JPS5947467B2 - 温度センサ−用半導体素子 - Google Patents

温度センサ−用半導体素子

Info

Publication number
JPS5947467B2
JPS5947467B2 JP56137408A JP13740881A JPS5947467B2 JP S5947467 B2 JPS5947467 B2 JP S5947467B2 JP 56137408 A JP56137408 A JP 56137408A JP 13740881 A JP13740881 A JP 13740881A JP S5947467 B2 JPS5947467 B2 JP S5947467B2
Authority
JP
Japan
Prior art keywords
collector
diffusion layer
temperature sensor
base
stage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56137408A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5848963A (ja
Inventor
優幸 並木
昌明 神谷
芳和 小島
小次郎 田中
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP56137408A priority Critical patent/JPS5947467B2/ja
Priority to GB08224567A priority patent/GB2105109B/en
Priority to US06/413,492 priority patent/US4639755A/en
Priority to DE19823232336 priority patent/DE3232336A1/de
Publication of JPS5848963A publication Critical patent/JPS5848963A/ja
Publication of JPS5947467B2 publication Critical patent/JPS5947467B2/ja
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N19/00Integrated devices, or assemblies of multiple devices, comprising at least one thermoelectric or thermomagnetic element covered by groups H10N10/00 - H10N15/00
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203Particular design considerations for integrated circuits
    • H01L27/0207Geometrical layout of the components, e.g. computer aided design; custom LSI, semi-custom LSI, standard cell technique
    • H01L27/0211Geometrical layout of the components, e.g. computer aided design; custom LSI, semi-custom LSI, standard cell technique adapted for requirements of temperature
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/08Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind
    • H01L27/082Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including bipolar components only
    • H01L27/0823Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including bipolar components only including vertical bipolar transistors only
    • H01L27/0825Combination of vertical direct transistors of the same conductivity type having different characteristics,(e.g. Darlington transistors)
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/08Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind
    • H01L27/085Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only
    • H01L27/088Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate
    • H01L27/092Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate complementary MIS field-effect transistors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Ceramic Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Bipolar Transistors (AREA)
  • Bipolar Integrated Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Amplifiers (AREA)
JP56137408A 1981-09-01 1981-09-01 温度センサ−用半導体素子 Expired JPS5947467B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP56137408A JPS5947467B2 (ja) 1981-09-01 1981-09-01 温度センサ−用半導体素子
GB08224567A GB2105109B (en) 1981-09-01 1982-08-26 Thermosensitive semiconductor devices
US06/413,492 US4639755A (en) 1981-09-01 1982-08-31 Thermosensitive semiconductor device using Darlington circuit
DE19823232336 DE3232336A1 (de) 1981-09-01 1982-08-31 Thermoelektrische halbleitereinrichtung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56137408A JPS5947467B2 (ja) 1981-09-01 1981-09-01 温度センサ−用半導体素子

Publications (2)

Publication Number Publication Date
JPS5848963A JPS5848963A (ja) 1983-03-23
JPS5947467B2 true JPS5947467B2 (ja) 1984-11-19

Family

ID=15197939

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56137408A Expired JPS5947467B2 (ja) 1981-09-01 1981-09-01 温度センサ−用半導体素子

Country Status (4)

Country Link
US (1) US4639755A (de)
JP (1) JPS5947467B2 (de)
DE (1) DE3232336A1 (de)
GB (1) GB2105109B (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5947467B2 (ja) * 1981-09-01 1984-11-19 セイコーインスツルメンツ株式会社 温度センサ−用半導体素子
US4730228A (en) * 1986-03-21 1988-03-08 Siemens Aktiengesellschaft Overtemperature detection of power semiconductor components
JPH04150223A (ja) * 1990-10-10 1992-05-22 Nippondenso Co Ltd 集積回路を含んでなる出力回路
US5461252A (en) * 1992-10-06 1995-10-24 Matsushita Electric Industrial Co., Ltd. Semiconductor device comprising an over-temperature detection element for detecting excessive temperature of amplifiers
JP2946306B2 (ja) * 1995-09-12 1999-09-06 セイコーインスツルメンツ株式会社 半導体温度センサーとその製造方法
US6160305A (en) * 1996-12-23 2000-12-12 Motorola, Inc. Beta dependent temperature sensor for an integrated circuit
JP4863818B2 (ja) * 2006-08-29 2012-01-25 セイコーインスツル株式会社 温度センサ回路
US20110095621A1 (en) * 2009-10-22 2011-04-28 Gardtec Incorporated Power Cord with Thermal Control
US9373615B2 (en) * 2014-11-03 2016-06-21 Texas Instruments Incorporated Bipolar transistor including lateral suppression diode

