JPS6142360B2 - - Google Patents

Info

Publication number
JPS6142360B2
JPS6142360B2 JP56101588A JP10158881A JPS6142360B2 JP S6142360 B2 JPS6142360 B2 JP S6142360B2 JP 56101588 A JP56101588 A JP 56101588A JP 10158881 A JP10158881 A JP 10158881A JP S6142360 B2 JPS6142360 B2 JP S6142360B2
Authority
JP
Japan
Prior art keywords
memory
circuit
signal
fuse
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56101588A
Other languages
English (en)
Japanese (ja)
Other versions
JPS583198A (ja
Inventor
Jiro Hirahara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP56101588A priority Critical patent/JPS583198A/ja
Publication of JPS583198A publication Critical patent/JPS583198A/ja
Publication of JPS6142360B2 publication Critical patent/JPS6142360B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70Masking faults in memories by using spares or by reconfiguring
    • G11C29/78Masking faults in memories by using spares or by reconfiguring using programmable devices

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP56101588A 1981-06-30 1981-06-30 半導体記憶装置 Granted JPS583198A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56101588A JPS583198A (ja) 1981-06-30 1981-06-30 半導体記憶装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56101588A JPS583198A (ja) 1981-06-30 1981-06-30 半導体記憶装置

Publications (2)

Publication Number Publication Date
JPS583198A JPS583198A (ja) 1983-01-08
JPS6142360B2 true JPS6142360B2 (cg-RX-API-DMAC10.html) 1986-09-20

Family

ID=14304541

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56101588A Granted JPS583198A (ja) 1981-06-30 1981-06-30 半導体記憶装置

Country Status (1)

Country Link
JP (1) JPS583198A (cg-RX-API-DMAC10.html)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59185098A (ja) * 1983-04-04 1984-10-20 Oki Electric Ind Co Ltd 自己診断回路内蔵型半導体メモリ装置
JPS60109099A (ja) * 1983-11-18 1985-06-14 Nippon Telegr & Teleph Corp <Ntt> 半導体メモリ装置の欠陥検出切替方式
JPS63164100A (ja) * 1986-12-26 1988-07-07 Hiroshi Nakamura 半導体集積回路メモリ
DE3728521A1 (de) * 1987-08-26 1989-03-09 Siemens Ag Anordnung und verfahren zur feststellung und lokalisierung von fehlerhaften schaltkreisen eines speicherbausteins
JP3623004B2 (ja) * 1994-03-30 2005-02-23 松下電器産業株式会社 電圧レベル変換回路

Also Published As

Publication number Publication date
JPS583198A (ja) 1983-01-08

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