JPS60107845A - 半導体用回路基板 - Google Patents
半導体用回路基板Info
- Publication number
- JPS60107845A JPS60107845A JP21669883A JP21669883A JPS60107845A JP S60107845 A JPS60107845 A JP S60107845A JP 21669883 A JP21669883 A JP 21669883A JP 21669883 A JP21669883 A JP 21669883A JP S60107845 A JPS60107845 A JP S60107845A
- Authority
- JP
- Japan
- Prior art keywords
- copper foil
- nickel
- bonding
- thickness
- ceramic substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 17
- 239000004065 semiconductor Substances 0.000 title claims description 14
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 35
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims abstract description 34
- 239000011889 copper foil Substances 0.000 claims abstract description 27
- 229910052759 nickel Inorganic materials 0.000 claims abstract description 17
- 239000000919 ceramic Substances 0.000 claims abstract description 14
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims abstract description 11
- 229910052737 gold Inorganic materials 0.000 claims abstract description 11
- 239000010931 gold Substances 0.000 claims abstract description 11
- 229910052802 copper Inorganic materials 0.000 claims abstract description 8
- 239000010949 copper Substances 0.000 claims abstract description 8
- 238000010438 heat treatment Methods 0.000 claims abstract description 8
- 239000002344 surface layer Substances 0.000 claims abstract description 6
- 239000010410 layer Substances 0.000 claims description 12
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 abstract description 12
- 229910052782 aluminium Inorganic materials 0.000 abstract description 12
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 abstract description 4
- 238000009661 fatigue test Methods 0.000 abstract description 3
- 239000012299 nitrogen atmosphere Substances 0.000 abstract description 2
- 238000000034 method Methods 0.000 description 10
- 239000012298 atmosphere Substances 0.000 description 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000003647 oxidation Effects 0.000 description 3
- 238000007254 oxidation reaction Methods 0.000 description 3
- 239000001301 oxygen Substances 0.000 description 3
- 229910052760 oxygen Inorganic materials 0.000 description 3
- 238000007747 plating Methods 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 238000009713 electroplating Methods 0.000 description 2
- 230000020169 heat generation Effects 0.000 description 2
- 229910052575 non-oxide ceramic Inorganic materials 0.000 description 2
- 239000011225 non-oxide ceramic Substances 0.000 description 2
- 230000001590 oxidative effect Effects 0.000 description 2
- 239000008188 pellet Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 238000005245 sintering Methods 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 description 1
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 1
- BERDEBHAJNAUOM-UHFFFAOYSA-N copper(i) oxide Chemical compound [Cu]O[Cu] BERDEBHAJNAUOM-UHFFFAOYSA-N 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000007772 electroless plating Methods 0.000 description 1
- 230000005496 eutectics Effects 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 239000011224 oxide ceramic Substances 0.000 description 1
- 229910052574 oxide ceramic Inorganic materials 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07
- H01L21/4814—Conductive parts
- H01L21/4821—Flat leads, e.g. lead frames with or without insulating supports
- H01L21/4839—Assembly of a flat lead with an insulating support, e.g. for TAB
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
- H05K1/0306—Inorganic insulating substrates, e.g. ceramic, glass
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/24—Reinforcing the conductive pattern
