JPS59178549A - シフトリング回路 - Google Patents

シフトリング回路

Info

Publication number
JPS59178549A
JPS59178549A JP58054154A JP5415483A JPS59178549A JP S59178549 A JPS59178549 A JP S59178549A JP 58054154 A JP58054154 A JP 58054154A JP 5415483 A JP5415483 A JP 5415483A JP S59178549 A JPS59178549 A JP S59178549A
Authority
JP
Japan
Prior art keywords
shift
ring circuit
terminal
shift ring
shift register
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58054154A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6327735B2 (enrdf_load_stackoverflow
Inventor
Shunichiro Nakamura
俊一郎 中村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP58054154A priority Critical patent/JPS59178549A/ja
Publication of JPS59178549A publication Critical patent/JPS59178549A/ja
Publication of JPS6327735B2 publication Critical patent/JPS6327735B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/267—Reconfiguring circuits for testing, e.g. LSSD, partitioning

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP58054154A 1983-03-30 1983-03-30 シフトリング回路 Granted JPS59178549A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58054154A JPS59178549A (ja) 1983-03-30 1983-03-30 シフトリング回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58054154A JPS59178549A (ja) 1983-03-30 1983-03-30 シフトリング回路

Publications (2)

Publication Number Publication Date
JPS59178549A true JPS59178549A (ja) 1984-10-09
JPS6327735B2 JPS6327735B2 (enrdf_load_stackoverflow) 1988-06-06

Family

ID=12962624

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58054154A Granted JPS59178549A (ja) 1983-03-30 1983-03-30 シフトリング回路

Country Status (1)

Country Link
JP (1) JPS59178549A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61117627A (ja) * 1984-11-13 1986-06-05 Fujitsu Ltd 論理回路の診断回路
JP2012208029A (ja) * 2011-03-30 2012-10-25 Renesas Electronics Corp スキャンフリップフロップ回路、スキャンテスト回路及びその制御方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61117627A (ja) * 1984-11-13 1986-06-05 Fujitsu Ltd 論理回路の診断回路
JP2012208029A (ja) * 2011-03-30 2012-10-25 Renesas Electronics Corp スキャンフリップフロップ回路、スキャンテスト回路及びその制御方法

Also Published As

Publication number Publication date
JPS6327735B2 (enrdf_load_stackoverflow) 1988-06-06

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