JPS6161003A - Ｘ線によるメツキ層の厚さ測定方法、及び測定装置 - Google Patents

Ｘ線によるメツキ層の厚さ測定方法、及び測定装置

Info

Publication number
JPS6161003A
JPS6161003A JP18423584A JP18423584A JPS6161003A JP S6161003 A JPS6161003 A JP S6161003A JP 18423584 A JP18423584 A JP 18423584A JP 18423584 A JP18423584 A JP 18423584A JP S6161003 A JPS6161003 A JP S6161003A
Authority
JP
Japan
Prior art keywords
rays
measured
plating layer
ray tube
fluorescent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18423584A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0253723B2 (enrdf_load_stackoverflow
Inventor
Hiroshi Ishijima
石島　博史
Susumu Hiradate
平舘　暹
Yutaka Ichinomiya
豊 一宮
Minoru Handa
伴田　稔
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Priority to JP18423584A priority Critical patent/JPS6161003A/ja
Priority to DE19853531460 priority patent/DE3531460A1/de
Publication of JPS6161003A publication Critical patent/JPS6161003A/ja
Publication of JPH0253723B2 publication Critical patent/JPH0253723B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP18423584A 1984-09-03 1984-09-03 Ｘ線によるメツキ層の厚さ測定方法、及び測定装置 Granted JPS6161003A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP18423584A JPS6161003A (ja) 1984-09-03 1984-09-03 Ｘ線によるメツキ層の厚さ測定方法、及び測定装置
DE19853531460 DE3531460A1 (de) 1984-09-03 1985-09-03 Verfahren und vorrichtung zum messen der dicke einer plattierten schicht

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18423584A JPS6161003A (ja) 1984-09-03 1984-09-03 Ｘ線によるメツキ層の厚さ測定方法、及び測定装置

Publications (2)

Publication Number Publication Date
JPS6161003A true JPS6161003A (ja) 1986-03-28
JPH0253723B2 JPH0253723B2 (enrdf_load_stackoverflow) 1990-11-19

Family

ID=16149738

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18423584A Granted JPS6161003A (ja) 1984-09-03 1984-09-03 Ｘ線によるメツキ層の厚さ測定方法、及び測定装置

Country Status (2)

Country Link
JP (1) JPS6161003A (enrdf_load_stackoverflow)
DE (1) DE3531460A1 (enrdf_load_stackoverflow)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01244346A (ja) * 1987-11-03 1989-09-28 Uk Government 高熱工程のモニター装置及びモニター方法
US5754621A (en) * 1993-03-15 1998-05-19 Hitachi, Ltd. X-ray inspection method and apparatus, prepreg inspecting method, and method for fabricating multi-layer printed circuit board
US6072899A (en) * 1997-01-23 2000-06-06 Hitachi, Ltd. Method and device of inspecting three-dimensional shape defect
JP2015158398A (ja) * 2014-02-24 2015-09-03 セイコーエプソン株式会社 実装基板
CN114047213A (zh) * 2021-11-17 2022-02-15 马鞍山钢铁股份有限公司 一种x射线荧光法测定锌层重量的方法

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01244346A (ja) * 1987-11-03 1989-09-28 Uk Government 高熱工程のモニター装置及びモニター方法
US5754621A (en) * 1993-03-15 1998-05-19 Hitachi, Ltd. X-ray inspection method and apparatus, prepreg inspecting method, and method for fabricating multi-layer printed circuit board
US6072899A (en) * 1997-01-23 2000-06-06 Hitachi, Ltd. Method and device of inspecting three-dimensional shape defect
JP2015158398A (ja) * 2014-02-24 2015-09-03 セイコーエプソン株式会社 実装基板
CN114047213A (zh) * 2021-11-17 2022-02-15 马鞍山钢铁股份有限公司 一种x射线荧光法测定锌层重量的方法

Also Published As

Publication number Publication date
JPH0253723B2 (enrdf_load_stackoverflow) 1990-11-19
DE3531460A1 (de) 1986-03-13

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