JPS6125009A - 形状測定機 - Google Patents

形状測定機

Info

Publication number
JPS6125009A
JPS6125009A JP14574084A JP14574084A JPS6125009A JP S6125009 A JPS6125009 A JP S6125009A JP 14574084 A JP14574084 A JP 14574084A JP 14574084 A JP14574084 A JP 14574084A JP S6125009 A JPS6125009 A JP S6125009A
Authority
JP
Japan
Prior art keywords
lever
detector
stylus
attached
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14574084A
Other languages
English (en)
Japanese (ja)
Other versions
JPH041850B2 (en, 2012
Inventor
Minoru Numamoto
沼本　実
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Seimitsu Co Ltd
Original Assignee
Tokyo Seimitsu Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Seimitsu Co Ltd filed Critical Tokyo Seimitsu Co Ltd
Priority to JP14574084A priority Critical patent/JPS6125009A/ja
Publication of JPS6125009A publication Critical patent/JPS6125009A/ja
Publication of JPH041850B2 publication Critical patent/JPH041850B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
JP14574084A 1984-07-13 1984-07-13 形状測定機 Granted JPS6125009A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14574084A JPS6125009A (ja) 1984-07-13 1984-07-13 形状測定機

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14574084A JPS6125009A (ja) 1984-07-13 1984-07-13 形状測定機

Publications (2)

Publication Number Publication Date
JPS6125009A true JPS6125009A (ja) 1986-02-03
JPH041850B2 JPH041850B2 (en, 2012) 1992-01-14

Family

ID=15392047

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14574084A Granted JPS6125009A (ja) 1984-07-13 1984-07-13 形状測定機

Country Status (1)

Country Link
JP (1) JPS6125009A (en, 2012)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63146702U (en, 2012) * 1987-03-19 1988-09-28
WO2013103070A1 (ja) * 2012-01-04 2013-07-11 株式会社東京精密 輪郭形状表面粗さ測定装置および輪郭形状表面粗さ測定方法
EP3346228A1 (en) * 2013-04-26 2018-07-11 Tokyo Seimitsu Co., Ltd. Shape measurement device

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63146702U (en, 2012) * 1987-03-19 1988-09-28
WO2013103070A1 (ja) * 2012-01-04 2013-07-11 株式会社東京精密 輪郭形状表面粗さ測定装置および輪郭形状表面粗さ測定方法
JP5301061B1 (ja) * 2012-01-04 2013-09-25 株式会社東京精密 輪郭形状表面粗さ測定装置および輪郭形状表面粗さ測定方法
CN104040288A (zh) * 2012-01-04 2014-09-10 株式会社东京精密 轮廓形状表面粗糙度测定装置以及轮廓形状表面粗糙度测定方法
US9074865B2 (en) 2012-01-04 2015-07-07 Tokyo Seimitsu Co., Ltd. Contour and surface texture measuring instrument and contour and surface texture measuring method
DE112012006115B4 (de) * 2012-01-04 2016-03-03 Tokyo Seimitsu Co.,Ltd. Kontur-und Oberflächentextur-Messinstrument und Kontur- und Oberflächentextur-Messverfahren
GB2511979B (en) * 2012-01-04 2016-05-04 Tokyo Seimitsu Co Ltd Contour and surface texture measuring instrument and contour and surface texture measuring method
JP2017161548A (ja) * 2012-01-04 2017-09-14 株式会社東京精密 輪郭形状表面粗さ測定装置および輪郭形状表面粗さ測定方法
EP3346228A1 (en) * 2013-04-26 2018-07-11 Tokyo Seimitsu Co., Ltd. Shape measurement device

Also Published As

Publication number Publication date
JPH041850B2 (en, 2012) 1992-01-14

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