JPS6252827B2 - - Google Patents

Info

Publication number
JPS6252827B2
JPS6252827B2 JP55174094A JP17409480A JPS6252827B2 JP S6252827 B2 JPS6252827 B2 JP S6252827B2 JP 55174094 A JP55174094 A JP 55174094A JP 17409480 A JP17409480 A JP 17409480A JP S6252827 B2 JPS6252827 B2 JP S6252827B2
Authority
JP
Japan
Prior art keywords
data
analog
printed board
data file
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55174094A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5797466A (en
Inventor
Nobuhiko Kuribayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP55174094A priority Critical patent/JPS5797466A/ja
Publication of JPS5797466A publication Critical patent/JPS5797466A/ja
Publication of JPS6252827B2 publication Critical patent/JPS6252827B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2815—Functional tests, e.g. boundary scans, using the normal I/O contacts

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP55174094A 1980-12-10 1980-12-10 Testing method for analogically printed board Granted JPS5797466A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55174094A JPS5797466A (en) 1980-12-10 1980-12-10 Testing method for analogically printed board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55174094A JPS5797466A (en) 1980-12-10 1980-12-10 Testing method for analogically printed board

Publications (2)

Publication Number Publication Date
JPS5797466A JPS5797466A (en) 1982-06-17
JPS6252827B2 true JPS6252827B2 (fr) 1987-11-06

Family

ID=15972542

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55174094A Granted JPS5797466A (en) 1980-12-10 1980-12-10 Testing method for analogically printed board

Country Status (1)

Country Link
JP (1) JPS5797466A (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57163877A (en) * 1981-03-31 1982-10-08 Jeol Ltd Circuit diagnosing method
JPS61181222A (ja) * 1985-02-06 1986-08-13 Yokogawa Hewlett Packard Ltd アナログ・デイジタル変換器測定装置
JPH07111450B2 (ja) * 1986-12-30 1995-11-29 ソニー株式会社 電子回路測定装置
JPS63204808A (ja) * 1987-02-19 1988-08-24 Fujitsu Ltd 回路診断方式
JPH0196700A (ja) * 1987-10-08 1989-04-14 Casio Comput Co Ltd 電子楽器の入力制御装置
JP2839938B2 (ja) * 1990-06-27 1998-12-24 富士通株式会社 回路模擬試験装置及び該装置における半導体集積回路の試験方法

Also Published As

Publication number Publication date
JPS5797466A (en) 1982-06-17

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