JPS61103531A - 真空処理装置における基板の冷却機構 - Google Patents
真空処理装置における基板の冷却機構Info
- Publication number
- JPS61103531A JPS61103531A JP22300884A JP22300884A JPS61103531A JP S61103531 A JPS61103531 A JP S61103531A JP 22300884 A JP22300884 A JP 22300884A JP 22300884 A JP22300884 A JP 22300884A JP S61103531 A JPS61103531 A JP S61103531A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- cooling
- substrate holder
- cooling gas
- body part
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 91
- 238000001816 cooling Methods 0.000 title claims abstract description 44
- 239000000112 cooling gas Substances 0.000 claims abstract description 27
- 230000002093 peripheral effect Effects 0.000 claims description 8
- 238000000034 method Methods 0.000 description 7
- 239000000463 material Substances 0.000 description 5
- 230000000694 effects Effects 0.000 description 3
- 239000007789 gas Substances 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/50—Substrate holders
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
- ing And Chemical Polishing (AREA)
- Drying Of Semiconductors (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22300884A JPS61103531A (ja) | 1984-10-25 | 1984-10-25 | 真空処理装置における基板の冷却機構 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22300884A JPS61103531A (ja) | 1984-10-25 | 1984-10-25 | 真空処理装置における基板の冷却機構 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61103531A true JPS61103531A (ja) | 1986-05-22 |
| JPS6324411B2 JPS6324411B2 (enrdf_load_stackoverflow) | 1988-05-20 |
Family
ID=16791379
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP22300884A Granted JPS61103531A (ja) | 1984-10-25 | 1984-10-25 | 真空処理装置における基板の冷却機構 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61103531A (enrdf_load_stackoverflow) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63160227A (ja) * | 1986-12-23 | 1988-07-04 | Nec Corp | ドライエッチング装置 |
| JPS63170468U (enrdf_load_stackoverflow) * | 1987-04-28 | 1988-11-07 | ||
| US5027746A (en) * | 1988-03-22 | 1991-07-02 | U.S. Philips Corporation | Epitaxial reactor having a wall which is protected from deposits |
| US6610180B2 (en) | 2000-08-01 | 2003-08-26 | Anelva Corporation | Substrate processing device and method |
| WO2011043063A1 (ja) * | 2009-10-05 | 2011-04-14 | キヤノンアネルバ株式会社 | 基板冷却装置、スパッタリング装置および電子デバイスの製造方法 |
-
1984
- 1984-10-25 JP JP22300884A patent/JPS61103531A/ja active Granted
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63160227A (ja) * | 1986-12-23 | 1988-07-04 | Nec Corp | ドライエッチング装置 |
| JPS63170468U (enrdf_load_stackoverflow) * | 1987-04-28 | 1988-11-07 | ||
| US5027746A (en) * | 1988-03-22 | 1991-07-02 | U.S. Philips Corporation | Epitaxial reactor having a wall which is protected from deposits |
| US6610180B2 (en) | 2000-08-01 | 2003-08-26 | Anelva Corporation | Substrate processing device and method |
| WO2011043063A1 (ja) * | 2009-10-05 | 2011-04-14 | キヤノンアネルバ株式会社 | 基板冷却装置、スパッタリング装置および電子デバイスの製造方法 |
| GB2486156A (en) * | 2009-10-05 | 2012-06-06 | Canon Anelva Corp | Substrate cooling device, sputtering device, and method for producing an electronic device |
| JP5462272B2 (ja) * | 2009-10-05 | 2014-04-02 | キヤノンアネルバ株式会社 | 基板冷却装置、スパッタリング装置および電子デバイスの製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6324411B2 (enrdf_load_stackoverflow) | 1988-05-20 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI278935B (en) | Process and system for heating semiconductor substrates in a processing chamber containing a susceptor | |
| WO2002071446A3 (en) | Method and apparatus for active temperature control of susceptors | |
| JPS61103531A (ja) | 真空処理装置における基板の冷却機構 | |
| TW201250821A (en) | Substrate processing apparatus and temperature adjustment method | |
| JP3237046B2 (ja) | 基板ホルダ | |
| JPS60257512A (ja) | 真空処理装置における基板の冷却方法 | |
| JPH0227715A (ja) | 気相成長装置用加熱ステージ | |
| JPH045000B2 (enrdf_load_stackoverflow) | ||
| JPS6130732B2 (enrdf_load_stackoverflow) | ||
| JPH0766181B2 (ja) | マスク膜とホルダ枠とからなるマスクの安定化方法 | |
| JPS58182819A (ja) | 加熱基台 | |
| JPH098108A (ja) | 半導体基板加熱ホルダ | |
| JPS56131930A (en) | Controlling device of wafer temperature | |
| JPS63227776A (ja) | 沈積装置用陰極/ターゲット組合体 | |
| JPS58137225A (ja) | 基板着脱機構 | |
| JPS5694655A (en) | Semiconductor device | |
| JPH07109033B2 (ja) | 基板温度コントロール機構 | |
| JPH0327522A (ja) | 半導体基板への薄膜加工方法及びその装置並びに薄膜加工装置 | |
| JPH11100674A (ja) | 真空処理装置 | |
| JP2002100562A (ja) | 基板の熱処理装置 | |
| JPS56132343A (en) | Mask for x-ray exposure and its manufacture | |
| JPH02197156A (ja) | Lsiケースの冷却構造 | |
| JP3297267B2 (ja) | 熱処理用ウェハボート及びこれを用いた熱処理装置 | |
| JPS5633534A (en) | Gas detector | |
| JPH05304085A (ja) | 半導体ウェハベーキング装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |