JPS58205869A - ロジツク回路の試験方法 - Google Patents

ロジツク回路の試験方法

Info

Publication number
JPS58205869A
JPS58205869A JP57087820A JP8782082A JPS58205869A JP S58205869 A JPS58205869 A JP S58205869A JP 57087820 A JP57087820 A JP 57087820A JP 8782082 A JP8782082 A JP 8782082A JP S58205869 A JPS58205869 A JP S58205869A
Authority
JP
Japan
Prior art keywords
output
signal
logic
code
generator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57087820A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0373829B2 (enExample
Inventor
デイビツト・フレドリツク・ヒルトナ−
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Priority to JP57087820A priority Critical patent/JPS58205869A/ja
Publication of JPS58205869A publication Critical patent/JPS58205869A/ja
Publication of JPH0373829B2 publication Critical patent/JPH0373829B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP57087820A 1982-05-24 1982-05-24 ロジツク回路の試験方法 Granted JPS58205869A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57087820A JPS58205869A (ja) 1982-05-24 1982-05-24 ロジツク回路の試験方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57087820A JPS58205869A (ja) 1982-05-24 1982-05-24 ロジツク回路の試験方法

Publications (2)

Publication Number Publication Date
JPS58205869A true JPS58205869A (ja) 1983-11-30
JPH0373829B2 JPH0373829B2 (enExample) 1991-11-25

Family

ID=13925597

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57087820A Granted JPS58205869A (ja) 1982-05-24 1982-05-24 ロジツク回路の試験方法

Country Status (1)

Country Link
JP (1) JPS58205869A (enExample)

Also Published As

Publication number Publication date
JPH0373829B2 (enExample) 1991-11-25

Similar Documents

Publication Publication Date Title
JP4090988B2 (ja) デジタルシステム及び該デジタルシステムのエラー検出方法
GB2121997A (en) Testing modular data processing systems
US6445205B1 (en) Method of testing integrated circuits
US4697234A (en) Data processing module with serial test data paths
JP2618669B2 (ja) 半導体集積回路装置のテストモード設定回路
JPH0373829B2 (enExample)
JPS5952331A (ja) 機器アドレス設定装置
JPS6371671A (ja) 大規模集積回路
EP0136735A1 (en) Arrangement for checking the counting function of counters
JPS62150181A (ja) 大規模集積回路の試験方式
JPS6097449A (ja) 読み出し専用メモリを有する情報処理装置
JPS5549760A (en) Information processing unit diagnostic system
EP0971362A1 (en) Data entegrity checking apparatus
JP3308575B2 (ja) 増設メモリバンクアドレス自動設定方式
JPS57212539A (en) Arithmetic device
JPS60239834A (ja) 集積回路
JPH06242187A (ja) 半導体自己試験装置
JPS63148500A (ja) Rom内蔵のゲ−トアレイ
JPH04352240A (ja) 情報処理装置
JPH0433020A (ja) 機密保持機能を備えた半導体集積回路
JPS622337B2 (enExample)
JPH08262110A (ja) 半導体集積回路装置およびその論理回路診断方法
JPS6231448A (ja) Mpuを内蔵する半導体装置の評価装置及び評価方法
JPS61213934A (ja) シフトパス回路
JPH0599987A (ja) テスト回路