JPS5748644A - Detection of defect for transparent body - Google Patents

Detection of defect for transparent body

Info

Publication number
JPS5748644A
JPS5748644A JP12401280A JP12401280A JPS5748644A JP S5748644 A JPS5748644 A JP S5748644A JP 12401280 A JP12401280 A JP 12401280A JP 12401280 A JP12401280 A JP 12401280A JP S5748644 A JPS5748644 A JP S5748644A
Authority
JP
Japan
Prior art keywords
defect
transparent body
passing
ray
absorbed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12401280A
Other languages
Japanese (ja)
Inventor
Chuzaburo Yamazaki
Eiji Takamine
Daisaku Tomioka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AGC Inc
Original Assignee
Asahi Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Glass Co Ltd filed Critical Asahi Glass Co Ltd
Priority to JP12401280A priority Critical patent/JPS5748644A/en
Publication of JPS5748644A publication Critical patent/JPS5748644A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Abstract

PURPOSE:To absorb the light scattered by the defect near the rear surface of a transparent body during passing of the transparent body and prevent the defect from being detected near the rear surface by using an incident ray of the absorption wavelength region of the transparent body. CONSTITUTION:When an incident ray is the ray of the absorption wavelength region of a transparent body 1 to be detected of defects, the incident ray is gradually absorbed and weakened by the body 1 while it is passing through the body 1. Hence, the ray projected to a defect 4 existing near (b) the rear surface of the body 1 is gradually absorbed and weakened by the body 1 while it is passing through the transparent body before it is projected, and further the scattered and reflected abnormal light by this defect 4 is also absorbed while it is passing through the transparent body; therefore at the time when the reflected abnormal light toward a detector 3 emerges from the body 1, it is substantially absorbed by the body 1 and is difficult to be detected by the detector 3.
JP12401280A 1980-09-09 1980-09-09 Detection of defect for transparent body Pending JPS5748644A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12401280A JPS5748644A (en) 1980-09-09 1980-09-09 Detection of defect for transparent body

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12401280A JPS5748644A (en) 1980-09-09 1980-09-09 Detection of defect for transparent body

Publications (1)

Publication Number Publication Date
JPS5748644A true JPS5748644A (en) 1982-03-20

Family

ID=14874832

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12401280A Pending JPS5748644A (en) 1980-09-09 1980-09-09 Detection of defect for transparent body

Country Status (1)

Country Link
JP (1) JPS5748644A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63107078A (en) * 1986-10-23 1988-05-12 Mitsubishi Electric Corp Laser equipment
JPS63200043A (en) * 1987-02-14 1988-08-18 Hamamatsu Photonics Kk Apparatus for detecting surface flaw of sheet like object to be inspected
JP2001108630A (en) * 1999-10-12 2001-04-20 Sumitomo Chem Co Ltd Method for inspecting optical transparent film

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63107078A (en) * 1986-10-23 1988-05-12 Mitsubishi Electric Corp Laser equipment
JPS63200043A (en) * 1987-02-14 1988-08-18 Hamamatsu Photonics Kk Apparatus for detecting surface flaw of sheet like object to be inspected
JP2001108630A (en) * 1999-10-12 2001-04-20 Sumitomo Chem Co Ltd Method for inspecting optical transparent film

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