JPS6220640B2 - - Google Patents

Info

Publication number
JPS6220640B2
JPS6220640B2 JP56014877A JP1487781A JPS6220640B2 JP S6220640 B2 JPS6220640 B2 JP S6220640B2 JP 56014877 A JP56014877 A JP 56014877A JP 1487781 A JP1487781 A JP 1487781A JP S6220640 B2 JPS6220640 B2 JP S6220640B2
Authority
JP
Japan
Prior art keywords
memory
address
under test
addresses
memory under
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56014877A
Other languages
English (en)
Japanese (ja)
Other versions
JPS57130295A (en
Inventor
Atsushi Nigorikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP56014877A priority Critical patent/JPS57130295A/ja
Publication of JPS57130295A publication Critical patent/JPS57130295A/ja
Publication of JPS6220640B2 publication Critical patent/JPS6220640B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP56014877A 1981-02-03 1981-02-03 Inspecting device for ic memory Granted JPS57130295A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56014877A JPS57130295A (en) 1981-02-03 1981-02-03 Inspecting device for ic memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56014877A JPS57130295A (en) 1981-02-03 1981-02-03 Inspecting device for ic memory

Publications (2)

Publication Number Publication Date
JPS57130295A JPS57130295A (en) 1982-08-12
JPS6220640B2 true JPS6220640B2 (enrdf_load_stackoverflow) 1987-05-08

Family

ID=11873236

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56014877A Granted JPS57130295A (en) 1981-02-03 1981-02-03 Inspecting device for ic memory

Country Status (1)

Country Link
JP (1) JPS57130295A (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59207496A (ja) * 1983-05-11 1984-11-24 Hitachi Ltd 半導体メモリ不良ビット救済解析装置
EP0424612A3 (en) * 1989-08-30 1992-03-11 International Business Machines Corporation Apparatus and method for real time data error capture and compression for redundancy analysis of a memory

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5558896A (en) * 1978-10-24 1980-05-01 Fujitsu Ltd Analyzer for memory defect
JPS5562598A (en) * 1978-10-31 1980-05-12 Nec Corp Memory check unit

Also Published As

Publication number Publication date
JPS57130295A (en) 1982-08-12

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