JPS6210390B2 - - Google Patents
Info
- Publication number
- JPS6210390B2 JPS6210390B2 JP54168645A JP16864579A JPS6210390B2 JP S6210390 B2 JPS6210390 B2 JP S6210390B2 JP 54168645 A JP54168645 A JP 54168645A JP 16864579 A JP16864579 A JP 16864579A JP S6210390 B2 JPS6210390 B2 JP S6210390B2
- Authority
- JP
- Japan
- Prior art keywords
- scan
- test
- memory element
- flip
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 87
- 230000002093 peripheral effect Effects 0.000 description 9
- 238000010586 diagram Methods 0.000 description 6
- 238000010998 test method Methods 0.000 description 4
- 238000005192 partition Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
Landscapes
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16864579A JPS5690271A (en) | 1979-12-25 | 1979-12-25 | Testing method for logic device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16864579A JPS5690271A (en) | 1979-12-25 | 1979-12-25 | Testing method for logic device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5690271A JPS5690271A (en) | 1981-07-22 |
| JPS6210390B2 true JPS6210390B2 (enrdf_load_stackoverflow) | 1987-03-05 |
Family
ID=15871867
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16864579A Granted JPS5690271A (en) | 1979-12-25 | 1979-12-25 | Testing method for logic device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5690271A (enrdf_load_stackoverflow) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5859632A (ja) * | 1981-10-02 | 1983-04-08 | Matsushita Electronics Corp | 半導体集積回路 |
| JPS643744A (en) * | 1987-06-26 | 1989-01-09 | Hitachi Ltd | Lsi test method |
-
1979
- 1979-12-25 JP JP16864579A patent/JPS5690271A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5690271A (en) | 1981-07-22 |
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