JPS5953661B2 - 質量分析計のための自動試料交換装置 - Google Patents

質量分析計のための自動試料交換装置

Info

Publication number
JPS5953661B2
JPS5953661B2 JP51129566A JP12956676A JPS5953661B2 JP S5953661 B2 JPS5953661 B2 JP S5953661B2 JP 51129566 A JP51129566 A JP 51129566A JP 12956676 A JP12956676 A JP 12956676A JP S5953661 B2 JPS5953661 B2 JP S5953661B2
Authority
JP
Japan
Prior art keywords
sample
lock
sliding rod
crucible
mass spectrometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP51129566A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5257883A (en
Inventor
エンゲルベルト・コツホ
ハンスーデイーテル・ブルヴイーン
ハンスーペーテル・リツテル
ヘルマン・バルトール
ライネル・シユトレヴインスキイ
ヴアルテル・フツプ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Finnigan MAT GmbH
Original Assignee
Finnigan MAT GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Finnigan MAT GmbH filed Critical Finnigan MAT GmbH
Publication of JPS5257883A publication Critical patent/JPS5257883A/ja
Publication of JPS5953661B2 publication Critical patent/JPS5953661B2/ja
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0409—Sample holders or containers
    • H01J49/0413—Sample holders or containers for automated handling
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H01J49/049—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for applying heat to desorb the sample; Evaporation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0495—Vacuum locks; Valves

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP51129566A 1975-10-31 1976-10-29 質量分析計のための自動試料交換装置 Expired JPS5953661B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2548891A DE2548891C3 (de) 1975-10-31 1975-10-31 Probenwechsler für Massenspektrometer

Publications (2)

Publication Number Publication Date
JPS5257883A JPS5257883A (en) 1977-05-12
JPS5953661B2 true JPS5953661B2 (ja) 1984-12-26

Family

ID=5960587

Family Applications (1)

Application Number Title Priority Date Filing Date
JP51129566A Expired JPS5953661B2 (ja) 1975-10-31 1976-10-29 質量分析計のための自動試料交換装置

Country Status (5)