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL7107040A (de) * 1971-05-22 1972-11-24
DE2344244C3 (de) * 1973-09-01 1982-11-25 Robert Bosch Gmbh, 7000 Stuttgart Laterale Transistorstruktur
US3867650A (en) * 1973-12-03 1975-02-18 Bell Telephone Labor Inc Compound transistor connection loading for a current
JPS597246B2 (ja) * 1975-12-01 1984-02-17 株式会社東芝 ハンドウタイロンリカイロ
FR2335055A1 (fr) * 1975-12-09 1977-07-08 Radiotechnique Compelec Dispositif semi-conducteur integre comportant une diode de protection contre les surtensions, et procede de fabrication d'un tel dispositif
JPS5272183A (en) * 1975-12-12 1977-06-16 Mitsubishi Electric Corp Semiconductor device with protecting device
US4136355A (en) * 1976-02-10 1979-01-23 Matsushita Electronics Corporation Darlington transistor
US4346313A (en) * 1976-05-20 1982-08-24 Itt Industries, Inc. Monolithic integrated threshold switch
JPS5419684A (en) * 1977-07-15 1979-02-14 Hitachi Ltd Semiconductor integrated circuit device for output
DE2805905A1 (de) * 1978-02-13 1979-08-16 Manfred Ing Grad Greve Linearer halbleitertemperaturfuehler
JPS5926098B2 (ja) * 1978-08-31 1984-06-23 オムロン株式会社 近接スイッチ
JPS56135963A (en) * 1980-03-27 1981-10-23 Seiko Instr & Electronics Ltd Semiconductor ic for temperature sensor
US4329598A (en) * 1980-04-04 1982-05-11 Dbx, Inc. Bias generator
JPS57145355A (en) * 1981-03-04 1982-09-08 Nippon Denso Co Ltd Semiconductor device
JPS5947467B2 (ja) * 1981-09-01 1984-11-19 セイコーインスツルメンツ株式会社 温度センサ−用半導体素子
US4471236A (en) * 1982-02-23 1984-09-11 Harris Corporation High temperature bias line stabilized current sources

Also Published As

Publication number Publication date
JPS5848963A (ja) 1983-03-23
DE3232336C2 (de) 1989-05-11
US4639755A (en) 1987-01-27
GB2105109B (en) 1985-06-12
DE3232336A1 (de) 1983-03-10
GB2105109A (en) 1983-03-16

Similar Documents

Publication Publication Date Title
US6144085A (en) Power transistor device having hot-location and cool-location temperature sensors
JPS625345B2 (de)
JPH01157573A (ja) 半導体装置およびその製造方法
JP3315456B2 (ja) 半導体スイッチ
JPH09229778A (ja) Ic化温度センサ
JPS5947467B2 (ja) 温度センサ−用半導体素子
GB1391214A (en) Seminconductor device having an integrated thermocouple
JPH06334189A (ja) 電力mos装置用集積構造電流感知抵抗
EP0488088B1 (de) Übertemperatur-Detektorschaltung zur Detektierung der Übertemperatur einer Leistungsschaltung
US5396119A (en) MOS power transistor device with temperature compensation
JPS5839058A (ja) 温度センサ−用半導体素子
US6768139B2 (en) Transistor configuration for a bandgap circuit
JPS59115667U (ja) 集積回路
JPS5587391A (en) Semiconductor memory circuit device
RU2743625C1 (ru) Преобразователь магнитного поля с функционально интегрированной структурой
JPS6352805B2 (de)
JPS586310B2 (ja) ハンドウタイソウチ
Trujillo et al. Diode-connected magnetotransistors
JPS5855455Y2 (ja) 定電流回路
JP2690201B2 (ja) 半導体集積回路
JPS6344744Y2 (de)
JPS6112389B2 (de)
JPH069505Y2 (ja) パルス発生回路装置
CN204732453U (zh) 具有高灵敏度的新型温敏元件
KR800001341B1 (ko) 반도체 회로