JPS583198A - 半導体記憶装置 - Google Patents

半導体記憶装置

Info

Publication number
JPS583198A
JPS583198A JP56101588A JP10158881A JPS583198A JP S583198 A JPS583198 A JP S583198A JP 56101588 A JP56101588 A JP 56101588A JP 10158881 A JP10158881 A JP 10158881A JP S583198 A JPS583198 A JP S583198A
Authority
JP
Japan
Prior art keywords
memory
circuit
signal
defective
section
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56101588A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6142360B2 (cg-RX-API-DMAC10.html
Inventor
Jiro Hirahara
平原　治郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP56101588A priority Critical patent/JPS583198A/ja
Publication of JPS583198A publication Critical patent/JPS583198A/ja
Publication of JPS6142360B2 publication Critical patent/JPS6142360B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP56101588A 1981-06-30 1981-06-30 半導体記憶装置 Granted JPS583198A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56101588A JPS583198A (ja) 1981-06-30 1981-06-30 半導体記憶装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56101588A JPS583198A (ja) 1981-06-30 1981-06-30 半導体記憶装置

Publications (2)

Publication Number Publication Date
JPS583198A true JPS583198A (ja) 1983-01-08
JPS6142360B2 JPS6142360B2 (cg-RX-API-DMAC10.html) 1986-09-20

Family

ID=14304541

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56101588A Granted JPS583198A (ja) 1981-06-30 1981-06-30 半導体記憶装置

Country Status (1)

Country Link
JP (1) JPS583198A (cg-RX-API-DMAC10.html)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59185098A (ja) * 1983-04-04 1984-10-20 Oki Electric Ind Co Ltd 自己診断回路内蔵型半導体メモリ装置
JPS60109099A (ja) * 1983-11-18 1985-06-14 Nippon Telegr & Teleph Corp <Ntt> 半導体メモリ装置の欠陥検出切替方式
JPS63164100A (ja) * 1986-12-26 1988-07-07 Hiroshi Nakamura 半導体集積回路メモリ
JPH03500099A (ja) * 1987-08-26 1991-01-10 シーメンス、アクチエンゲゼルシヤフト メモリモジユールの不良回路の確認および位置探索のための装置および方法
EP0886379A1 (en) * 1994-03-30 1998-12-23 Matsushita Electric Industrial Co., Ltd. Voltage-level shifter

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59185098A (ja) * 1983-04-04 1984-10-20 Oki Electric Ind Co Ltd 自己診断回路内蔵型半導体メモリ装置
JPS60109099A (ja) * 1983-11-18 1985-06-14 Nippon Telegr & Teleph Corp <Ntt> 半導体メモリ装置の欠陥検出切替方式
JPS63164100A (ja) * 1986-12-26 1988-07-07 Hiroshi Nakamura 半導体集積回路メモリ
JPH03500099A (ja) * 1987-08-26 1991-01-10 シーメンス、アクチエンゲゼルシヤフト メモリモジユールの不良回路の確認および位置探索のための装置および方法
EP0886379A1 (en) * 1994-03-30 1998-12-23 Matsushita Electric Industrial Co., Ltd. Voltage-level shifter

Also Published As

Publication number Publication date
JPS6142360B2 (cg-RX-API-DMAC10.html) 1986-09-20

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