JPS59210657A - 回路素子の品種名識別方法 - Google Patents

回路素子の品種名識別方法

Info

Publication number
JPS59210657A
JPS59210657A JP58085343A JP8534383A JPS59210657A JP S59210657 A JPS59210657 A JP S59210657A JP 58085343 A JP58085343 A JP 58085343A JP 8534383 A JP8534383 A JP 8534383A JP S59210657 A JPS59210657 A JP S59210657A
Authority
JP
Japan
Prior art keywords
flip
scan
circuit element
lsi
name
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58085343A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0436464B2 (cs
Inventor
Hiroyuki Adachi
安達　裕幸
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP58085343A priority Critical patent/JPS59210657A/ja
Publication of JPS59210657A publication Critical patent/JPS59210657A/ja
Publication of JPH0436464B2 publication Critical patent/JPH0436464B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP58085343A 1983-05-16 1983-05-16 回路素子の品種名識別方法 Granted JPS59210657A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58085343A JPS59210657A (ja) 1983-05-16 1983-05-16 回路素子の品種名識別方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58085343A JPS59210657A (ja) 1983-05-16 1983-05-16 回路素子の品種名識別方法

Publications (2)

Publication Number Publication Date
JPS59210657A true JPS59210657A (ja) 1984-11-29
JPH0436464B2 JPH0436464B2 (cs) 1992-06-16

Family

ID=13856004

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58085343A Granted JPS59210657A (ja) 1983-05-16 1983-05-16 回路素子の品種名識別方法

Country Status (1)

Country Link
JP (1) JPS59210657A (cs)

Also Published As

Publication number Publication date
JPH0436464B2 (cs) 1992-06-16

Similar Documents

Publication Publication Date Title
KR900007743B1 (ko) 검사하기에 용이한 반도체 lsi장치
US5109190A (en) Semiconductor apparatus including semiconductor integrated circuit and operating method thereof
US5631912A (en) High impedance test mode for JTAG
TW211094B (en) Built-in self-test network
US4933575A (en) Electric circuit interchangeable between sequential and combination circuits
JPH0374796B2 (cs)
JPS59210657A (ja) 回路素子の品種名識別方法
JPS59211146A (ja) スキヤンイン方法
KR100503692B1 (ko) 고정논리값을출력하는수단의출력과회로의입력사이의접속테스팅장치
JPH0389178A (ja) 半導体集積回路
JP2002350509A (ja) 半導体装置
JP2633929B2 (ja) 半導体装置の試験方法
JPS63255672A (ja) 回路ブロツクテスト回路
JPS63193238A (ja) アドレススキヤン方式
JPH08136616A (ja) 混成集積回路
JPS62212582A (ja) 半導体集積回路
JPS63164456A (ja) 半導体集積回路
JPH026772A (ja) 集積回路
JPS60192343A (ja) 半導体集積回路
JPS62150181A (ja) 大規模集積回路の試験方式
JPH0519022A (ja) テストパターン発生方法
JPS59205799A (ja) 回路素子の品種名識別方式
JPS60174963A (ja) 電子パツケ−ジ試験回路
JPH0669346A (ja) 集積回路
JPH01248074A (ja) 診断容易化回路を有するｌｓｉ