JPS6047908A - 表面欠陥計測装置 - Google Patents
表面欠陥計測装置Info
- Publication number
- JPS6047908A JPS6047908A JP15616183A JP15616183A JPS6047908A JP S6047908 A JPS6047908 A JP S6047908A JP 15616183 A JP15616183 A JP 15616183A JP 15616183 A JP15616183 A JP 15616183A JP S6047908 A JPS6047908 A JP S6047908A
- Authority
- JP
- Japan
- Prior art keywords
- light
- level
- measured
- photoelectric conversion
- transmission path
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15616183A JPS6047908A (ja) | 1983-08-26 | 1983-08-26 | 表面欠陥計測装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15616183A JPS6047908A (ja) | 1983-08-26 | 1983-08-26 | 表面欠陥計測装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6047908A true JPS6047908A (ja) | 1985-03-15 |
JPH0314123B2 JPH0314123B2 (enrdf_load_stackoverflow) | 1991-02-26 |
Family
ID=15621678
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15616183A Granted JPS6047908A (ja) | 1983-08-26 | 1983-08-26 | 表面欠陥計測装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6047908A (enrdf_load_stackoverflow) |
-
1983
- 1983-08-26 JP JP15616183A patent/JPS6047908A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPH0314123B2 (enrdf_load_stackoverflow) | 1991-02-26 |
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