JPS57163877A - Circuit diagnosing method - Google Patents

Circuit diagnosing method

Info

Publication number
JPS57163877A
JPS57163877A JP56049529A JP4952981A JPS57163877A JP S57163877 A JPS57163877 A JP S57163877A JP 56049529 A JP56049529 A JP 56049529A JP 4952981 A JP4952981 A JP 4952981A JP S57163877 A JPS57163877 A JP S57163877A
Authority
JP
Japan
Prior art keywords
converter
circuit
resistance
cpu1
deflecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56049529A
Other languages
Japanese (ja)
Inventor
Akira Shirakawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Priority to JP56049529A priority Critical patent/JPS57163877A/en
Publication of JPS57163877A publication Critical patent/JPS57163877A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE:To display what circuit is in trouble by sending a signal to be set from a CPU to circuits to be controlled, and then comparing signal values generated by the respective circuits with the signal to be set by the CPU. CONSTITUTION:A CPU1 sets a current to be flowed to an electron lens deflecting circuit 2 and sends the code of the set current to a D/A converter 3. The output of the D/A converter 3 is sent to the minus input terminal of the error amplifier of the electron lens deflecting circuit 2 consisting of a resistance R1, the error amplifier A, a deflecting coil L, a transistor T, and a resistance RS for detecting a current flowing through the deflecting coil L. A voltage detected by the resistance RS is digitized by an A/D converter 4 and applied to the CPU1. The CPU1 compares the output of the A/D converter 4 with the input of the D/A converter 3 and, when the both are not coincident with each other, displays the name of the electron lens deflecting circuit on a display device 5. Consequently, if the device is troubled, what circuit is in trouble is displayed.
JP56049529A 1981-03-31 1981-03-31 Circuit diagnosing method Pending JPS57163877A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56049529A JPS57163877A (en) 1981-03-31 1981-03-31 Circuit diagnosing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56049529A JPS57163877A (en) 1981-03-31 1981-03-31 Circuit diagnosing method

Publications (1)

Publication Number Publication Date
JPS57163877A true JPS57163877A (en) 1982-10-08

Family

ID=12833673

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56049529A Pending JPS57163877A (en) 1981-03-31 1981-03-31 Circuit diagnosing method

Country Status (1)

Country Link
JP (1) JPS57163877A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1024368A2 (en) * 1999-01-29 2000-08-02 Deere & Company Fault detection device and transport means

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5797466A (en) * 1980-12-10 1982-06-17 Fujitsu Ltd Testing method for analogically printed board

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5797466A (en) * 1980-12-10 1982-06-17 Fujitsu Ltd Testing method for analogically printed board

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1024368A2 (en) * 1999-01-29 2000-08-02 Deere & Company Fault detection device and transport means
EP1024368A3 (en) * 1999-01-29 2001-01-24 Deere & Company Fault detection device and transport means

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