatus for aperture plate in passage for measuring light - Google Patents

Interference prevention apparatus for aperture plate in passage for measuring light

Info

Publication number
JPS5596430A
JPS5596430A JP334979A JP334979A JPS5596430A JP S5596430 A JPS5596430 A JP S5596430A JP 334979 A JP334979 A JP 334979A JP 334979 A JP334979 A JP 334979A JP S5596430 A JPS5596430 A JP S5596430A
Authority
JP
Japan
Prior art keywords
aperture plate
light
plate
reflection
central portion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP334979A
Other languages
Japanese (ja)
Other versions
JPS61932B2 (en
Inventor
Isao Hishikari
Hiroshi Shimoyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chino Works Ltd
Original Assignee
Chino Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chino Works Ltd filed Critical Chino Works Ltd
Priority to JP334979A priority Critical patent/JPS5596430A/en
Publication of JPS5596430A publication Critical patent/JPS5596430A/en
Publication of JPS61932B2 publication Critical patent/JPS61932B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity

Abstract

PURPOSE:To suppress an interference phenomenon, a main cause of noise in an aperture plate, by providing an optical screen between passages for projection light and reflection light in a coaxial reflection measuring optical system. CONSTITUTION:Projection light is applied to a sample material M through the central portion A of a light-permeable aperture plate 6 fixed to the lower surface of a case 5. A measuring component of the light which is irregularly reflected on the surface of the object M and which passes through an outer peripheral portion B of the aperture plate 6 is input into a light receiving element 9. At this time, a part of the projection light entering the central portion A of the plate 6 is scattered therein to be transmitted to the peripheral portion B thereof. A part of this scattered light is mixed in and interferes the reflection beam. In order to prevent this, for example an aperture plate 10 is provided, which consists of a transparent glass plate 11 having the same shape as the the central portion A of the aperture plate 6, and a transparent glass plate 12 having the same shape as the peripheral portion B of the aperture plate 6, which glass plates 11, 12 are joined together in the same plane. In this aperture plate 10, a non-light-permeable hood 17 is inserted at its base end portion between the joint surfaces of the glass plates 11, 12 so as to optically shield the boundary area between the passages for the projection light and reflection light. Thus, an interference phenomenon in the aperture plate can be suppressed.
JP334979A 1979-01-18 1979-01-18 Interference prevention apparatus for aperture plate in passage for measuring light Granted JPS5596430A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP334979A JPS5596430A (en) 1979-01-18 1979-01-18 Interference prevention apparatus for aperture plate in passage for measuring light

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP334979A JPS5596430A (en) 1979-01-18 1979-01-18 Interference prevention apparatus for aperture plate in passage for measuring light

Publications (2)

Publication Number Publication Date
JPS5596430A true JPS5596430A (en) 1980-07-22
JPS61932B2 JPS61932B2 (en) 1986-01-13

Family

ID=11554869

Family Applications (1)

Application Number Title Priority Date Filing Date
JP334979A Granted JPS5596430A (en) 1979-01-18 1979-01-18 Interference prevention apparatus for aperture plate in passage for measuring light

Country Status (1)

Country Link
JP (1) JPS5596430A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58105025A (en) * 1981-12-17 1983-06-22 Toshiba Corp Light receiving element array
JPS59121659U (en) * 1983-02-04 1984-08-16 ミノルタ株式会社 Reflective photo sensor
JPH05332834A (en) * 1991-11-29 1993-12-17 Toshiba Corp Absorbance measuring device
JPH05346349A (en) * 1991-11-29 1993-12-27 Toshiba Corp Automatic chemical analyzer

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0192382A (en) * 1987-10-02 1989-04-11 Kanto Seiki Co Ltd Molding of synthetic resin

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58105025A (en) * 1981-12-17 1983-06-22 Toshiba Corp Light receiving element array
JPS59121659U (en) * 1983-02-04 1984-08-16 ミノルタ株式会社 Reflective photo sensor
JPH0140036Y2 (en) * 1983-02-04 1989-12-01
JPH05332834A (en) * 1991-11-29 1993-12-17 Toshiba Corp Absorbance measuring device
JPH05346349A (en) * 1991-11-29 1993-12-27 Toshiba Corp Automatic chemical analyzer

Also Published As

Publication number Publication date
JPS61932B2 (en) 1986-01-13

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