JPH0228815B2 - - Google Patents

Info

Publication number
JPH0228815B2
JPH0228815B2 JP55021558A JP2155880A JPH0228815B2 JP H0228815 B2 JPH0228815 B2 JP H0228815B2 JP 55021558 A JP55021558 A JP 55021558A JP 2155880 A JP2155880 A JP 2155880A JP H0228815 B2 JPH0228815 B2 JP H0228815B2
Authority
JP
Japan
Prior art keywords
light
magnetic disk
scattered light
photoelectric conversion
conversion element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP55021558A
Other languages
English (en)
Japanese (ja)
Other versions
JPS56118646A (en
Inventor
Mitsuyoshi Koizumi
Nobuyuki Akyama
Yoshimasa Ooshima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP2155880A priority Critical patent/JPS56118646A/ja
Publication of JPS56118646A publication Critical patent/JPS56118646A/ja
Publication of JPH0228815B2 publication Critical patent/JPH0228815B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2155880A 1980-02-25 1980-02-25 Flaw inspecting apparatus Granted JPS56118646A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2155880A JPS56118646A (en) 1980-02-25 1980-02-25 Flaw inspecting apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2155880A JPS56118646A (en) 1980-02-25 1980-02-25 Flaw inspecting apparatus

Publications (2)

Publication Number Publication Date
JPS56118646A JPS56118646A (en) 1981-09-17
JPH0228815B2 true JPH0228815B2 (fi) 1990-06-26

Family

ID=12058329

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2155880A Granted JPS56118646A (en) 1980-02-25 1980-02-25 Flaw inspecting apparatus

Country Status (1)

Country Link
JP (1) JPS56118646A (fi)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009192541A (ja) * 2009-05-25 2009-08-27 Hitachi Ltd 欠陥検査装置

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58103647A (ja) * 1981-12-16 1983-06-20 Nok Corp 表面欠陥検査方法
JPS5944643A (ja) * 1982-09-08 1984-03-13 Nok Corp 表面欠陥検査方法
JPS6211133A (ja) * 1985-06-24 1987-01-20 Hitachi Electronics Eng Co Ltd 表面検査装置
JPS62124448A (ja) * 1985-11-26 1987-06-05 Hitachi Electronics Eng Co Ltd 表面検査装置
CZ306088B6 (cs) * 2004-07-07 2016-08-03 ĂšSTAV MERANIA SAV Způsob vyhledávání povrchových defektů, zejména ložiskových kroužků, a zařízení pro provádění tohoto způsobu

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5517443A (en) * 1978-07-26 1980-02-06 Hitachi Electronics Eng Co Ltd Detector for surface deficiency of optical type

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5517443A (en) * 1978-07-26 1980-02-06 Hitachi Electronics Eng Co Ltd Detector for surface deficiency of optical type

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009192541A (ja) * 2009-05-25 2009-08-27 Hitachi Ltd 欠陥検査装置

Also Published As

Publication number Publication date
JPS56118646A (en) 1981-09-17

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