JPS5875254A - 1チツプマイクロコンピユ−タシステム - Google Patents

1チツプマイクロコンピユ−タシステム

Info

Publication number
JPS5875254A
JPS5875254A JP56172230A JP17223081A JPS5875254A JP S5875254 A JPS5875254 A JP S5875254A JP 56172230 A JP56172230 A JP 56172230A JP 17223081 A JP17223081 A JP 17223081A JP S5875254 A JPS5875254 A JP S5875254A
Authority
JP
Japan
Prior art keywords
section
instruction code
supplied
input signal
cpu
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56172230A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6212542B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Takao Kamirei
神凉 隆男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP56172230A priority Critical patent/JPS5875254A/ja
Publication of JPS5875254A publication Critical patent/JPS5875254A/ja
Publication of JPS6212542B2 publication Critical patent/JPS6212542B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Microcomputers (AREA)
JP56172230A 1981-10-28 1981-10-28 1チツプマイクロコンピユ−タシステム Granted JPS5875254A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56172230A JPS5875254A (ja) 1981-10-28 1981-10-28 1チツプマイクロコンピユ−タシステム

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56172230A JPS5875254A (ja) 1981-10-28 1981-10-28 1チツプマイクロコンピユ−タシステム

Publications (2)

Publication Number Publication Date
JPS5875254A true JPS5875254A (ja) 1983-05-06
JPS6212542B2 JPS6212542B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1987-03-19

Family

ID=15938009

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56172230A Granted JPS5875254A (ja) 1981-10-28 1981-10-28 1チツプマイクロコンピユ−タシステム

Country Status (1)

Country Link
JP (1) JPS5875254A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0228784A (ja) * 1988-07-18 1990-01-30 Sanyo Electric Co Ltd ワンチップデジタル信号処理装置及びそのデバッグ装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5148951A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1974-10-25 1976-04-27 Hitachi Ltd
JPS5650446A (en) * 1979-09-28 1981-05-07 Toshiba Corp Microcomputer test device
JPS573151A (en) * 1980-06-05 1982-01-08 Matsushita Electric Ind Co Ltd Test system for 1-chip microcomputer

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5148951A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1974-10-25 1976-04-27 Hitachi Ltd
JPS5650446A (en) * 1979-09-28 1981-05-07 Toshiba Corp Microcomputer test device
JPS573151A (en) * 1980-06-05 1982-01-08 Matsushita Electric Ind Co Ltd Test system for 1-chip microcomputer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0228784A (ja) * 1988-07-18 1990-01-30 Sanyo Electric Co Ltd ワンチップデジタル信号処理装置及びそのデバッグ装置

Also Published As

Publication number Publication date
JPS6212542B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1987-03-19

Similar Documents

Publication Publication Date Title
US6820192B2 (en) Central processing unit for easily testing and debugging programs
EP0127440A2 (en) Integrated circuit device incorporating a data processing unit and a ROM storing applications program therein
KR20010072036A (ko) 집적 회로의 셀프테스트를 실행하기 위한 셀프테스트장치를 포함하는 집적 회로
JPS61229134A (ja) マイクロコンピユ−タ
US5704033A (en) Apparatus and method for testing a program memory for a one-chip microcomputer
JPS5875254A (ja) 1チツプマイクロコンピユ−タシステム
US7047444B2 (en) Address selection for testing of a microprocessor
JP2001273794A (ja) フェイル前情報取得回路およびその取得方法
US6125456A (en) Microcomputer with self-diagnostic unit
KR100297224B1 (ko) Prom이구비된마이크로컴퓨터및그것의데이타판독검사방법
JP2920561B2 (ja) 1チップマイクロコンピュータのテスト方法
KR0165818B1 (ko) 원칩 마이크로 컴퓨터
JPH0520773B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JPS63269238A (ja) コントロ−ルユニツトの検査装置
JP2967741B2 (ja) Cpu互換性テスト装置
JP2999837B2 (ja) 販売データ処理装置
JPH10300824A (ja) 半導体集積回路のテスト装置
JPH06301570A (ja) 試験プログラムの正常性チェック機能付きエミュレータ
JPS5883397A (ja) メモリ内容チエツク制御方式
JPH1040125A (ja) マイクロコンピュータ
JPS59112495A (ja) 読出専用メモリの試験機能をもつマイクロコンピユ−タ
JPS6370178A (ja) 試験装置
JPH03130996A (ja) Eepromの初期設定方式
JPH03201037A (ja) Lsiの試験方式
JPH06314212A (ja) 情報処理装置