JPS62137504A - 部分クラッド材の幅測定装置 - Google Patents

部分クラッド材の幅測定装置

Info

Publication number
JPS62137504A
JPS62137504A JP27881185A JP27881185A JPS62137504A JP S62137504 A JPS62137504 A JP S62137504A JP 27881185 A JP27881185 A JP 27881185A JP 27881185 A JP27881185 A JP 27881185A JP S62137504 A JPS62137504 A JP S62137504A
Authority
JP
Japan
Prior art keywords
cladding
width
signal
substrate
image sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP27881185A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0415882B2 (enExample
Inventor
Susumu Okazaki
進 岡崎
Arata Nemoto
新 根本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Proterial Ltd
Original Assignee
Sumitomo Special Metals Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Special Metals Co Ltd filed Critical Sumitomo Special Metals Co Ltd
Priority to JP27881185A priority Critical patent/JPS62137504A/ja
Publication of JPS62137504A publication Critical patent/JPS62137504A/ja
Publication of JPH0415882B2 publication Critical patent/JPH0415882B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP27881185A 1985-12-10 1985-12-10 部分クラッド材の幅測定装置 Granted JPS62137504A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP27881185A JPS62137504A (ja) 1985-12-10 1985-12-10 部分クラッド材の幅測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP27881185A JPS62137504A (ja) 1985-12-10 1985-12-10 部分クラッド材の幅測定装置

Publications (2)

Publication Number Publication Date
JPS62137504A true JPS62137504A (ja) 1987-06-20
JPH0415882B2 JPH0415882B2 (enExample) 1992-03-19

Family

ID=17602492

Family Applications (1)

Application Number Title Priority Date Filing Date
JP27881185A Granted JPS62137504A (ja) 1985-12-10 1985-12-10 部分クラッド材の幅測定装置

Country Status (1)

Country Link
JP (1) JPS62137504A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6952231B1 (en) * 1999-09-28 2005-10-04 Oy Ekspansio Engineering Limited Apparatus based on a telecentric imaging system for forming an image of a linear zone of an object

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58190704A (ja) * 1982-04-30 1983-11-07 Nec Kyushu Ltd 線巾の測定方法
JPS58191938A (ja) * 1982-05-06 1983-11-09 Chino Works Ltd 光学的測定装置
JPS5924202A (ja) * 1982-07-30 1984-02-07 Matsushita Electric Works Ltd 表面欠陥検出装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58190704A (ja) * 1982-04-30 1983-11-07 Nec Kyushu Ltd 線巾の測定方法
JPS58191938A (ja) * 1982-05-06 1983-11-09 Chino Works Ltd 光学的測定装置
JPS5924202A (ja) * 1982-07-30 1984-02-07 Matsushita Electric Works Ltd 表面欠陥検出装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6952231B1 (en) * 1999-09-28 2005-10-04 Oy Ekspansio Engineering Limited Apparatus based on a telecentric imaging system for forming an image of a linear zone of an object

Also Published As

Publication number Publication date
JPH0415882B2 (enExample) 1992-03-19

Similar Documents

Publication Publication Date Title
JP2795595B2 (ja) 透明板状体の欠点検出方法
JP2005127989A (ja) 傷検出装置および傷検出プログラム
JPH0736001B2 (ja) びんの欠陥検査方法
JPH06100555B2 (ja) 透明物体の欠陥検査方法とその装置
JPH0244202A (ja) 物体の端部位置を検出する装置
US20250139755A1 (en) Unevenness measuring device for sheet-shaped material, and unevenness measuring method for sheet-shaped material
JPH11311510A (ja) 微小凹凸の検査方法および検査装置
US7286234B2 (en) Copper foil inspection device copper foil inspection method defect inspection device and defeat inspection method
JPH02194307A (ja) 板状物体の反り形状測定装置
JPS62137504A (ja) 部分クラッド材の幅測定装置
JPS6262205A (ja) 物体の表面凹凸検査方法
JP4023295B2 (ja) 表面検査方法及び表面検査装置
JP3340879B2 (ja) 表面欠陥検出方法および装置
JPS61140384A (ja) 電縫溶接における溶接状況計測方法
JPH07286968A (ja) 表面欠陥検査装置
JPS63128240A (ja) 反射光式傷検出装置
JPH043820B2 (enExample)
JP2000289358A (ja) 平版印刷版の検査装置
JP3410280B2 (ja) パターン検査装置
JP2525261B2 (ja) 実装基板外観検査装置
JPS61191905A (ja) 開先位置検出装置
JP2880813B2 (ja) 海苔欠陥検査装置
JPH11304435A (ja) シートの重ね継ぎ部の継ぎ長さの測定方法
JPS5875008A (ja) 形状測定方法
JPH04189672A (ja) 走行車両による限界測定方法および装置