Country Link
US (1) US4076982A (enExample)
JP (1) JPS5953661B2 (enExample)
DE (1) DE2548891C3 (enExample)
FR (1) FR2330006A1 (enExample)
GB (1) GB1512747A (enExample)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4532816A (en) * 1983-07-25 1985-08-06 The Perkin-Elmer Corporation Sample vessel
DE3002575C2 (de) * 1980-01-25 1983-12-29 Finnigan MAT GmbH, 2800 Bremen Einrichtung zum automatisch steuerbaren Probentransport in einen unter Hochvakuum stehenden Raum eines Analysengerätes
FR2532470A1 (fr) * 1982-08-30 1984-03-02 Commissariat Energie Atomique Dispositif d'ionisation d'un materiau par chauffage a haute temperature
GB2150125A (en) * 1983-11-22 1985-06-26 Prutec Ltd Introduction of samples into a mass spectrometer
GB2150290A (en) * 1983-11-22 1985-06-26 Prutec Ltd Introduction of samples into a mass spectrometer
GB2150289A (en) * 1983-11-22 1985-06-26 Prutec Ltd Introduction of samples into a mass spectrometer
GB2162207B (en) * 1984-07-26 1989-05-10 Japan Res Dev Corp Semiconductor crystal growth apparatus
FR2585835B1 (fr) * 1985-07-30 1988-07-22 Univ Pasteur Dispositif d'introduction directe automatique d'echantillons dans un spectrometre de masse, et procede mis en oeuvre par ce dispositif
US4879458A (en) * 1985-08-15 1989-11-07 R. J. Brunfeldt Company, Inc. Automatic sample system for mass spectrometer
US5009835A (en) * 1989-01-25 1991-04-23 Westinghouse Electric Corp. Nuclear fuel rod helium leak inspection apparatus and method
US5605798A (en) 1993-01-07 1997-02-25 Sequenom, Inc. DNA diagnostic based on mass spectrometry
USRE39353E1 (en) * 1994-07-21 2006-10-17 Applera Corporation Mass spectrometer system and method for matrix-assisted laser desorption measurements
US5498545A (en) * 1994-07-21 1996-03-12 Vestal; Marvin L. Mass spectrometer system and method for matrix-assisted laser desorption measurements
US5625184A (en) * 1995-05-19 1997-04-29 Perseptive Biosystems, Inc. Time-of-flight mass spectrometry analysis of biomolecules
US6002127A (en) * 1995-05-19 1999-12-14 Perseptive Biosystems, Inc. Time-of-flight mass spectrometry analysis of biomolecules
US5644130A (en) * 1996-03-20 1997-07-01 National Electrostatics Corp. Multi-gas cathode ion surge
DE19628112A1 (de) * 1996-07-12 1998-01-22 Bruker Franzen Analytik Gmbh Vorrichtung und Verfahren zum Einschleusen von Probenträgern in ein Massenspektrometer
ATE375403T1 (de) 1996-11-06 2007-10-15 Sequenom Inc Dna-diagnostik mittels massenspektrometrie
DK172892B1 (da) * 1997-10-20 1999-09-13 Hans Degn Doseringsenhed og metode til kontinuerlig indføring af væskeopløsningsprøver i et system
US20020009394A1 (en) 1999-04-02 2002-01-24 Hubert Koster Automated process line
US7917301B1 (en) 2000-09-19 2011-03-29 Sequenom, Inc. Method and device for identifying a biological sample
US7332275B2 (en) 1999-10-13 2008-02-19 Sequenom, Inc. Methods for detecting methylated nucleotides
ATE423221T1 (de) 2000-06-13 2009-03-15 Univ Boston Verwendung von mass-matched nukleotide in der analyse von oligonukleotidmischungen sowie in der hoch-multiplexen nukleinsäuresequenzierung
US6958214B2 (en) 2000-07-10 2005-10-25 Sequenom, Inc. Polymorphic kinase anchor proteins and nucleic acids encoding the same
US20020155587A1 (en) 2001-04-20 2002-10-24 Sequenom, Inc. System and method for testing a biological sample
EP1478465A2 (en) * 2002-02-26 2004-11-24 Ciphergen Biosystems, Inc. Device and methods for automating transfer of multiple samples to an analytical instrument
US7432342B2 (en) * 2002-05-03 2008-10-07 Sequenom, Inc. Kinase anchor protein muteins, peptides thereof and related documents
US20070141570A1 (en) * 2003-03-07 2007-06-21 Sequenom, Inc. Association of polymorphic kinase anchor proteins with cardiac phenotypes and related methods
RU2327244C1 (ru) * 2006-08-31 2008-06-20 Сергей Сергеевич Алимпиев Способ доставки анализируемого вещества в систему регистрации и устройство для его осуществления
US20080083874A1 (en) * 2006-10-10 2008-04-10 Prest Harry F Vacuum interface for mass spectrometer
JP2017102009A (ja) * 2015-12-01 2017-06-08 富士電機株式会社 捕捉体交換機構および微粒子組成分析装置
CN107452593A (zh) * 2017-09-19 2017-12-08 珠海美华医疗科技有限公司 一种质谱仪的进出样装置及质谱仪
CN111883414B (zh) * 2020-07-15 2023-02-10 宁波华仪宁创智能科技有限公司 更换装置及自动取样系统

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3076893A (en) * 1960-09-23 1963-02-05 Bendix Corp Apparatus for presenting source particles to a mass spectrometer
US3117223A (en) * 1961-06-09 1964-01-07 Atlas Werke Ag Sample insertion vacuum lock for a mass spectrometer
DE1498547A1 (de) * 1964-07-30 1969-05-22 Varian Mat Gmbh Vorrichtung zur Stoffuntersuchung durch Verdampfung,Ionisierung und Ionenstrommessung
DE1789151C3 (de) * 1964-07-30 1975-06-05 Varian Mat Gmbh, 2800 Bremen Vakuumschleuse für Massenspektrometer
US3590243A (en) * 1969-06-30 1971-06-29 Avco Corp Sample insertion vacuum lock and probe assembly for mass spectrometers

Also Published As

Publication number Publication date
FR2330006A1 (fr) 1977-05-27
DE2548891C3 (de) 1983-04-28
FR2330006B1 (enExample) 1982-05-14
DE2548891A1 (de) 1977-05-05
JPS5257883A (en) 1977-05-12
DE2548891B2 (de) 1982-09-16
US4076982A (en) 1978-02-28
GB1512747A (en) 1978-06-01

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