JPS6059747A - 半導体ウエ−ハの処理装置 - Google Patents

半導体ウエ−ハの処理装置

Info

Publication number
JPS6059747A
JPS6059747A JP16958383A JP16958383A JPS6059747A JP S6059747 A JPS6059747 A JP S6059747A JP 16958383 A JP16958383 A JP 16958383A JP 16958383 A JP16958383 A JP 16958383A JP S6059747 A JPS6059747 A JP S6059747A
Authority
JP
Japan
Prior art keywords
semiconductor wafer
cassette
wafer
receiving
rotating frame
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16958383A
Other languages
English (en)
Japanese (ja)
Other versions
JPS633455B2 (enrdf_load_stackoverflow
Inventor
Takeshi Sakashita
健 坂下
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP16958383A priority Critical patent/JPS6059747A/ja
Publication of JPS6059747A publication Critical patent/JPS6059747A/ja
Publication of JPS633455B2 publication Critical patent/JPS633455B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67763Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H01L21/67778Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
JP16958383A 1983-09-12 1983-09-12 半導体ウエ−ハの処理装置 Granted JPS6059747A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16958383A JPS6059747A (ja) 1983-09-12 1983-09-12 半導体ウエ−ハの処理装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16958383A JPS6059747A (ja) 1983-09-12 1983-09-12 半導体ウエ−ハの処理装置

Publications (2)

Publication Number Publication Date
JPS6059747A true JPS6059747A (ja) 1985-04-06
JPS633455B2 JPS633455B2 (enrdf_load_stackoverflow) 1988-01-23

Family

ID=15889166

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16958383A Granted JPS6059747A (ja) 1983-09-12 1983-09-12 半導体ウエ−ハの処理装置

Country Status (1)

Country Link
JP (1) JPS6059747A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6327025A (ja) * 1986-07-18 1988-02-04 Nec Kansai Ltd 半導体ウエ−ハの洗浄方法
JPH01104022U (enrdf_load_stackoverflow) * 1987-12-28 1989-07-13
CN111092036A (zh) * 2020-03-23 2020-05-01 杭州众硅电子科技有限公司 一种晶圆清洗干燥装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6327025A (ja) * 1986-07-18 1988-02-04 Nec Kansai Ltd 半導体ウエ−ハの洗浄方法
JPH01104022U (enrdf_load_stackoverflow) * 1987-12-28 1989-07-13
CN111092036A (zh) * 2020-03-23 2020-05-01 杭州众硅电子科技有限公司 一种晶圆清洗干燥装置

Also Published As

Publication number Publication date
JPS633455B2 (enrdf_load_stackoverflow) 1988-01-23

Similar Documents

Publication Publication Date Title
JP6431156B2 (ja) 基板処理装置
KR101964568B1 (ko) 반도체 웨이퍼의 낱장분리방법 및 반도체 웨이퍼를 낱장으로 분리하는 자동화 장치
KR102430367B1 (ko) 기판 반전 장치, 기판 처리 장치 및 기판 협지 장치
WO2014082212A1 (en) Method and apparatus for cleaning semiconductor wafer
JPS5928036Y2 (ja) 化学エツチング処理装置
JP2006179757A (ja) 基板処理装置
JPH0276227A (ja) 基板の洗浄乾燥方法及びその装置
JPS6059747A (ja) 半導体ウエ−ハの処理装置
JP3194592B2 (ja) 枚葉式ウェハー洗浄装置
JPS63184350A (ja) ウエハ搬送処理装置
JP2000107713A (ja) ディスク用カセットの洗浄装置
JPS59134834A (ja) 半導体ウエハの洗浄装置
JPH07106292A (ja) 半導体ウエハの洗浄装置
JP2000111254A (ja) ディスク用カセットの乾燥装置
JP3197304B2 (ja) 基板液処理装置及び基板液処理方法
JP3078954B2 (ja) 基板処理装置
JPS61100937A (ja) ウエハ−の処理方法
JP3102824B2 (ja) 基板処理装置
JPH08340035A (ja) 基板処理装置
JPH06163673A (ja) 基板処理装置
JP2818104B2 (ja) 基板配列ピッチ変換装置
JP3197539B2 (ja) 基板の洗浄装置及び洗浄方法
JPH11274270A (ja) 基板移載装置および基板処理装置
CN119480677A (zh) 晶圆湿式处理与清洗系统及方法
TWM647657U (zh) 晶圓濕式處理與清洗系統