JPS6222432B2 - - Google Patents

Info

Publication number
JPS6222432B2
JPS6222432B2 JP55121398A JP12139880A JPS6222432B2 JP S6222432 B2 JPS6222432 B2 JP S6222432B2 JP 55121398 A JP55121398 A JP 55121398A JP 12139880 A JP12139880 A JP 12139880A JP S6222432 B2 JPS6222432 B2 JP S6222432B2
Authority
JP
Japan
Prior art keywords
test
signal
circuit
output
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55121398A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5745944A (en
Inventor
Soichi Kawasaki
Soichi Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP55121398A priority Critical patent/JPS5745944A/ja
Publication of JPS5745944A publication Critical patent/JPS5745944A/ja
Publication of JPS6222432B2 publication Critical patent/JPS6222432B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
JP55121398A 1980-09-02 1980-09-02 Semiconductor integrated circuit device Granted JPS5745944A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55121398A JPS5745944A (en) 1980-09-02 1980-09-02 Semiconductor integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55121398A JPS5745944A (en) 1980-09-02 1980-09-02 Semiconductor integrated circuit device

Publications (2)

Publication Number Publication Date
JPS5745944A JPS5745944A (en) 1982-03-16
JPS6222432B2 true JPS6222432B2 (enEXAMPLES) 1987-05-18

Family

ID=14810195

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55121398A Granted JPS5745944A (en) 1980-09-02 1980-09-02 Semiconductor integrated circuit device

Country Status (1)

Country Link
JP (1) JPS5745944A (enEXAMPLES)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR910005615B1 (ko) * 1988-07-18 1991-07-31 삼성전자 주식회사 프로그래머블 순차코오드 인식회로
US7075586B2 (en) * 2002-04-03 2006-07-11 Thomson Licensing Power-on detection of DVI receiver IC

Also Published As

Publication number Publication date
JPS5745944A (en) 1982-03-16

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