- H05K3/244—Finish plating of conductors, especially of copper conductors, e.g. for pads or lands
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/328—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by welding
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Die Bonding (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP21669883A JPS60107845A (ja) | 1983-11-17 | 1983-11-17 | 半導体用回路基板 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP21669883A JPS60107845A (ja) | 1983-11-17 | 1983-11-17 | 半導体用回路基板 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60107845A true JPS60107845A (ja) | 1985-06-13 |
JPH0454378B2 JPH0454378B2 (enrdf_load_stackoverflow) | 1992-08-31 |
Family
ID=16692514
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP21669883A Granted JPS60107845A (ja) | 1983-11-17 | 1983-11-17 | 半導体用回路基板 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60107845A (enrdf_load_stackoverflow) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0607929A3 (en) * | 1993-01-19 | 1996-03-13 | Canon Kk | Flexible printed circuit board and ink jet recording head using the same. |
EP0966186A3 (de) * | 1998-06-19 | 2001-08-16 | Jürgen Dr.-Ing. Schulz-Harder | Verfahren zum Herstellen eines Metall-Keramik-Substrates |
US7288437B2 (en) | 1986-12-24 | 2007-10-30 | Semiconductor Energy Laboratory Co., Ltd. | Conductive pattern producing method and its applications |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3766634A (en) * | 1972-04-20 | 1973-10-23 | Gen Electric | Method of direct bonding metals to non-metallic substrates |
JPS56167339A (en) * | 1980-05-26 | 1981-12-23 | Takehiko Yasuda | Electronic parts equipped with gold conductive layer |
-
1983
- 1983-11-17 JP JP21669883A patent/JPS60107845A/ja active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3766634A (en) * | 1972-04-20 | 1973-10-23 | Gen Electric | Method of direct bonding metals to non-metallic substrates |
JPS56167339A (en) * | 1980-05-26 | 1981-12-23 | Takehiko Yasuda | Electronic parts equipped with gold conductive layer |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7288437B2 (en) | 1986-12-24 | 2007-10-30 | Semiconductor Energy Laboratory Co., Ltd. | Conductive pattern producing method and its applications |
EP0607929A3 (en) * | 1993-01-19 | 1996-03-13 | Canon Kk | Flexible printed circuit board and ink jet recording head using the same. |
US6328427B1 (en) | 1993-01-19 | 2001-12-11 | Canon Kabushiki Kaisha | Method of producing a wiring substrate |
EP0966186A3 (de) * | 1998-06-19 | 2001-08-16 | Jürgen Dr.-Ing. Schulz-Harder | Verfahren zum Herstellen eines Metall-Keramik-Substrates |
Also Published As
Publication number | Publication date |
---|---|
JPH0454378B2 (enrdf_load_stackoverflow) | 1992-08-31 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS639376B2 (enrdf_load_stackoverflow) | ||
KR900001838B1 (ko) | 고열전도성 세라믹스기판 | |
JPS6126231A (ja) | 金属‐セラミツク複合素子およびその製法 | |
JPS60107845A (ja) | 半導体用回路基板 | |
JPH0568877B2 (enrdf_load_stackoverflow) | ||
JP3495773B2 (ja) | 回路基板 | |
US4765528A (en) | Plating process for an electronic part | |
JPS61121489A (ja) | 基板製造用Cu配線シ−ト | |
JP2001024296A (ja) | セラミック回路基板 | |
JPS63242985A (ja) | 窒化アルミニウム基板及びその製造方法 | |
JPS63119242A (ja) | 基板 | |
JP3645744B2 (ja) | セラミック配線基板 | |
JP2506270B2 (ja) | 高熱伝導性回路基板及び高熱伝導性外囲器 | |
JP3512617B2 (ja) | 電子部品 | |
JPS62182182A (ja) | 金属化面を有する窒化アルミニウム焼結体 | |
JP3385752B2 (ja) | セラミックプリント配線板及びその製造方法 | |
JP4191860B2 (ja) | セラミック回路基板 | |
JP4109391B2 (ja) | 配線基板 | |
JPS61245555A (ja) | 半導体用端子接続構体 | |
JP2690643B2 (ja) | 配線基板 | |
JP2004127953A (ja) | 配線基板 | |
JPS60120592A (ja) | セラミツク配線板及びセラミツク配線板の製造方法 | |
JPH06151618A (ja) | 半導体素子収納用パッケージ | |
JPH02240995A (ja) | 電子部品実装用セラミックス基板 | |
JPH1013006A (ja) | 電子部品 |